Abstract

Using near-field optical microscopy at the wavelength of 633nm, we image light intensity distributions at several distances above an 2-μm-deep and a 1-μm-period glass grating illuminated from below under the condition of total internal reflection. The intensity distributions are numerically modeled, and an inversion procedure based on a least-squares-fit optimization is employed to extract the grating geometry from the optical images.

© 2006 Optical Society of America

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References

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  1. D. Courjon, Near-Field Microscopy and Near-Field Optics (Imperial College Press, London, 2003).
  2. S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
    [Crossref]
  3. D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
    [Crossref]
  4. J. M. Vigoureux and D. Courjon, "Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion," Appl. Opt. 31, 3170-3177 (1992).
    [Crossref] [PubMed]
  5. J.-J. Greffet and R. Carminati, "Image formation in near-field optics," Prog. Surf. Sci. 56, 133-237 (1997).
    [Crossref]
  6. J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
    [Crossref]
  7. R. Carminati and J.-J. Greffet, "Reconstruction of the dielectric contrast profile from near-field data," Ultramicroscopy 61, 11-16 (1995).
    [Crossref]
  8. P. S. Carney and J. C. Schotland, "Determination of three-dimensional structure in photon scanning tunnelling microscopy," J. Opt. A 4, 140-144 (2002).
    [Crossref]
  9. P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
    [Crossref] [PubMed]
  10. D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
    [Crossref]
  11. S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
    [Crossref]
  12. DME-DualScope, Danish Micro Engineering A/S, Transformervej 12, DK-2730, Herlev, Denmark.
  13. R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
    [Crossref]
  14. A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
    [Crossref]
  15. S. I. Bozhevolnyi, "Near-field mapping of surface polariton fields," J. Microsc. 202, 313-319 (2000).
    [Crossref]
  16. P. Bienstman and R. Baets, "Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers," Opt. Quantum Electron. 33, 327-341 (2001).
    [Crossref]
  17. S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
    [Crossref]
  18. A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
    [Crossref]

2004 (2)

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
[Crossref]

2002 (3)

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

P. S. Carney and J. C. Schotland, "Determination of three-dimensional structure in photon scanning tunnelling microscopy," J. Opt. A 4, 140-144 (2002).
[Crossref]

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

2001 (1)

P. Bienstman and R. Baets, "Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers," Opt. Quantum Electron. 33, 327-341 (2001).
[Crossref]

2000 (1)

S. I. Bozhevolnyi, "Near-field mapping of surface polariton fields," J. Microsc. 202, 313-319 (2000).
[Crossref]

1999 (2)

S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
[Crossref]

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

1998 (1)

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

1997 (1)

J.-J. Greffet and R. Carminati, "Image formation in near-field optics," Prog. Surf. Sci. 56, 133-237 (1997).
[Crossref]

1995 (2)

J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
[Crossref]

R. Carminati and J.-J. Greffet, "Reconstruction of the dielectric contrast profile from near-field data," Ultramicroscopy 61, 11-16 (1995).
[Crossref]

1993 (1)

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

1992 (1)

J. M. Vigoureux and D. Courjon, "Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion," Appl. Opt. 31, 3170-3177 (1992).
[Crossref] [PubMed]

Baets, R.

P. Bienstman and R. Baets, "Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers," Opt. Quantum Electron. 33, 327-341 (2001).
[Crossref]

Baida, F.

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

Bainier, C.

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

Barchiesi, D.

D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
[Crossref]

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

Bienstman, P.

P. Bienstman and R. Baets, "Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers," Opt. Quantum Electron. 33, 327-341 (2001).
[Crossref]

Boltasseva, A.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Borel, P. I.

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Bozhevolnaya, E. A.

S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
[Crossref]

Bozhevolnyi, S. I.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

S. I. Bozhevolnyi, "Near-field mapping of surface polariton fields," J. Microsc. 202, 313-319 (2000).
[Crossref]

S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
[Crossref]

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Carminati, R.

J.-J. Greffet and R. Carminati, "Image formation in near-field optics," Prog. Surf. Sci. 56, 133-237 (1997).
[Crossref]

J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
[Crossref]

R. Carminati and J.-J. Greffet, "Reconstruction of the dielectric contrast profile from near-field data," Ultramicroscopy 61, 11-16 (1995).
[Crossref]

Carney, P. S.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

P. S. Carney and J. C. Schotland, "Determination of three-dimensional structure in photon scanning tunnelling microscopy," J. Opt. A 4, 140-144 (2002).
[Crossref]

Coello, V.

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Courjon, D.

J. M. Vigoureux and D. Courjon, "Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion," Appl. Opt. 31, 3170-3177 (1992).
[Crossref] [PubMed]

D. Courjon, Near-Field Microscopy and Near-Field Optics (Imperial College Press, London, 2003).

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

Dändliker, R.

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

Deckert, V.

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

Fokas, C.

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

Frazin, R. A.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

Greffet, J.-J.

J.-J. Greffet and R. Carminati, "Image formation in near-field optics," Prog. Surf. Sci. 56, 133-237 (1997).
[Crossref]

J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
[Crossref]

R. Carminati and J.-J. Greffet, "Reconstruction of the dielectric contrast profile from near-field data," Ultramicroscopy 61, 11-16 (1995).
[Crossref]

Herzig, H. P.

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

Kim, W.

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Kristensen, M.

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Lewis, A.

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

Lieberman, K.

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

Macías, D.

D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
[Crossref]

Markel, V. A.

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Nesci, A.

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

Rudman, M.

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

Salt, M.

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

Schotland, J. C.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

P. S. Carney and J. C. Schotland, "Determination of three-dimensional structure in photon scanning tunnelling microscopy," J. Opt. A 4, 140-144 (2002).
[Crossref]

Sentenac, A.

J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
[Crossref]

Shalaev, V. M.

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Shchemelinin, A.

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

Søndergaard, T.

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Stockle, R.

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

van Labeke, D.

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

Vial, A.

D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
[Crossref]

Vigoureux, J. M.

J. M. Vigoureux and D. Courjon, "Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion," Appl. Opt. 31, 3170-3177 (1992).
[Crossref] [PubMed]

Vohnsen, B.

S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
[Crossref]

Volkov, V. S.

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Zenoby, R.

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

Appl. Opt. (1)

J. M. Vigoureux and D. Courjon, "Detection of nonradiative fields in light of the Heisenberg uncertainty principle and the Rayleigh criterion," Appl. Opt. 31, 3170-3177 (1992).
[Crossref] [PubMed]

Appl. Phys. Lett. (1)

R. Stockle, C. Fokas, V. Deckert, and R. Zenoby, "High-quality near-field optical probes by tube etching," Appl. Phys. Lett. 75, 160-162 (1999).
[Crossref]

J. Microsc. (1)

S. I. Bozhevolnyi, "Near-field mapping of surface polariton fields," J. Microsc. 202, 313-319 (2000).
[Crossref]

J. Opt. A (1)

P. S. Carney and J. C. Schotland, "Determination of three-dimensional structure in photon scanning tunnelling microscopy," J. Opt. A 4, 140-144 (2002).
[Crossref]

J. Opt. Soc. Am. A. (1)

D. Macías, A. Vial, and D. Barchiesi, "Application of evolution strategies for the solution of an inverse problem in near-field optics," J. Opt. Soc. Am. A. 21, 1465-1471 (2004).
[Crossref]

Opt. Commun. (1)

J.-J. Greffet, A. Sentenac, and R. Carminati, "Surface profile reconstruction using near-field data," Opt. Commun. 116, 20-24 (1995).
[Crossref]

Opt. Quantum Electron. (1)

P. Bienstman and R. Baets, "Optical modelling of photonic crystals and VCSELs using eigenmode expansion and perfectly matched layers," Opt. Quantum Electron. 33, 327-341 (2001).
[Crossref]

Opt. Commun. (2)

A. Nesci, R. Dändliker, M. Salt, and H. P. Herzig, "Measuring amplitude and phase distribution of fields generated by gratings with sub-wavelength resolution," Opt. Commun. 205, 229-238 (2002).
[Crossref]

S. I. Bozhevolnyi, B. Vohnsen, and E. A. Bozhevolnaya, "Transfer functions in collection scanning near-field optical microscopy," Opt. Commun. 172, 171-179 (1999).
[Crossref]

Phys. Rev. B (1)

S. I. Bozhevolnyi, V. S. Volkov, T. Søndergaard, A. Boltasseva, P. I. Borel, and M. Kristensen, "Near-field imaging of light propagation in photonic crystal waveguides: explicit role of Bloch harmonics," Phys. Rev. B 66, 235204 (2002).
[Crossref]

Phys. Rev. Lett. (1)

P. S. Carney, R. A. Frazin, S. I. Bozhevolnyi, V. S. Volkov, A. Boltasseva, and J. C. Schotland, "Computational lens for the near field," Phys. Rev. Lett. 92, 163903 (2004).
[Crossref] [PubMed]

Phys. Rev. B. (1)

S. I. Bozhevolnyi, V. A. Markel, V. Coello, W. Kim, and V. M. Shalaev, "Direct observation of localized dipolar excitations on rough nanostructured surfaces," Phys. Rev. B. 58, 11441-11448 (1998).
[Crossref]

Prog. Surf. Sci. (1)

J.-J. Greffet and R. Carminati, "Image formation in near-field optics," Prog. Surf. Sci. 56, 133-237 (1997).
[Crossref]

Rev. Sci. Instrum. (1)

A. Shchemelinin, M. Rudman, K. Lieberman, and A. Lewis, "A simple lateral force sensing technique for near-field micropattern generation," Rev. Sci. Instrum. 64, 3538-3541 (1993).
[Crossref]

Ultramicroscopy (1)

R. Carminati and J.-J. Greffet, "Reconstruction of the dielectric contrast profile from near-field data," Ultramicroscopy 61, 11-16 (1995).
[Crossref]

Other (3)

D. Courjon, F. Baida, C. Bainier, D. van Labeke, and D. Barchiesi, "Near field instrumentation," in Photons and Local Probes, Nato Asi Series E, Applied Sciences, Vol. 300, O.Marti and R.Möller, eds. (Kluwer Academic, Dordrecht, 1995), pp. 59-77.
[Crossref]

DME-DualScope, Danish Micro Engineering A/S, Transformervej 12, DK-2730, Herlev, Denmark.

D. Courjon, Near-Field Microscopy and Near-Field Optics (Imperial College Press, London, 2003).

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Figures (5)

Fig. 1
Fig. 1

Scanning electron microscopy image of the grating profile.

Fig. 2
Fig. 2

Schematic representation of the main part of the experimental setup.

Fig. 3
Fig. 3

Gray-scale near-field optical images ( 3.9 × 3.9 μm 2 ) obtained at λ 633 nm for different tip–surface distances: (a) 100 , (b) 500 , (c) 900 nm.

Fig. 4
Fig. 4

Two-parameter geometric model of the grating.

Fig. 5
Fig. 5

(a) Experimental average XZ measured signal profile and (b) modeled field intensity (Ey amplitude2) at the global minimum.

Tables (1)

Tables Icon

Table 1 Parameters p(min)

Equations (8)

Equations on this page are rendered with MathJax. Learn more.

× × E ( x , y , z ) + ε r ( x , y ) k 0 2 E ( x , y , z ) = 0 .
2 e + ( + i β z ^ ) ( e ln ε r ) + ε r k 0 2 e = β 2 e .
2 e + ( e ln ε r ) + ε r k 0 2 e = β 2 e .
i β e z = e e ln ε r .
O m n = ϕ m * ( ϕ n ln ε r ) d x d y
= ( ϕ m * ) ( ϕ n ln ε r ) d x d y
C ( ϕ m * ) | Δ ln ε r | ϕ n d s .
f ( p ) = [ I exp ( r ) I ( r | p ) ] 2 d r .

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