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Phase retrieval from diffraction intensities by use of a scanning slit aperture

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Abstract

A noniterative method of retrieving the phase of a wave field from intensities measured during scanning of a slit aperture is proposed. In the measurements, one records the diffraction intensities of wave fields transmitted through a slit that is scanned along two directions in the Fresnel-zone plane of an object’s field. From these intensities, the phase in the Fresnel-zone plane can be retrieved by a method in which a novel phase calculation technique that uses Fourier transforms is included. Because the method does not require lens systems, it provides a potentially useful means for coherent imaging by use of x rays, electrons, or nuclear particles.

© 2005 Optical Society of America

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Improvement of resolution for phase retrieval by use of a scanning slit

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