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[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. P. Jüptner, "Accurate procedure for the calibration of a structured light system," Opt. Eng. 43, 464-471 (2004).

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P. S. Huang, C. Zhang, and F.-P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).

[CrossRef]

J. Salvi, J. Pages, and J. Batlle, "Pattern codification strategies in structured light systems," Pattern Recogn. 37, 827-849 (2004).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. P. Jüptner, "Accurate procedure for the calibration of a structured light system," Opt. Eng. 43, 464-471 (2004).

[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).

[CrossRef]

P. S. Huang, Q. Hu, and F.-P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
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J. Davis, R. Ramamoorthi, and S. Rusinkiewicz, "Spacetime stereo: a unifying framework for depth from triangulation," IEEE Trans. Pattern Anal. Mach. Intell. 27, 1-7 (2005).

[CrossRef]

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S. Zhang and P. S. Huang, "Novel method for structured light system calibration," Opt. Eng. 45, 083601 (2006).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," in Two- and Three-Dimensional Methods for Inspection and Metrology III, K. G. Harding, ed., Proc. SPIE 6000, 133-142 (2005).

[CrossRef]

P. S. Huang, C. Zhang, and F.-P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).

[CrossRef]

P. S. Huang, Q. Hu, and F.-P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

S. Zhang and P. S. Huang, "High-resolution, real-time 3-D shape measurement," Opt. Eng. , to be published.

R. Legarda-Sáenz, T. Bothe, and W. P. Jüptner, "Accurate procedure for the calibration of a structured light system," Opt. Eng. 43, 464-471 (2004).

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J. Davis, R. Ramamoorthi, and S. Rusinkiewicz, "Spacetime stereo: a unifying framework for depth from triangulation," IEEE Trans. Pattern Anal. Mach. Intell. 27, 1-7 (2005).

[CrossRef]

J. Davis, R. Ramamoorthi, and S. Rusinkiewicz, "Spacetime stereo: a unifying framework for depth from triangulation," IEEE Trans. Pattern Anal. Mach. Intell. 27, 1-7 (2005).

[CrossRef]

J. Salvi, J. Pages, and J. Batlle, "Pattern codification strategies in structured light systems," Pattern Recogn. 37, 827-849 (2004).

[CrossRef]

D. Skocaj and A. Leonardis, "Range image acquisition of objects with nonuniform albedo using structured light range sensor," in Proceedings of the International Conference on Pattern Recognition (IEEE, 2000), Vol. 1, pp. 778-781.

[CrossRef]

J. C. Wyant and K. N. Prettyjohns, "Optical profiler using improved phase-shifting interferometry," U.S. patent 4,639,139 (27 January 1987).

P. S. Huang, C. Zhang, and F.-P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).

[CrossRef]

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[CrossRef]
[PubMed]

S. Zhang and P. S. Huang, "Novel method for structured light system calibration," Opt. Eng. 45, 083601 (2006).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," in Two- and Three-Dimensional Methods for Inspection and Metrology III, K. G. Harding, ed., Proc. SPIE 6000, 133-142 (2005).

[CrossRef]

S. Zhang and P. Huang, "High-resolution, real-time 3-D shape acquisition," in IEEE Computer Vision and Pattern Recognition Workshop (CVPRW) on Real-Time 3D Sensors and Their Uses (IEEE, 2004), Vol. 3, pp. 28-37.

S. Zhang and P. S. Huang, "High-resolution, real-time 3-D shape measurement," Opt. Eng. , to be published.

J. Schwider, R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk, and K. Merkel, "Digital wave-front measuring interferometry: some systematic error sources," Appl. Opt. 22, 3421-3432 (1983).

[CrossRef]
[PubMed]

P. S. Huang, Q. Hu, and F.-P. Chiang, "Double three-step phase-shifting algorithm," Appl. Opt. 41, 4503-4509 (2002).

[CrossRef]
[PubMed]

H. Guo, H. He, and M. Chen, "Gamma correction for digital fringe projection profilometry," Appl. Opt. 43, 2906-2914 (2004).

[CrossRef]
[PubMed]

J. Davis, R. Ramamoorthi, and S. Rusinkiewicz, "Spacetime stereo: a unifying framework for depth from triangulation," IEEE Trans. Pattern Anal. Mach. Intell. 27, 1-7 (2005).

[CrossRef]

S. Zhang and P. S. Huang, "High-resolution, real-time 3-D shape measurement," Opt. Eng. , to be published.

P. S. Huang, C. Zhang, and F.-P. Chiang, "High-speed 3-D shape measurement based on digital fringe projection," Opt. Eng. 42, 163-168 (2003).

[CrossRef]

R. Legarda-Sáenz, T. Bothe, and W. P. Jüptner, "Accurate procedure for the calibration of a structured light system," Opt. Eng. 43, 464-471 (2004).

[CrossRef]

S. Zhang and P. S. Huang, "Novel method for structured light system calibration," Opt. Eng. 45, 083601 (2006).

[CrossRef]

J. Salvi, J. Pages, and J. Batlle, "Pattern codification strategies in structured light systems," Pattern Recogn. 37, 827-849 (2004).

[CrossRef]

S. Zhang and P. S. Huang, "Phase error compensation for a 3-D shape measurement system based on the phase-shifting method," in Two- and Three-Dimensional Methods for Inspection and Metrology III, K. G. Harding, ed., Proc. SPIE 6000, 133-142 (2005).

[CrossRef]

D. C. Ghiglia and M. D. Pritt, Two-Dimensional Phase Unwrapping: Theory, Algorithms, and Software (Wiley, 1998).

S. Zhang and P. Huang, "High-resolution, real-time 3-D shape acquisition," in IEEE Computer Vision and Pattern Recognition Workshop (CVPRW) on Real-Time 3D Sensors and Their Uses (IEEE, 2004), Vol. 3, pp. 28-37.

D. Malacara, ed., Optical Shop Testing (Wiley, 1992).

J. C. Wyant and K. N. Prettyjohns, "Optical profiler using improved phase-shifting interferometry," U.S. patent 4,639,139 (27 January 1987).

D. Skocaj and A. Leonardis, "Range image acquisition of objects with nonuniform albedo using structured light range sensor," in Proceedings of the International Conference on Pattern Recognition (IEEE, 2000), Vol. 1, pp. 778-781.

[CrossRef]