Abstract

To the best of our knowledge, a combined sensitive technique employing both laser calorimetry and a surface thermal lens scheme for measuring absorption values of optical coatings is presented for the first time. Laser calorimetric and pulsed surface thermal lens signals are simultaneously obtained with a highly reflecting UV coating sample irradiated at 193  nm. The advantages and potential applications of the combined technique and the experimental factors limiting the measurement sensitivity are discussed.

© 2006 Optical Society of America

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    [CrossRef] [PubMed]
  2. R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
    [CrossRef]
  3. D. Ristau and J. Ebert, "Development of a thermographic laser calorimeter," Appl. Opt. 25, 4571-4578 (1986).
    [CrossRef] [PubMed]
  4. U. Willamowski, D. Ristau, and E. Welsch, "Measuring the absolute absorptance of optical laser components," Appl. Opt. 37, 8362-8370 (1998).
    [CrossRef]
  5. O. Apel, K. Mann, A. Zoeller, R. Goetzelmann, and E. Eva, "Nonlinear absorption of thin Al2O3 films at 193 nm," Appl. Opt. 39, 3165-3169 (2000).
    [CrossRef]
  6. ISO 11551: 2003(E), Test Method for Absorptance of Optical Laser Components (International Organization for Standardization, Geneva, 2003).
  7. A. C. Boccara, D. Fournier, W. Jackson, and N. M. Amer, "Sensitive photothermal deflection technique for measuring absorption in optically thin media," Opt. Lett. 5, 377-379 (1980).
    [CrossRef] [PubMed]
  8. K. Ettrich and E. Welsch, "Calculation of the photothermal and photoacoustic response at the sample surface irradiated by short UV laser pulses," Phys. Status Solidi A 145, 113-132 (1994).
    [CrossRef]
  9. P. K. Kuo and M. Munidasa, "Single-beam interferometry of a thermal bump," Appl. Opt. 29, 5326-5331 (1990).
    [CrossRef] [PubMed]
  10. B. Li, S. Martin, and E. Welsch, "Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings," Opt. Lett. 24, 1398-1340 (1999).
    [CrossRef]
  11. E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
    [CrossRef]
  12. M. Commandré and P. Roche, "Characterization of optical coatings by photothermal deflection," Appl. Opt. 35, 5021-5043 (1996).
    [CrossRef] [PubMed]
  13. P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
    [CrossRef]
  14. H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
    [CrossRef]
  15. H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
    [CrossRef]
  16. H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
    [CrossRef]
  17. B. Li and E. Welsch, "Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration," Appl. Opt. 38, 5241-5249 (1999).
    [CrossRef]
  18. B. Li, S. Martin, and E. Welsch, "In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens," Appl. Opt. 39, 4690-4697 (2000).
    [CrossRef]
  19. B. Li, S. Martin, and E. Welsch, "Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm," Appl. Phys. A 74, 27-33 (2002).
    [CrossRef]
  20. S. E. Bialkowski and A. Chartier, "Diffraction effects in single- and two-laser photothermal lens spectroscopy," Appl. Opt. 36, 6711-6721 (1997).
    [CrossRef]

2003 (2)

ISO 11551: 2003(E), Test Method for Absorptance of Optical Laser Components (International Organization for Standardization, Geneva, 2003).

H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
[CrossRef]

2002 (2)

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm," Appl. Phys. A 74, 27-33 (2002).
[CrossRef]

2001 (2)

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

2000 (2)

1999 (2)

1998 (1)

1997 (1)

1996 (1)

1995 (1)

1994 (2)

K. Ettrich and E. Welsch, "Calculation of the photothermal and photoacoustic response at the sample surface irradiated by short UV laser pulses," Phys. Status Solidi A 145, 113-132 (1994).
[CrossRef]

P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
[CrossRef]

1993 (1)

E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
[CrossRef]

1990 (1)

1986 (1)

1980 (1)

Amer, N. M.

Apel, O.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

O. Apel, K. Mann, A. Zoeller, R. Goetzelmann, and E. Eva, "Nonlinear absorption of thin Al2O3 films at 193 nm," Appl. Opt. 39, 3165-3169 (2000).
[CrossRef]

Bialkowski, S. E.

Blaschke, H.

H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
[CrossRef]

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Boccara, A. C.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

A. C. Boccara, D. Fournier, W. Jackson, and N. M. Amer, "Sensitive photothermal deflection technique for measuring absorption in optically thin media," Opt. Lett. 5, 377-379 (1980).
[CrossRef] [PubMed]

Bock, S.

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

Broulik, U.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Chartier, A.

Chen, Y.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Chow, R.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Commandre, M.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Commandré, M.

DiJon, J.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Ebert, J.

Ettrich, K.

K. Ettrich and E. Welsch, "Calculation of the photothermal and photoacoustic response at the sample surface irradiated by short UV laser pulses," Phys. Status Solidi A 145, 113-132 (1994).
[CrossRef]

Eva, E.

Exarhos, G. J.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Fan, Z. X.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Fleig, C.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Fournier, D.

Giesen, A.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Goetzelmann, R.

Guenther, A. H.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Jackson, W.

Jupe, M.

H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
[CrossRef]

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

Kozlowski, M. K.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Kuo, P. K.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

P. K. Kuo and M. Munidasa, "Single-beam interferometry of a thermal bump," Appl. Opt. 29, 5326-5331 (1990).
[CrossRef] [PubMed]

Lalezari, R.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Lewis, K. L.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Li, B.

Mann, K.

Martin, S.

B. Li, S. Martin, and E. Welsch, "Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm," Appl. Phys. A 74, 27-33 (2002).
[CrossRef]

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens," Appl. Opt. 39, 4690-4697 (2000).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings," Opt. Lett. 24, 1398-1340 (1999).
[CrossRef]

Moncur, K.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Munidasa, M.

Obramski, H.-J.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Pelle, C.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Reicher, D. W.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Reichling, M.

E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
[CrossRef]

Ristau, D.

H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
[CrossRef]

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

U. Willamowski, D. Ristau, and E. Welsch, "Measuring the absolute absorptance of optical laser components," Appl. Opt. 37, 8362-8370 (1998).
[CrossRef]

E. Welsch and D. Ristau, "Photothermal measurements on optical thin films," Appl. Opt. 34, 7239-7253 (1995).
[CrossRef] [PubMed]

P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
[CrossRef]

D. Ristau and J. Ebert, "Development of a thermographic laser calorimeter," Appl. Opt. 25, 4571-4578 (1986).
[CrossRef] [PubMed]

Roche, P.

Roche, P. J.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Soileau, M. J.

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

Steiger, B.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Taylor, J. R.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Thomsen, M.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

von Gunten, M.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Welsch, E.

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm," Appl. Phys. A 74, 27-33 (2002).
[CrossRef]

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "In situ measurement on ultraviolet dielectric components by a pulsed top-hat beam thermal lens," Appl. Opt. 39, 4690-4697 (2000).
[CrossRef]

B. Li and E. Welsch, "Probe-beam diffraction in a pulsed top-hat beam thermal lens with a mode-mismatched configuration," Appl. Opt. 38, 5241-5249 (1999).
[CrossRef]

B. Li, S. Martin, and E. Welsch, "Pulsed top-hat beam thermal-lens measurement for ultraviolet dielectric coatings," Opt. Lett. 24, 1398-1340 (1999).
[CrossRef]

U. Willamowski, D. Ristau, and E. Welsch, "Measuring the absolute absorptance of optical laser components," Appl. Opt. 37, 8362-8370 (1998).
[CrossRef]

E. Welsch and D. Ristau, "Photothermal measurements on optical thin films," Appl. Opt. 34, 7239-7253 (1995).
[CrossRef] [PubMed]

K. Ettrich and E. Welsch, "Calculation of the photothermal and photoacoustic response at the sample surface irradiated by short UV laser pulses," Phys. Status Solidi A 145, 113-132 (1994).
[CrossRef]

P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
[CrossRef]

E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
[CrossRef]

Willamowski, U.

Wu, Z. L.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Zhao, Q.

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

Zimmermann, P.

P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
[CrossRef]

Zoeller, A.

Appl. Opt. (9)

Appl. Phys. A (2)

B. Li, S. Martin, and E. Welsch, "Laser conditioning and nonlinear absorption of LaF3/MgF2 dielectric multilayers at 193 nm," Appl. Phys. A 74, 27-33 (2002).
[CrossRef]

P. Zimmermann, D. Ristau, and E. Welsch, "Potentiality of the photothermal surface-displacement technique for precisely performed absorption measurement of optical coatings," Appl. Phys. A 58, 377-383 (1994).
[CrossRef]

J. Mod. Opt. (1)

E. Welsch and M. Reichling, "Micrometer resolved photothermal displacement inspection of optical coatings," J. Mod. Opt. 40, 1455-1475 (1993).
[CrossRef]

Opt. Lett. (2)

Phys. Status Solidi A (1)

K. Ettrich and E. Welsch, "Calculation of the photothermal and photoacoustic response at the sample surface irradiated by short UV laser pulses," Phys. Status Solidi A 145, 113-132 (1994).
[CrossRef]

Proc. SPIE (4)

R. Chow, J. R. Taylor, Z. L. Wu, A. C. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. X. Fan, P. K. Kuo, R. Lalezari, K. Moncur, H.-J. Obramski, C. Pelle, D. W. Reicher, D. Ristau, P. J. Roche, B. Steiger, M. Thomsen, M. von Gunten, and Q. Zhao, "Absorptance measurements of optical coatings--a round robin," in Laser-Induced Damage in Optical Materials: 2000, G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 62-73 (2001).
[CrossRef]

H. Blaschke, D. Ristau, E. Welsch, and O. Apel, "Absolute measurements of non-linear absorption near LIDT at 193 nm," in Laser-Induced Damage in Optical Materials: 2000,G. J. Exarhos, A. H. Guenther, M. K. Kozlowski, K. L. Lewis, and M. J. Soileau, eds., Proc. SPIE 4347, 447-453 (2001).
[CrossRef]

H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, and E. Welsch, "Investigations of the dynamic absorptance behavior of hybrid multilayers at 193 nm," in Laser-InducedDamage in Optical Materials: 2001, G. J. Exarhos, A. H. Guenther, K. L. Lewis, M. J. Soileau, and C. Stolz, eds., Proc. SPIE 4679, 420-428 (2002).
[CrossRef]

H. Blaschke, M. Jupe, and D. Ristau, "Absorptance measurements for the DUV spectral range by laser calorimetry," in Laser-Induced Damage in Optical Materials: 2002, G. J. Exarhos, A. H. Guenther, N. Kaiser, K. L. Lewis, M. J. Soileau, C. Stolz, A. Giesen, and H. Weber, eds., Proc. SPIE 4932, 467-474 (2003).
[CrossRef]

Other (1)

ISO 11551: 2003(E), Test Method for Absorptance of Optical Laser Components (International Organization for Standardization, Geneva, 2003).

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Figures (2)

Fig. 1
Fig. 1

(Color online) Schematic diagram of the optical arrangement for the combined LC and STL technique. A/D, analog-to-digital; VUV, vacuum ultraviolet; NTG, negative temperature coefficient temperature sensors.

Fig. 2
Fig. 2

(Color online) (a) Calorimetric signal and (b) thermal lens signal obtained simultaneously with a highly reflective mirror irradiated at 193   nm . The irradiation fluence is 0.52 J / cm 2 . The repetition rate of the laser is 57   Hz .

Equations (4)

Equations on this page are rendered with MathJax. Learn more.

A rel = 1000 S max F V ,
Δ T max = α P AV γ C eff [ 1 exp ( γ Δ t ) ] ,
S max B Δ ϕ max .
Δ ϕ max = 2 π λ 2 h max α F ,

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