F. Sabary, D. Marteau, P. Hamel, and H. Piombini, "High reflectivity protected silver coatings on stainless steel and aluminium substrates," in Society of Vacuum Coaters, 47th Annual Technical Conference, Dallas, Tex. (April 2004), pp. 24-29.
H. Piombini and P. Voarino, "Dispositif et procédé de mesure de caractérisation par réflectométrie," FR patent 0651951 (30 May 2006).
M. Jobin and G. Yvon, "Improvements in apparatus for photometric, polarimetric and spectrometric determinations," G.B. patent 204693 (7 August 1924).
H. H. Cary, "Double folded-z-configuration monochromator," U.S. patent 3,098,408 (23 July 1963).
J. Strong, Procedures in Experimental Physics (Prentice Hall, 1938), p. 376.
A. E. Norton, C. L. Mallory, H. V. Pham, and P. Rasmussen, "Broadband microspectroreflectometer," U.S. patent 5,747,813 (5 May 1998).
P. G. Borden, J. Li, and J. Madsen, "Calibration as well as measurement on the same workpiece during fabrication," U.S. patent 6,940,592 (6 September 2005).
E. D. Palik, Handbook of Optical Constants (Academic, 1985).
P. Voarino, S. Petitrenaud, H. Piombini, F. Sabary, and D. Marteau, "High-precision measurements of reflectance," Proc. SPIE 6342, 63421Z (2006).
S. Petitrenaud, P. Voarino, H. Piombini, F. Sabary, and D. Marteau, "High-precision measurements of the LMJ's reflectors," OSA Annual Meeting, Optical Fabrication & Testing, Rochester, N.Y., 9-11 October 2006.
P. Voarino, S. Petitrenaud, H. Piombini, F. Sabary, and D. Marteau, "Spectrophotometer for high-precision measurements of heterogeneities," TOM 4, EOS Annual Meeting 2006, Paris, France, 16-19 October 2006.
H. Piombini, P. Voarino, F. Sabary, D. Marteau, J. Dubard, J. Hameury, and J. R. Filtz, "High-precision measurements of the specular reflectivity," OIC 2007, Tucson, Ariz., 3-8 June 2007.
"Traitements antireflet multicouches large bande," Catalog Général 2006/2007 (Micro-Controle, 91006 Evry Cedex, France), p. 510.
R. Francis, Measuring Photometric Accuracy Using the Double Aperture Method (Varian UV-62, 1993).
P. Y. Barnes, E. A. Early, and A. C. Parr, NIST Measurement Services: Spectral Reflectance, NIST Spec. Publ. 250-48 (U.S. GPO, 1998).
D. Allen and M. E. Nadal, "Facilities," http://physics.nist.gov/Divisions/Div844/facilities/specphoto/facilities.html.