Abstract

Ordered mesoporous and nonporous silica films were studied by analysis of reflection spectra and hemispherical elastic light scattering (HELS). The real and imaginary parts of the index of the films were estimated from the reflection spectra. The HELS angular distribution of the mesoporous film shows a minimum, which has been interpreted as an interference pattern coming from the beams scattered by the mesopores.

© 2005 Optical Society of America

Full Article  |  PDF Article

References

  • View by:
  • |
  • |
  • |

  1. J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
    [CrossRef]
  2. Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
    [CrossRef]
  3. M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
    [CrossRef]
  4. M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
    [CrossRef]
  5. H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
    [CrossRef]
  6. C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
    [CrossRef]
  7. G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
    [CrossRef]
  8. G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
    [CrossRef]
  9. B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
    [CrossRef]
  10. V. Dufaud, M. E. Davis, “Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials,” J. Am. Chem. Soc. 125, 9403–9413 (2003).
    [CrossRef] [PubMed]
  11. E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
    [CrossRef]
  12. S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
    [CrossRef]
  13. S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
    [CrossRef]
  14. M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).
  15. S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
    [CrossRef]
  16. R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
    [CrossRef]
  17. D. A. Minkov, “Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum,” J. Phys. D: Appl. Phys. 22, 1157–1161 (1989).
    [CrossRef]
  18. D. A. Minkov, “Method for determining the optical constants of a thin film on a transparent substrate,” J. Phys. D: Appl. Phys. 22, 199–205 (1989).
    [CrossRef]
  19. K. A. Epstein, D. K. Misemer, G. D. Vernstrom, “Optical parameters of absorbing semiconductors from transmission and reflection,” Appl. Opt. 26, 294–299 (1987).
    [CrossRef] [PubMed]
  20. R. Rusli, G. A. J. Amaratunga, “Determination of the optical constants and thickness of thin films on slightly absorbing substrates,” Appl. Opt. 34, 7914–7924 (1995).
  21. J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
    [CrossRef]
  22. J. Müllerová, J. Mudro, “Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra,” Acta Phys. Slov. 50, 477–488 (2000).
  23. D. Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1985).
  24. V. A. Sterligov, P. Cheyssac, “Appareil et procédé de caractérisation optique d’un objet,” patent CNRSFR2832795, G01B-011/30 (23November2001).
  25. A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
    [CrossRef]
  26. D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
    [CrossRef]
  27. S. Besson, “Organized mesoporous silica films: synthesis, characterization of the structure and application to the growth of nanoparticles,” Ph.D. thesis (Ecole Polytechnique, Paris, 2002) (in French).
  28. A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
    [CrossRef]
  29. P. Roche, E. Pelletier, G. Albrand, “Antiscattering transparent monolayers: theory and experiment,” J. Opt. Soc. Am. A 1, 1032–1033 (1984).
    [CrossRef]
  30. C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986).
    [CrossRef]
  31. H. Giovannini, C. Amra, “Scattering-reduction effect with overcoated rough surfaces: theory and experiment,” Appl. Opt. 36, 5574–5579 (1997).
    [CrossRef] [PubMed]

2004 (1)

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

2003 (3)

V. Dufaud, M. E. Davis, “Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials,” J. Am. Chem. Soc. 125, 9403–9413 (2003).
[CrossRef] [PubMed]

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

2002 (1)

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

2001 (5)

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
[CrossRef]

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
[CrossRef]

2000 (7)

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

J. Müllerová, J. Mudro, “Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra,” Acta Phys. Slov. 50, 477–488 (2000).

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

1998 (1)

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

1997 (2)

H. Giovannini, C. Amra, “Scattering-reduction effect with overcoated rough surfaces: theory and experiment,” Appl. Opt. 36, 5574–5579 (1997).
[CrossRef] [PubMed]

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

1995 (1)

1992 (1)

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

1989 (2)

D. A. Minkov, “Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum,” J. Phys. D: Appl. Phys. 22, 1157–1161 (1989).
[CrossRef]

D. A. Minkov, “Method for determining the optical constants of a thin film on a transparent substrate,” J. Phys. D: Appl. Phys. 22, 199–205 (1989).
[CrossRef]

1987 (1)

1986 (1)

C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986).
[CrossRef]

1984 (1)

1977 (1)

R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
[CrossRef]

Albouy, P. A.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

Albouy, P.-A.

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Albrand, G.

C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986).
[CrossRef]

P. Roche, E. Pelletier, G. Albrand, “Antiscattering transparent monolayers: theory and experiment,” J. Opt. Soc. Am. A 1, 1032–1033 (1984).
[CrossRef]

Amaratunga, G. A. J.

Amra, C.

H. Giovannini, C. Amra, “Scattering-reduction effect with overcoated rough surfaces: theory and experiment,” Appl. Opt. 36, 5574–5579 (1997).
[CrossRef] [PubMed]

C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986).
[CrossRef]

Anderson, M. T.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Ayral, A.

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

Babonneau, D.

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

Babonneau, F.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Balkenende, A. R.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

Beck, J. S.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Bentley, H. R.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Bernal-Oliva, A. M.

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

Besson, S.

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

S. Besson, “Organized mesoporous silica films: synthesis, characterization of the structure and application to the growth of nanoparticles,” Ph.D. thesis (Ecole Polytechnique, Paris, 2002) (in French).

Boilot, J. P.

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

Boilot, J.-P.

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

Bosc, F.

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

Brinker, C. J.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Brunet-Bruneau, A.

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

Busca, G.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Cabuil, V.

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Chao, K.-J.

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Cheyssac, P.

R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
[CrossRef]

V. A. Sterligov, P. Cheyssac, “Appareil et procédé de caractérisation optique d’un objet,” patent CNRSFR2832795, G01B-011/30 (23November2001).

Chmelka, B. F.

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

Cho, A.-T.

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Chu, C. T. W.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Clem, P.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Cot, L.

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

Davis, M. E.

V. Dufaud, M. E. Davis, “Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials,” J. Am. Chem. Soc. 125, 9403–9413 (2003).
[CrossRef] [PubMed]

Drewien, C. A.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Dufaud, V.

V. Dufaud, M. E. Davis, “Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials,” J. Am. Chem. Soc. 125, 9403–9413 (2003).
[CrossRef] [PubMed]

Dunn, B.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Epstein, K. A.

Fan, H.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Fisson, S.

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

Gacoin, T.

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

Gallas, B.

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

Ganguli, R.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Giovannini, H.

Gong, W.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

González-Leal, J. M.

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

Grosso, D.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Guizard, C.

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

Guo, Y.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Higgins, J. B.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Huang, M. H.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Jacquiod, C.

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

Jiménez-Garay, R.

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

Jimenez-Lopez, A.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Jones, D. J.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Kathan, K. R.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Klotz, M.

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

Kofman, R.

R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
[CrossRef]

Kresge, C. T.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Lavergne, M.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

Lenarda, M.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Leonowicz, M. E.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Lu, Y.

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Maireles-Torres, P.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Márquez, E.

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

Mazerolles, L.

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

McGullen, S. B.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Ménager, C.

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Minkov, D. A.

D. A. Minkov, “Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum,” J. Phys. D: Appl. Phys. 22, 1157–1161 (1989).
[CrossRef]

D. A. Minkov, “Method for determining the optical constants of a thin film on a transparent substrate,” J. Phys. D: Appl. Phys. 22, 199–205 (1989).
[CrossRef]

Misemer, D. K.

Mudro, J.

J. Müllerová, J. Mudro, “Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra,” Acta Phys. Slov. 50, 477–488 (2000).

Müllerová, J.

J. Müllerová, J. Mudro, “Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra,” Acta Phys. Slov. 50, 477–488 (2000).

Olson, D. H.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Pan, F.-M.

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Pelletier, E.

Richard, J.

R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
[CrossRef]

Ricolleau, C.

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

Rivory, J.

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

Roche, P.

C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 16, 2695–2702 (1986).
[CrossRef]

P. Roche, E. Pelletier, G. Albrand, “Antiscattering transparent monolayers: theory and experiment,” J. Opt. Soc. Am. A 1, 1032–1033 (1984).
[CrossRef]

Rodriguez-Castellon, E.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Roth, W. J.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Roziere, J.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Ruiz-Pérez, J. J.

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

Rusli, R.

Schlenk, J. L.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Schmitt, K. D.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Scott, B. J.

B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
[CrossRef]

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
[CrossRef]

Sheppard, E. W.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Soyez, H.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Sterligov, V. A.

V. A. Sterligov, P. Cheyssac, “Appareil et procédé de caractérisation optique d’un objet,” patent CNRSFR2832795, G01B-011/30 (23November2001).

Storaro, L.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Stucky, G. D.

G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
[CrossRef]

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
[CrossRef]

Trombetta, M.

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Tsai, T.-G.

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Van der Lee, A.

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

Vartuli, J. C.

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

Vernstrom, G. D.

Vuye, G.

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

Wirnsberger, G.

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
[CrossRef]

B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
[CrossRef]

Yang, C.-M.

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Yang, P.

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

Zink, J. I.

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Acta Phys. Slov. (1)

J. Müllerová, J. Mudro, “Determination of optical parameters and thickness of thin films deposited on absorbing substrates using their reflection spectra,” Acta Phys. Slov. 50, 477–488 (2000).

Adv. Mater. (1)

C.-M. Yang, A.-T. Cho, F.-M. Pan, T.-G. Tsai, K.-J. Chao, “Spin-on mesoporous silica films with ultralow dielectric constants, ordered pore structures, and hydrophobic surfaces,” Adv. Mater. 13, 1099–1102 (2001).
[CrossRef]

Appl. Opt. (4)

Chem. Commun. (1)

G. Wirnsberger, B. J. Scott, G. D. Stucky, “pH sensing with mesoporous thin films,” Chem. Commun. 10, 119–120 (2001).
[CrossRef]

Chem. Mater. (2)

B. J. Scott, G. Wirnsberger, G. D. Stucky, “Mesoporous and mesostructured materials for optical applications,” Chem. Mater. 13, 3140–3150 (2001).
[CrossRef]

M. Klotz, P.-A. Albouy, A. Ayral, C. Ménager, D. Grosso, A. Van der Lee, V. Cabuil, F. Babonneau, C. Guizard, “The true structure of hexagonal mesophase templated silica films as revealed by X-ray scattering: effects of thermal treatment and of nanoparticle seeding,” Chem. Mater. 12, 1721–1728 (2000).
[CrossRef]

J. Am. Chem. Soc. (2)

J. S. Beck, J. C. Vartuli, W. J. Roth, M. E. Leonowicz, C. T. Kresge, K. D. Schmitt, C. T. W. Chu, D. H. Olson, E. W. Sheppard, S. B. McGullen, J. B. Higgins, J. L. Schlenk, “A new family of mesoporous molecular sieves prepared with liquid crystal templates,” J. Am. Chem. Soc. 114, 10834–10843 (1992).
[CrossRef]

V. Dufaud, M. E. Davis, “Design of heterogeneous catalysts via multiple active site positioning in organic-inorganic hybrid materials,” J. Am. Chem. Soc. 125, 9403–9413 (2003).
[CrossRef] [PubMed]

J. Mater. Chem. (3)

S. Besson, T. Gacoin, C. Jacquiod, C. Ricolleau, D. Babonneau, J.-P. Boilot, “Structural study of 3D-hexagonal mesoporous spin-coated sol-gel films,” J. Mater. Chem. 10, 1331–1336 (2000).
[CrossRef]

M. Klotz, A. Ayral, C. Guizard, L. Cot, “Synthesis conditions for hexagonal mesoporous silica layers,” J. Mater. Chem. 10, 663–669 (2000).
[CrossRef]

D. Grosso, A. R. Balkenende, P. A. Albouy, M. Lavergne, L. Mazerolles, F. Babonneau, “Highly oriented 3D-hexagonal silica thin films produced with cetyltrimethylammonium bromide,” J. Mater. Chem. 10, 2085–2089 (2000).
[CrossRef]

J. Non-Cryst. Solids (1)

H. Fan, H. R. Bentley, K. R. Kathan, P. Clem, Y. Lu, C. J. Brinker, “Self-assembled aerogel-like low dielectric constant films,” J. Non-Cryst. Solids 285, 79–83 (2001).
[CrossRef]

J. Opt. Soc. Am. A (1)

J. Phys. Chem. B (1)

S. Besson, C. Ricolleau, T. Gacoin, C. Jacquiod, J.-P. Boilot, “A new 3D organization of mesopores in oriented CTAB silica films,” J. Phys. Chem. B 104, 12095–12097 (2000).
[CrossRef]

J. Phys. D: Appl. Phys. (2)

D. A. Minkov, “Calculation of the optical constants of a thin layer upon a transparent substrate from the reflection spectrum,” J. Phys. D: Appl. Phys. 22, 1157–1161 (1989).
[CrossRef]

D. A. Minkov, “Method for determining the optical constants of a thin film on a transparent substrate,” J. Phys. D: Appl. Phys. 22, 199–205 (1989).
[CrossRef]

J. Solid State Chem. (1)

E. Rodriguez-Castellon, A. Jimenez-Lopez, P. Maireles-Torres, D. J. Jones, J. Roziere, M. Trombetta, G. Busca, M. Lenarda, L. Storaro, “Textural and structural properties and surface acidity characterization of mesoporous silica-zirconia molecular sieves,” J. Solid State Chem. 175, 159–169 (2003).
[CrossRef]

Mat. Res. Soc. Symp. Proc. (1)

M. Klotz, S. Besson, C. Ricolleau, F. Bosc, A. Ayral, “Ordered 3D hexagonal mesoporous silica membranes: synthesis and characterization,” Mat. Res. Soc. Symp. Proc. 752, AA8.6.1 (2003).

Nanoletters (1)

S. Besson, T. Gacoin, C. Ricolleau, C. Jacquiod, J.-P. Boilot, “3D quantum dot lattice inside mesoporous silica films,” Nanoletters 2, 409–414 (2002).
[CrossRef]

Nature (1)

Y. Lu, R. Ganguli, C. A. Drewien, M. T. Anderson, C. J. Brinker, W. Gong, Y. Guo, H. Soyez, B. Dunn, M. H. Huang, J. I. Zink, “Continuous formation of supported cubic and hexagonal mesoporous films by sol-gel dip-coating,” Nature 389, 364–368 (1997).
[CrossRef]

Phys. Rev. B (1)

R. Kofman, P. Cheyssac, J. Richard, “Optical properties of Ga monocrystal in the 0.3–5-eV range,” Phys. Rev. B 16, 5216–5224 (1977).
[CrossRef]

Spectrochim. Acta A (1)

G. Wirnsberger, P. Yang, B. J. Scott, B. F. Chmelka, G. D. Stucky, “Mesostructured materials for optical applications: from low-k dielectrics to sensors and lasers,” Spectrochim. Acta A 57, 2049–2060 (2001).
[CrossRef]

Thin Solid Films (3)

J. M. González-Leal, E. Márquez, A. M. Bernal-Oliva, J. J. Ruiz-Pérez, R. Jiménez-Garay, “Derivation of the optical constants of thermally-evaporated uniform films of binary chalcogenide glasses using only their reflection spectra,” Thin Solid Films 317, 223–227 (1998).
[CrossRef]

A. Brunet-Bruneau, S. Fisson, B. Gallas, G. Vuye, J. Rivory, “Infrared ellipsometric study of SiO2 films: relationship between LO mode frequency and porosity,” Thin Solid Films 377–378, 57–61 (2000).
[CrossRef]

A. Brunet-Bruneau, S. Besson, T. Gacoin, J. P. Boilot, J. Rivory, “Reactivity of 3D hexagonal mesoporous silica films to environment studied by infrared ellipsometry,” Thin Solid Films 447–448, 51–55 (2004).
[CrossRef]

Other (3)

S. Besson, “Organized mesoporous silica films: synthesis, characterization of the structure and application to the growth of nanoparticles,” Ph.D. thesis (Ecole Polytechnique, Paris, 2002) (in French).

D. Palik, ed., Handbook of Optical Constants of Solids (Academic, New York, 1985).

V. A. Sterligov, P. Cheyssac, “Appareil et procédé de caractérisation optique d’un objet,” patent CNRSFR2832795, G01B-011/30 (23November2001).

Cited By

OSA participates in CrossRef's Cited-By Linking service. Citing articles from OSA journals and other participating publishers are listed here.

Alert me when this article is cited.


Figures (12)

Fig. 1
Fig. 1

(a) Grazing-incidence small-angle x-ray diffraction pattern of the mesoporous film. The film is ordered in a P63/mmc structure with the c axis perpendicular to the substrate. (b) Schematic presentation of the porous film structure. Spheres represent mesopores in SiO2 matrix.

Fig. 2
Fig. 2

Experimental and calculated reflection spectra of Si covered by thermal SiO2 (Th film); constructive and destructive envelopes.

Fig. 3
Fig. 3

Calculated Th film thickness (first approximation). Starting from SiO2 index, a thickness d(0) is calculated as initial approximation. The index is varied by ±0.1; then, d(−0.1) and d(+0.1) are calculated. The dashed line is the film thickness as deduced by SEM.

Fig. 4
Fig. 4

Calculated indices of Th, NPor, and Por films. SiO2 index nLit is also given for comparison.

Fig. 5
Fig. 5

Calculated (second approximation) imaginary part of indices of Th, NPor, and Por films.

Fig. 6
Fig. 6

Experimental and calculated (second approximation) reflection spectra for a NPor film; constructive and destructive envelopes.

Fig. 7
Fig. 7

Same as Fig. 3, but for a Por film. The dashed line is the film thickness as deduced by SEM.

Fig. 8
Fig. 8

Same as Fig. 6, but for a Por film.

Fig. 9
Fig. 9

Image of scattering area. (a) NPor sample, (b) Por sample. Image size is 700 μm × 500 μm.

Fig. 10
Fig. 10

log BSDF(fx, fy) as a function of the spatial frequencies: (a) Th film, (b) NPor film, Por film; (c) −λ = 632.8 nm, (d) −λ = 594 nm.

Fig. 11
Fig. 11

Azimuthally averaged cross section of BSDF(fx, fy) as a function of sin θ, for a Por film at 594 and 632.8 nm, and for Th and NPor films at 632.8 nm. Simulated minima (Sim) are also drawn.

Fig. 12
Fig. 12

Scattered beams involved in the interference coming from a film with homogeneously distributed scattering centers.

Tables (1)

Tables Icon

Table 1 Cauchy Model Fitting Parameters

Equations (7)

Equations on this page are rendered with MathJax. Learn more.

BSDF = 1 I 0 cos θ d I d Ω .
R = A + B x + C x 2 D + E x + F x 2 , x = exp ( - α d ) ,     α = ( 4 π k 1 ) / λ .
A = [ ( 1 - n 1 ) 2 + k 1 2 ] [ ( n 1 + n 2 ) 2 + ( k 1 + k 2 ) 2 ] , B = 2 [ A cos ϕ + B sin ϕ ] , ϕ = 4 π n 1 d / λ , C = [ ( 1 + n 1 ) 2 + k 1 2 ] [ ( n 1 - n 2 ) 2 + ( k 1 - k 2 ) 2 ] , D = [ ( 1 + n 1 ) 2 + k 1 2 ] [ ( n 1 + n 2 ) 2 + ( k 1 + k 2 ) 2 ] , E = 2 [ C cos ϕ + D sin ϕ ] , F = [ ( 1 - n 1 ) 2 + k 1 2 ] [ ( n 1 + n 2 ) 2 + ( k 1 + k 2 ) 2 ] , A = ( 1 - n 1 2 - k 1 2 ) ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) + 4 k 1 ( n 1 k 2 - n 2 k 1 ) , B = 2 ( 1 - n 1 2 - k 1 2 ) ( n 1 k 2 - n 2 k 1 ) - 2 k 1 ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) , C = ( 1 - n 1 2 - k 1 2 ) ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) - 4 k 1 ( n 1 k 2 - n 2 k 1 ) , D = 2 ( 1 - n 1 2 - k 1 2 ) ( n 1 k 2 - n 2 k 1 ) + 2 k 1 ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) .
B ˜ = 2 [ ( 1 - n 1 2 - k 1 2 ) ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) + 4 k 1 ( n 1 k 2 - n 2 k 1 ) ] , E ˜ = 2 [ ( 1 - n 1 2 - k 1 2 ) ( n 1 2 - n 2 2 + k 1 2 - k 2 2 ) - 4 k 1 ( n 1 k 2 - n 2 k 1 ) ] .
R max ( n 1 , k 1 , d , λ ) - R max exp = 0 , R calc ( n 1 , k 1 , d , λ ) - R exp = 0 , R min ( n 1 , k 1 , d , λ ) - R min exp = 0.
R max ( n 1 , k 1 , d 0 , λ ) - R max exp = 0 , R min ( n 1 , k 1 , d 0 , λ ) - R min exp = 0.
Δ R int ( d ) = λ R calc ( n 1 , k 1 , d , λ ) - R exp ( λ ) .

Metrics