C. Yildiz and M. Turkmen, "Very accurate and simple CAD models based on neural networks for coplanar waveguide synthesis," Int. J. RF Microwave Comput.-Aided Eng. 15, 218-222 (2005).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

W. Zaets and K. Ando, "Magneto-optical mode conversion in Cd_{1-x}Mn_{x}Te waveguide on GaAs substrate," Appl. Phys. Lett. 77, 1593-1595 (2000).

[Crossref]

M. F. Tabet and W. A. McGahan, "Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data," Thin Solid Films 370, 122-127 (2000).

[Crossref]

F. K. Urban III, D. Barton, and N. I. Boudani, "Extremely fast ellipsometry solutions using cascaded neural networks alone," Thin Solid Films 332, 50-55 (1998).

[Crossref]

Y.-S. Ma, X. Liu, P.-F. Gu, and J.-F. Tang, "Estimation of optical constants of thin film by the use of artificial neural networks," Appl. Opt. 35, 5035-5039 (1996).

[Crossref]
[PubMed]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

K. I. Funahashi, "On the approximate realization of continuous mappings by neural networks," Neural Networks 2, 183-192 (1989).

[Crossref]

J. S. Wei and W. D. Westwood, "A new method for determining thin-film refractive index and thickness using guided optical waves," Appl. Phys. Lett. 32, 819-821 (1978).

[Crossref]

P. K. Tien, R. Ulrich, and R. J. Martin, "Modes of propagating light waves in thin deposited semiconductor films," Appl. Phys. Lett. 14, 291-294 (1969).

[Crossref]

D. Marquardt, "An algorithm for least-squares estimation of nonlinear parameters," J. Appl. Math. 11, 431-441 (1963).

K. Levenberg, "A method for the solution of certain problems in least squares," Quart. Appl. Math. 2, 164-168 (1944).

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

W. Zaets and K. Ando, "Magneto-optical mode conversion in Cd_{1-x}Mn_{x}Te waveguide on GaAs substrate," Appl. Phys. Lett. 77, 1593-1595 (2000).

[Crossref]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

R. M. A. Azzam and N. M. Bashara, *Ellipsometry and Polarized Light*, 2nd ed. (North Holland Press, 1987).

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

F. K. Urban III, D. Barton, and N. I. Boudani, "Extremely fast ellipsometry solutions using cascaded neural networks alone," Thin Solid Films 332, 50-55 (1998).

[Crossref]

R. M. A. Azzam and N. M. Bashara, *Ellipsometry and Polarized Light*, 2nd ed. (North Holland Press, 1987).

C. M. Bishop, *Neural Networks for Pattern Recognition* (Oxford U. Press, 1995).

F. K. Urban III, D. Barton, and N. I. Boudani, "Extremely fast ellipsometry solutions using cascaded neural networks alone," Thin Solid Films 332, 50-55 (1998).

[Crossref]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

K. I. Funahashi, "On the approximate realization of continuous mappings by neural networks," Neural Networks 2, 183-192 (1989).

[Crossref]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

K. Levenberg, "A method for the solution of certain problems in least squares," Quart. Appl. Math. 2, 164-168 (1944).

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

D. Marquardt, "An algorithm for least-squares estimation of nonlinear parameters," J. Appl. Math. 11, 431-441 (1963).

P. K. Tien, R. Ulrich, and R. J. Martin, "Modes of propagating light waves in thin deposited semiconductor films," Appl. Phys. Lett. 14, 291-294 (1969).

[Crossref]

M. F. Tabet and W. A. McGahan, "Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data," Thin Solid Films 370, 122-127 (2000).

[Crossref]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

D. Nix and A. Weigend, "Learning local error bars for nonlinear regression," in *Proceedings of Advances in Neural Information Processing Systems*, G. Tesauro, D. Touretzky, and T. Leen, eds, (MIT Press, 1995), pp. 489-496.

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

M. F. Tabet and W. A. McGahan, "Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data," Thin Solid Films 370, 122-127 (2000).

[Crossref]

P. K. Tien, R. Ulrich, and R. J. Martin, "Modes of propagating light waves in thin deposited semiconductor films," Appl. Phys. Lett. 14, 291-294 (1969).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

C. Yildiz and M. Turkmen, "Very accurate and simple CAD models based on neural networks for coplanar waveguide synthesis," Int. J. RF Microwave Comput.-Aided Eng. 15, 218-222 (2005).

[Crossref]

F. K. Urban III, D. Barton, and N. I. Boudani, "Extremely fast ellipsometry solutions using cascaded neural networks alone," Thin Solid Films 332, 50-55 (1998).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

J. S. Wei and W. D. Westwood, "A new method for determining thin-film refractive index and thickness using guided optical waves," Appl. Phys. Lett. 32, 819-821 (1978).

[Crossref]

D. Nix and A. Weigend, "Learning local error bars for nonlinear regression," in *Proceedings of Advances in Neural Information Processing Systems*, G. Tesauro, D. Touretzky, and T. Leen, eds, (MIT Press, 1995), pp. 489-496.

J. S. Wei and W. D. Westwood, "A new method for determining thin-film refractive index and thickness using guided optical waves," Appl. Phys. Lett. 32, 819-821 (1978).

[Crossref]

C. Yildiz and M. Turkmen, "Very accurate and simple CAD models based on neural networks for coplanar waveguide synthesis," Int. J. RF Microwave Comput.-Aided Eng. 15, 218-222 (2005).

[Crossref]

W. Zaets and K. Ando, "Magneto-optical mode conversion in Cd_{1-x}Mn_{x}Te waveguide on GaAs substrate," Appl. Phys. Lett. 77, 1593-1595 (2000).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

W. Zaets and K. Ando, "Magneto-optical mode conversion in Cd_{1-x}Mn_{x}Te waveguide on GaAs substrate," Appl. Phys. Lett. 77, 1593-1595 (2000).

[Crossref]

P. K. Tien, R. Ulrich, and R. J. Martin, "Modes of propagating light waves in thin deposited semiconductor films," Appl. Phys. Lett. 14, 291-294 (1969).

[Crossref]

J. S. Wei and W. D. Westwood, "A new method for determining thin-film refractive index and thickness using guided optical waves," Appl. Phys. Lett. 32, 819-821 (1978).

[Crossref]

S. Lek, M. Delacoste, P. Baran, I. Dimopoulos, J. Lauga, and S. Aulagnier, "Application of neural networks to modeling nonlinear relationships in ecology," Ecol. Modell. 90, 39-52 (1996).

[Crossref]

V. Tkachenko, A. Marino, F. Vita, F. D'Amore, L. De Stefano, M. Malinconico, M. Rippa, and G. Abbate, "Spectroscopic ellipsometry study of liquid crystal and polymeric thin films in visible and near infrared," Eur. Phys. J. E 14, 185-192 (2004).

[Crossref]
[PubMed]

S. I. Hosain, J. P. Meunier, E. Bourillot, F. de Fornel, and J. P. Goudonnet, "Review of the basic methods for characterizing integrated-optic waveguides," Fiber Integr. Opt. 44, 89-107 (1995).

C. Yildiz and M. Turkmen, "Very accurate and simple CAD models based on neural networks for coplanar waveguide synthesis," Int. J. RF Microwave Comput.-Aided Eng. 15, 218-222 (2005).

[Crossref]

D. Marquardt, "An algorithm for least-squares estimation of nonlinear parameters," J. Appl. Math. 11, 431-441 (1963).

K. I. Funahashi, "On the approximate realization of continuous mappings by neural networks," Neural Networks 2, 183-192 (1989).

[Crossref]

F. Royer, H. Roux, D. Jamon, J. J. Rousseau, D. Zins, V. Cabuil, and C. Bovier, "New technological approach in phase-matched magneto-optic planar waveguide realization," in *Advances in Optical Thin Films*, C. Amra, N. Kaiser, and H. A. Macleod, eds., Proc. SPIE 5250, 72-80 (2004).

[Crossref]

K. Levenberg, "A method for the solution of certain problems in least squares," Quart. Appl. Math. 2, 164-168 (1944).

F. K. Urban III, D. Barton, and N. I. Boudani, "Extremely fast ellipsometry solutions using cascaded neural networks alone," Thin Solid Films 332, 50-55 (1998).

[Crossref]

M. F. Tabet and W. A. McGahan, "Use of artificial neural networks to predict thickness and optical constants of thin films from reflectance data," Thin Solid Films 370, 122-127 (2000).

[Crossref]

H. Touir, M. Stchakovsky, R. Ossikovski, and M. Warenghem, "Coherent and incoherent interference modeling and measurement of anisotropic multilayer stacks using conventional ellipsometry," Thin Solid Films 455-456, 628-631 (2003).

[Crossref]

D. Nix and A. Weigend, "Learning local error bars for nonlinear regression," in *Proceedings of Advances in Neural Information Processing Systems*, G. Tesauro, D. Touretzky, and T. Leen, eds, (MIT Press, 1995), pp. 489-496.

C. M. Bishop, *Neural Networks for Pattern Recognition* (Oxford U. Press, 1995).

R. M. A. Azzam and N. M. Bashara, *Ellipsometry and Polarized Light*, 2nd ed. (North Holland Press, 1987).