Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Abstract

Two-beam interferogram intensity modulation decoding using spatial carrier phase shifting interferometry is discussed. Single frame recording, simplicity of experimental equipment, and uncomplicated data processing are the main advantages of the method. A comprehensive analysis of the influence of systematic errors (spatial carrier miscalibration, nonuniform average intensity profile, and nonlinear recording) on the modulation distribution determination using automatic fringe pattern analysis techniques is presented. The results of searching for the optimum calculation algorithm are described. Extensive numerical simulations are compared with laboratory findings obtained when testing vibrating silicon microelements under various experimental conditions.

© 2007 Optical Society of America

Phase gradients from intensity gradients: a method of spatial carrier fringe pattern analysis

Ruihua Zhang and Hongwei Guo
Opt. Express 22(19) 22432-22445 (2014)

Algorithm for multiple-beam Fizeau interferograms with arbitrary phase shifts

Jiancheng Xu, Qiao Xu, Liqun Chai, and Hansheng Peng
Opt. Express 16(23) 18922-18932 (2008)

Spatial carrier phase-shifting algorithm based on least-squares iteration

Jiancheng Xu, Qiao Xu, and Hansheng Peng
Appl. Opt. 47(29) 5446-5453 (2008)

Dynamic phase measurement based on spatial carrier-frequency phase-shifting method

Linbo Huang, Xiaoxu Lu, Jiaosheng Li, Yunfei Zhou, Jiaxiang Xiong, Jindong Tian, and Liyun Zhong
Opt. Express 24(13) 13744-13753 (2016)

Spatial carrier phase-shifting algorithm based on principal component analysis method

Yongzhao Du, Guoying Feng, Hongru Li, J. Vargas, and Shouhuan Zhou
Opt. Express 20(15) 16471-16479 (2012)