Abstract

To the best of our knowledge, we demonstrate the first no-moving-parts largest aperture profiler design that is also cost effective. Specifically exploited is the large-scale production of thin-film transistor liquid-crystal displays (LCDs) to produce a high intrinsic reliability low-cost profiler. Today, the maximum beam diameter under test can reach 70 cm using 117 cm diagonal LCDs. Experiments conducted with the laboratory LCD profiler include 1D and 2D knife-edge profiling, 2D pinhole profiling, and beam divergence measurements.

© 2007 Optical Society of America

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