Abstract

We investigate the influence of an additional scatterer on the tracking signal of an optically trapped particle. The three-dimensional particle position is recorded interferometrically with nanometer precision by using a quadrant photodiode in the back focal plane of a detection lens. A phase disturbance underneath the sample leads to incorrect position signals. The resulting interaction potential and forces are therefore erroneous as well. We present a procedure to correct for the disturbance by measuring its interferometric signal. We prove the applicability of our phase correction approach by generating a defined displacement of the trapped probe.

© 2006 Optical Society of America

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