Abstract

Transmission measurements of 14 fabrics are presented in the millimeter-wave and submillimeter-wave electromagnetic regions from 130  GHz to 1.2  THz. Three independent sources and experimental setups were used to obtain accurate results over a wide spectral range. Reflectivity, a useful parameter for imaging applications, was also measured for a subset of samples in the submillimeter-wave regime along with polarization sensitivity of the transmitted beam and transmission through doubled layers. All of the measurements were performed in free space. Details of these experimental setups along with their respective challenges are presented.

© 2007 Optical Society of America

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References

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2004

R. Appleby, "Passive millimetre-wave imaging and how it differs from terahertz imaging," Philos. Trans. R. Soc. London , Ser. A 362, 379-393 (2004).
[CrossRef]

J. E. Bjarnason, T. L. J. Chan, A. W. M. Lee, M. A. Celis, and E. R. Brown, "Millimeter-wave, terahertz, and mid-infrared transmission through common clothing," Appl. Phys. Lett. 85, 519-521 (2004).
[CrossRef]

2002

E. N. Grossman, A. K. Bhupathiraju, A. J. Miller, and C. D. Reintsema, "Concealed weapons detection using an uncooled millimeter-wave microbolometer system," Proc. SPIE 4719, 364-369 (2002).
[CrossRef]

P. H. Siegel, "Terahertz technology," IEEE Trans. Microwave Theory Tech. 50, 910-928 (2002).
[CrossRef]

2001

N. Paulter, "Guide to the technologies of concealed weapon and contraband imaging and detection," National Institute of Justice guide 602-00 (2001).

1993

P. F. Goldsmith, C.-T. Hsieh, G. Huguenin, J. Kapitzky, and E. Moore, "Focal plane image systems for millimeter wavelengths," IEEE Trans. Microwave Theory Tech. 41, 1664-1675 (1993).
[CrossRef]

1976

Appl. Opt.

Appl. Phys. Lett.

J. E. Bjarnason, T. L. J. Chan, A. W. M. Lee, M. A. Celis, and E. R. Brown, "Millimeter-wave, terahertz, and mid-infrared transmission through common clothing," Appl. Phys. Lett. 85, 519-521 (2004).
[CrossRef]

IEEE Trans. Microwave Theory Tech.

P. H. Siegel, "Terahertz technology," IEEE Trans. Microwave Theory Tech. 50, 910-928 (2002).
[CrossRef]

P. F. Goldsmith, C.-T. Hsieh, G. Huguenin, J. Kapitzky, and E. Moore, "Focal plane image systems for millimeter wavelengths," IEEE Trans. Microwave Theory Tech. 41, 1664-1675 (1993).
[CrossRef]

National Institute of Justice guide 602-00

N. Paulter, "Guide to the technologies of concealed weapon and contraband imaging and detection," National Institute of Justice guide 602-00 (2001).

Philos. Trans. R. Soc. London

R. Appleby, "Passive millimetre-wave imaging and how it differs from terahertz imaging," Philos. Trans. R. Soc. London , Ser. A 362, 379-393 (2004).
[CrossRef]

Proc. SPIE

E. N. Grossman, A. K. Bhupathiraju, A. J. Miller, and C. D. Reintsema, "Concealed weapons detection using an uncooled millimeter-wave microbolometer system," Proc. SPIE 4719, 364-369 (2002).
[CrossRef]

Other

N. Douglas, Millimetre and Submillimetre Wavelength Lasers: Handbook of cw Measurements (Springer-Verlag, 1989).

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Figures (5)

Fig. 1
Fig. 1

Transmission measurement results of various materials in the millimeter- and submillimeter-wave regions. Three sources were used: a backward wave oscillator ( ) , a Fourier transform interferometer (—), and a FIR laser ( ) .

Fig. 2
Fig. 2

Transmission measurement results of various materials in the millimeter- and submillimeter-wave regions.

Fig. 3
Fig. 3

Reflection measurement results of a subset of tested materials using the Fourier transform interferometer.

Fig. 4
Fig. 4

Polarization sensitivity tests using the 763   GHz laser line. The samples were rotated 0°, 45°, 90°, and 45 ° .

Fig. 5
Fig. 5

Double-layer transmission tests at the 763   GHz laser line for six materials.

Tables (2)

Tables Icon

Table 1 List of Tested Materials

Tables Icon

Table 2 FIR Laser Lines and Resulting Experimentally Generated Power Levels

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