Abstract

We present an optical architecture for the laser optical feedback imaging (LOFI) technique that makes it possible to avoid the effect of the optical parasitic reflections introduced by the optical components located between the laser source and the studied object. These reflections damage phase and amplitude information contained in the images. This phenomenon is a leading problem that strongly limits the LOFI performance for weak feedback detection. Consequently, it is essential to be able to limit or avoid the effect of these parasitic reflections to reach the optimal LOFI performance.

© 2007 Optical Society of America

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References

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  1. E. Lacot, R. Day, and F. Stoeckel, "Laser optical feedback tomography," Opt. Lett. 24, 744-746 (1999).
    [CrossRef]
  2. E. Lacot and O. Hugon, "Phase sensitive laser detection by frequency-shifted optical feedback," Phys. Rev. A 70, 053824 (2004).
    [CrossRef]
  3. E. Lacot, R. Day, and F. Stoeckel, "Coherent laser detection by frequency-shifted optical feedback," Phys. Rev. A 64, 043815 (2001).
    [CrossRef]
  4. M. E. Storm, "Controlled retroreflection: a technique for understanding and eliminating parasitic lasing," J. Opt. Soc. Am. B 9, 1299-1304 (1992).
    [CrossRef]
  5. P. Megret, L. Wuilmart, J. C. Froidure, M. Blondel, "Bit-error-rate in optical fiber links with optical reflections," in Proceedings of IEEE Conference on Lasers and Electro-Optics Society (IEEE, 1997), Vol. 2, pp. 87-89.
  6. R. Day, "Une nouvelle technique d'imagerie laser basée sur la reinjection décalée en fréquence. Laser optical feedback imaging (LOFI)," Ph.D. thesis (University J. Fourier, France, 2000), pp. 51-55, http://www-lsp.ujf-grenoble.fr/pdf/theses/dyrd.pdf.
  7. J.-M. Mackowski, "Coatings principles," in Proceedings of the NATO Advanced Study Institute on Optics in Astrophysics (Springer, 2005), Vol. 198, pp. 327-342.
  8. O. Hugon is preparing a manuscript to be called "Cell imaging by coherent backscattering microscopy using frequency-shifted optical feedback in a microchip laser" and to be submitted to Ultramicroscopy.

2004

E. Lacot and O. Hugon, "Phase sensitive laser detection by frequency-shifted optical feedback," Phys. Rev. A 70, 053824 (2004).
[CrossRef]

2001

E. Lacot, R. Day, and F. Stoeckel, "Coherent laser detection by frequency-shifted optical feedback," Phys. Rev. A 64, 043815 (2001).
[CrossRef]

1999

1992

J. Opt. Soc. Am. B

Opt. Lett.

Phys. Rev. A

E. Lacot and O. Hugon, "Phase sensitive laser detection by frequency-shifted optical feedback," Phys. Rev. A 70, 053824 (2004).
[CrossRef]

E. Lacot, R. Day, and F. Stoeckel, "Coherent laser detection by frequency-shifted optical feedback," Phys. Rev. A 64, 043815 (2001).
[CrossRef]

Other

P. Megret, L. Wuilmart, J. C. Froidure, M. Blondel, "Bit-error-rate in optical fiber links with optical reflections," in Proceedings of IEEE Conference on Lasers and Electro-Optics Society (IEEE, 1997), Vol. 2, pp. 87-89.

R. Day, "Une nouvelle technique d'imagerie laser basée sur la reinjection décalée en fréquence. Laser optical feedback imaging (LOFI)," Ph.D. thesis (University J. Fourier, France, 2000), pp. 51-55, http://www-lsp.ujf-grenoble.fr/pdf/theses/dyrd.pdf.

J.-M. Mackowski, "Coatings principles," in Proceedings of the NATO Advanced Study Institute on Optics in Astrophysics (Springer, 2005), Vol. 198, pp. 327-342.

O. Hugon is preparing a manuscript to be called "Cell imaging by coherent backscattering microscopy using frequency-shifted optical feedback in a microchip laser" and to be submitted to Ultramicroscopy.

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Figures (5)

Fig. 1
Fig. 1

Description of the classical LOFI experiment.

Fig. 2
Fig. 2

R and ϕ are given in polar coordinates versus the distance d C , with parasitic reflection in the optical system.

Fig. 3
Fig. 3

LOFI device insensitive to optical parasitic reflection.

Fig. 4
Fig. 4

R and ϕ given in polar coordinates measured at Ω / 2 frequency with antireflection system.

Fig. 5
Fig. 5

LOFI images realized respectively at the frequencies Ω and Ω / 2 , with and without parasitic reflection (i.e., with and without the microscope slide placed before the metallic ruler) to validate the principle of the antireflection scheme for the LOFI technique. (a) Detection frequency Ω, without parasitic reflection; (b) detection frequency Ω / 2 , without parasitic reflection; (c) detection frequency Ω, with parasitic reflection; (d) detection frequency Ω / 2 , with parasitic reflection.

Equations (62)

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Ω R
10 6
10 13
1   KHz
1 .064   μm
Ω R
1   MHz
81 .5   MHz
+ 1
1
Ω / 2
r P
r C
d P
d C
ϕ = a tan [ r C sin ( ϕ c ) + r P sin ( ϕ p ) r C cos ( ϕ c ) + r P cos ( ϕ p ) ] ,
R = G L O F I r C 2 + r P 2 + 2 r C r P cos ( ϕ C ϕ p ) P o u t ,
ϕ p = ( 2 π / λ ) 2 d P
ϕ c = ( 2 π / λ ) 2 d C
P o u t
r P r C
ϕ ϕ c
R G L O F I r C P o u t
d C
r C
r P r C
r P r C
r P
r C
( r P r C )
R ( d C )
ϕ ( d C )
d C
r C
d C
π / 2
2 π
r P r C
d C
r P r C
r C
10 13
1.064 μm
50 / 50
Ω / 2
Ω / 2
Ω / 2
R ( d C )
ϕ ( d C )
d C
r C
d C
Ω / 2
Ω / 2
( r P r C )
( r P r C )
Ω / 2
d C
Ω / 2
Ω / 2
Ω / 2
Ω / 2

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