Abstract

The nonlinearity characteristics of a commercially available thin-film photoconductive PbS detector were experimentally investigated in the infrared using the National Physical Laboratory detector linearity characterization facility. The deviation from linearity of this detector was shown to be significant even for relatively low values of radiant power incident on the active area of the detector. For example, the linearity factor was approximately 0.8 when 0.6 μW of radiant power at a wavelength of 2.2 μm was illuminating a spot of 1 mm in diameter on the active area of the PbS detector. These figures demonstrate the poor linearity characteristics of this detector and provide a warning to other users of PbS detection systems. The deviation from linearity was shown to be a function of the size of the spot being illuminated on the detector active area, as well as the wavelength of the incident radiation. The deviation from linearity was shown to be a function of irradiance illuminating the detector for irradiance values lower than 1 μW mm−2.

© 2006 Optical Society of America

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  2. Hamamatsu Photonics KK, Solid State Division, "Infrared detectors," in Hamamatsu Products Catalog, Cat. No. KIRD0001E05, pp. 14-15.
  3. See Judson Technologies at http://www.judsontechnologies.com.
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2005 (1)

E. Theocharous, J. Ishii, and N. P. Fox, "A comparison of the performance of a photovoltaic HgCdTe detector with that of a large area single pixel QWIP for infrared radiometric applications," Infrared Phys. Technol. 46, 309-322 (2005).
[CrossRef]

2004 (1)

2003 (1)

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

2002 (1)

1998 (2)

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

T. Kubarsepp, A. Haapalinna, P. Karha, and E. Ikonen, "Non-linearity measurements of silicon photodetectors," Appl. Opt. 37, 2716-2722 (1998).

1997 (1)

1996 (1)

E. Theocharous, N. P. Fox, and T. R. Prior, "A comparison of the performance of infrared detectors for radiometric applications," in Proc. SPIE 2815, 56-68 (1996).
[CrossRef]

1993 (1)

1992 (1)

1991 (1)

1989 (1)

1972 (1)

C. L. Sanders, "Accurate measurements of and corrections for nonlinearities in radiometers," J. Res. Natl. Bur. Stand. Sect. A 76, 437-453 (1972).

Bianchini, G.

Campos, J.

Clarke, F. J. J.

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

Corredera, P.

Corrons, A.

Cortesi, U.

Fischer, J.

Fox, N. P.

E. Theocharous, J. Ishii, and N. P. Fox, "A comparison of the performance of a photovoltaic HgCdTe detector with that of a large area single pixel QWIP for infrared radiometric applications," Infrared Phys. Technol. 46, 309-322 (2005).
[CrossRef]

E. Theocharous, J. Ishii, and N. P. Fox, "Absolute linearity measurements on HgCdTe detectors in the infrared," Appl. Opt. 43, 4182-4188 (2004).
[CrossRef]

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

E. Theocharous, N. P. Fox, and T. R. Prior, "A comparison of the performance of infrared detectors for radiometric applications," in Proc. SPIE 2815, 56-68 (1996).
[CrossRef]

Frehlich, R. G.

Fu, L.

Griffiths, P. R.

Haapalinna, A.

Hansen, L. M.

Haycocks, P. R.

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

Ikonen, E.

Ishii, J.

E. Theocharous, J. Ishii, and N. P. Fox, "A comparison of the performance of a photovoltaic HgCdTe detector with that of a large area single pixel QWIP for infrared radiometric applications," Infrared Phys. Technol. 46, 309-322 (2005).
[CrossRef]

E. Theocharous, J. Ishii, and N. P. Fox, "Absolute linearity measurements on HgCdTe detectors in the infrared," Appl. Opt. 43, 4182-4188 (2004).
[CrossRef]

Karha, P.

Kubarsepp, T.

Lee, C.

Palchetti, L.

Pascale, E.

Pons, A.

Prior, T. R.

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

E. Theocharous, N. P. Fox, and T. R. Prior, "A comparison of the performance of infrared detectors for radiometric applications," in Proc. SPIE 2815, 56-68 (1996).
[CrossRef]

Richardson, R. L.

Rogers, L. J.

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

Sanders, C. L.

C. L. Sanders, "Accurate measurements of and corrections for nonlinearities in radiometers," J. Res. Natl. Bur. Stand. Sect. A 76, 437-453 (1972).

Theocharous, E.

E. Theocharous, J. Ishii, and N. P. Fox, "A comparison of the performance of a photovoltaic HgCdTe detector with that of a large area single pixel QWIP for infrared radiometric applications," Infrared Phys. Technol. 46, 309-322 (2005).
[CrossRef]

E. Theocharous, J. Ishii, and N. P. Fox, "Absolute linearity measurements on HgCdTe detectors in the infrared," Appl. Opt. 43, 4182-4188 (2004).
[CrossRef]

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

E. Theocharous, N. P. Fox, and T. R. Prior, "A comparison of the performance of infrared detectors for radiometric applications," in Proc. SPIE 2815, 56-68 (1996).
[CrossRef]

Yang, H.

Zhang, Z. M.

Zhu, C. J.

Appl. Opt. (5)

Appl. Spectrosc. (3)

Infrared Phys. Technol. (1)

E. Theocharous, J. Ishii, and N. P. Fox, "A comparison of the performance of a photovoltaic HgCdTe detector with that of a large area single pixel QWIP for infrared radiometric applications," Infrared Phys. Technol. 46, 309-322 (2005).
[CrossRef]

J. Res. Natl. Bur. Stand. Sect. A (1)

C. L. Sanders, "Accurate measurements of and corrections for nonlinearities in radiometers," J. Res. Natl. Bur. Stand. Sect. A 76, 437-453 (1972).

Metrologia (1)

E. Theocharous, T. R. Prior, P. R. Haycocks, and N. P. Fox, "High accuracy, infrared spectral responsivity scale," Metrologia 35, 543-548 (1998).
[CrossRef]

Proc. SPIE (2)

E. Theocharous, N. P. Fox, and T. R. Prior, "A comparison of the performance of infrared detectors for radiometric applications," in Proc. SPIE 2815, 56-68 (1996).
[CrossRef]

E. Theocharous, F. J. J. Clarke, L. J. Rogers, and N. P. Fox, "Latest measurement techniques at NPL for the characterization of infrared detectors and materials," in Proc. SPIE 5209, 228-239 (2003).
[CrossRef]

Other (3)

See Cal Sensors Inc. at http://www.calsensors.com.

Hamamatsu Photonics KK, Solid State Division, "Infrared detectors," in Hamamatsu Products Catalog, Cat. No. KIRD0001E05, pp. 14-15.

See Judson Technologies at http://www.judsontechnologies.com.

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