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Self-referenced prism deflection measurement schemes with microradian precision

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Abstract

We have demonstrated several inexpensive methods that can be used to measure the deflection angles of prisms with microradian precision. The methods are self-referenced, where various reversals are used to achieve absolute measurements without the need of a reference prism or any expensive precision components other than the prisms under test. These techniques are based on laser interferometry and have been used in our laboratory to characterize parallel-plate beam splitters, penta prisms, right-angle prisms, and corner cube reflectors using only components typically available in an optics laboratory.

© 2005 Optical Society of America

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