Abstract

What we believe to be a novel procedure to correct the nonuniformity that is inherent in all matrix detectors has been developed and experimentally validated. This correction method, unlike other nonuniformity-correction algorithms, consists of two steps that separate two of the usual problems that affect characterization of matrix detectors, i.e., nonlinearity and the relative variation of the pixels' responsivity across the array. The correction of the nonlinear behavior remains valid for any illumination wavelength employed, as long as the nonlinearity is not due to power dependence of the internal quantum efficiency. This method of correction of nonuniformity permits the immediate calculation of the correction factor for any given power level and for any illuminant that has a known spectral content once the nonuniform behavior has been characterized for a sufficient number of wavelengths. This procedure has a significant advantage compared with other traditional calibration-based methods, which require that a full characterization be carried out for each spectral distribution pattern of the incident optical radiation. The experimental application of this novel method has achieved a 20-fold increase in the uniformity of a CCD array for response levels close to saturation.

© 2006 Optical Society of America

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