Measurement of group refractive index wavelength dependence using a low-coherence tandem interferometer

Abstract

A technique for the measurement of the group refractive index wavelength dependence of optical materials using a low-coherence tandem interferometer and a spectrometer is proposed. Four channeled spectra resulting from interferences of light beams from different pairs of optical paths are used for the calculation of optical path differences. The group refractive index wavelength dependence is calculated from these optical path differences generated from the sample under measurement. No a priori information of the geometric thickness of a sample is required. The wavelength dependence of the group refractive index of the samples BK7 parallel plate of 5.200 and $10.025\text{\hspace{0.17em} mm}$ from 675 to $850\text{\hspace{0.17em} nm}$ is experimentally measured with an accuracy of the order of ${10}^{-5}$ and a repeatability of the order of ${10}^{-9}$.

© 2006 Optical Society of America

Low-coherence tandem interferometer for measurement of group refractive index without knowledge of the thickness of the test sample

Akiko Hirai and Hirokazu Matsumoto
Opt. Lett. 28(21) 2112-2114 (2003)

Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry

Dominic F. Murphy and Dónal A. Flavin
Appl. Opt. 39(25) 4607-4615 (2000)

Simultaneous measurement of group refractive index and thickness of optical samples using optical coherence tomography

Hsu-Chih Cheng and Yi-Cheng Liu
Appl. Opt. 49(5) 790-797 (2010)

Simultaneous thickness and group index measurement with a single arm low-coherence interferometer

S. C. Zilio
Opt. Express 22(22) 27392-27397 (2014)

Simultaneous measurement of group and phase refractive indices and physical thickness of transparent plates with low coherence Fabry–Perot interferometry

David J. Bang, Yudeuk Kim, Yoohan Kim, Myung-Jik Kim, and Kyong Hon Kim
Appl. Opt. 57(16) 4428-4433 (2018)