Abstract

A comprehensive numerical model for distributed Bragg reflectors (DBRs) based on thin-film optics is developed. Detailed refractive-index calculations for GaN, AlN, AlGaN, and InGaN can also be included in this numerical model. This model can predict DBR performances for refractive-index variations, layer-thickness fluctuations, and the number of quarter-wave stack pairs in DBR as well different light polarizations.

© 2007 Optical Society of America

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