Abstract

Many optical instruments used in quality control of the optical radiation emission level of several devices are limited by the so-called size-of-source effect (SSE) as well as the distance effect (DE) when we are dealing with very accurate measurements. Different authors have studied the SSE and DE and have proposed experimental methods that provide corrections for them. We describe a general method based on the partial coherence theory that allows us to describe and calculate the SSE and DE in any radiometric system with circular apertures. We show some experimental results that verify our proposal. Additionally, as a practical example, we present the corresponding DE and SSE correction factors for a particular geometry.

© 2005 Optical Society of America

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  1. F. E. Nicodemus, “Distribution of optical radiation with respect to position and direction—radiance,” in Self-study Manual on Optical Radiation Measurements (Optical Technology Division of National Institute of Standards and Technology, Gaithersburg, Md., 1985), pp. 10–43.
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  3. D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.
  4. M. S. Matveyev, “New method for measuring the size-of-source effect in standard radiation thermometry,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 167–171.
  5. G. Machin, R. Sergienko, “A comparative study of size-of-source effect (SSE) determination techniques,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 155–160.
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    [CrossRef]
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    [CrossRef]
  8. W. R. Blevin, “Diffraction losses in radiometry and photometry,” Metrologia 6, 39–44 (1970).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef] [PubMed]
  15. E. L. Shirley, “Intuitive diffraction model for multistage optical systems,” Appl. Opt. 43, 735–743 (2004).
    [CrossRef] [PubMed]
  16. E. L. Shirley, “Diffraction effects on broadband radiation: formulation for computing total irradiance,” Appl. Opt. 43, 2609–2620 (2004).
    [CrossRef] [PubMed]
  17. J. G. Suárez-Romero, E. Tepichin-Rodríguez, “Cross-spectral density propagated through a circular aperture,” Metrologia 38, 379–388 (2001).
    [CrossRef]
  18. J. G. Suárez-Romero, E. Tepichín-Rodríguez, “Irradiance measurements without explicit diffraction corrections,” Metrologia 40, 189–191 (2003).
    [CrossRef]
  19. R. W. Boyd, “Radiometry,” in Radiometry and the Detection of Optical Radiation (Wiley, New York, 1983), pp. 13–27.
  20. W. R. McCluney, Introduction to Radiometry and Photometry (Artech House, Norwood, Mass., 1994), p. 18.
  21. S. Mekhontsev, L. Hanssen, “Low scatter optical system for emittance and temperature measurements,” in Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 693–698.
  22. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1993), p. 517.
  23. Ref. 22, pp. 437–439.

2004 (2)

2003 (2)

P. Edwards, M. McCall, “Diffraction loss in radiometry,” Appl. Opt. 42, 5024–5032 (2003).
[CrossRef] [PubMed]

J. G. Suárez-Romero, E. Tepichín-Rodríguez, “Irradiance measurements without explicit diffraction corrections,” Metrologia 40, 189–191 (2003).
[CrossRef]

2001 (1)

J. G. Suárez-Romero, E. Tepichin-Rodríguez, “Cross-spectral density propagated through a circular aperture,” Metrologia 38, 379–388 (2001).
[CrossRef]

1998 (1)

1993 (1)

J. L. Gardner, “Partial coherence and practical radiometry,” Metrologia 30, 419–423 (1993).
[CrossRef]

1991 (1)

1975 (1)

1972 (1)

1970 (1)

W. R. Blevin, “Diffraction losses in radiometry and photometry,” Metrologia 6, 39–44 (1970).
[CrossRef]

1968 (1)

1956 (1)

J. Focke, “Total illumination in an aberration-free diffraction image,” Opt. Acta 3, 161–163 (1956).
[CrossRef]

Battuello, M.

D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.

Bell, J. A.

Blevin, W. R.

W. R. Blevin, “Diffraction losses in radiometry and photometry,” Metrologia 6, 39–44 (1970).
[CrossRef]

Bloisi, F.

Boivin, L. P.

Born, M.

M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1993), p. 517.

Boyd, R. W.

R. W. Boyd, “Radiometry,” in Radiometry and the Detection of Optical Radiation (Wiley, New York, 1983), pp. 13–27.

De, M.

Edwards, P.

Focke, J.

J. Focke, “Total illumination in an aberration-free diffraction image,” Opt. Acta 3, 161–163 (1956).
[CrossRef]

Gardner, J. L.

J. L. Gardner, “Partial coherence and practical radiometry,” Metrologia 30, 419–423 (1993).
[CrossRef]

Girard, F.

D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.

Hanssen, L.

S. Mekhontsev, L. Hanssen, “Low scatter optical system for emittance and temperature measurements,” in Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 693–698.

Lowe, D.

D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.

Ma, L.

F. Sakuma, L. Ma, Z. Yuan, “Distance effect and size-of-source effect of radiation thermometers,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 161–166.

Machin, G.

D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.

G. Machin, R. Sergienko, “A comparative study of size-of-source effect (SSE) determination techniques,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 155–160.

Matveyev, M. S.

M. S. Matveyev, “New method for measuring the size-of-source effect in standard radiation thermometry,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 167–171.

McCall, M.

McCluney, W. R.

W. R. McCluney, Introduction to Radiometry and Photometry (Artech House, Norwood, Mass., 1994), p. 18.

Mekhontsev, S.

S. Mekhontsev, L. Hanssen, “Low scatter optical system for emittance and temperature measurements,” in Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 693–698.

Nicodemus, F. E.

F. E. Nicodemus, “Distribution of optical radiation with respect to position and direction—radiance,” in Self-study Manual on Optical Radiation Measurements (Optical Technology Division of National Institute of Standards and Technology, Gaithersburg, Md., 1985), pp. 10–43.

Sakuma, F.

F. Sakuma, L. Ma, Z. Yuan, “Distance effect and size-of-source effect of radiation thermometers,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 161–166.

Sergienko, R.

G. Machin, R. Sergienko, “A comparative study of size-of-source effect (SSE) determination techniques,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 155–160.

Shirley, E. L.

Steel, W. H.

Suárez-Romero, J. G.

J. G. Suárez-Romero, E. Tepichín-Rodríguez, “Irradiance measurements without explicit diffraction corrections,” Metrologia 40, 189–191 (2003).
[CrossRef]

J. G. Suárez-Romero, E. Tepichin-Rodríguez, “Cross-spectral density propagated through a circular aperture,” Metrologia 38, 379–388 (2001).
[CrossRef]

Tepichin-Rodríguez, E.

J. G. Suárez-Romero, E. Tepichin-Rodríguez, “Cross-spectral density propagated through a circular aperture,” Metrologia 38, 379–388 (2001).
[CrossRef]

Tepichín-Rodríguez, E.

J. G. Suárez-Romero, E. Tepichín-Rodríguez, “Irradiance measurements without explicit diffraction corrections,” Metrologia 40, 189–191 (2003).
[CrossRef]

Vicari, L. R. M.

Wolf, E.

E. Wolf, “Coherence and radiometry,” J. Opt. Soc. Am. 68, 6–17 (1968).
[CrossRef]

M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1993), p. 517.

Yuan, Z.

F. Sakuma, L. Ma, Z. Yuan, “Distance effect and size-of-source effect of radiation thermometers,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 161–166.

Appl. Opt. (6)

J. Opt. Soc. Am. (2)

Metrologia (4)

J. L. Gardner, “Partial coherence and practical radiometry,” Metrologia 30, 419–423 (1993).
[CrossRef]

J. G. Suárez-Romero, E. Tepichin-Rodríguez, “Cross-spectral density propagated through a circular aperture,” Metrologia 38, 379–388 (2001).
[CrossRef]

J. G. Suárez-Romero, E. Tepichín-Rodríguez, “Irradiance measurements without explicit diffraction corrections,” Metrologia 40, 189–191 (2003).
[CrossRef]

W. R. Blevin, “Diffraction losses in radiometry and photometry,” Metrologia 6, 39–44 (1970).
[CrossRef]

Opt. Acta (1)

J. Focke, “Total illumination in an aberration-free diffraction image,” Opt. Acta 3, 161–163 (1956).
[CrossRef]

Other (10)

R. W. Boyd, “Radiometry,” in Radiometry and the Detection of Optical Radiation (Wiley, New York, 1983), pp. 13–27.

W. R. McCluney, Introduction to Radiometry and Photometry (Artech House, Norwood, Mass., 1994), p. 18.

S. Mekhontsev, L. Hanssen, “Low scatter optical system for emittance and temperature measurements,” in Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 693–698.

M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1993), p. 517.

Ref. 22, pp. 437–439.

F. E. Nicodemus, “Distribution of optical radiation with respect to position and direction—radiance,” in Self-study Manual on Optical Radiation Measurements (Optical Technology Division of National Institute of Standards and Technology, Gaithersburg, Md., 1985), pp. 10–43.

F. Sakuma, L. Ma, Z. Yuan, “Distance effect and size-of-source effect of radiation thermometers,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 161–166.

D. Lowe, M. Battuello, G. Machin, F. Girard, “A comparison of size of source effect measurements of radiation thermometers between IMGC and NPL,” in Proceedings of Temperature: Its Measurement and Control in Science and Industry, D. C. Ripple, ed. (American Institute of Physics, New York, 2003), Vol. 7, pp. 625–630.

M. S. Matveyev, “New method for measuring the size-of-source effect in standard radiation thermometry,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 167–171.

G. Machin, R. Sergienko, “A comparative study of size-of-source effect (SSE) determination techniques,” in Proceedings of TEMPMEKO 2001: Eighth International Symposium on Temperature and Thermal Measurements in Industry and Science, B. Fellmuth, J. Seidel, G. Scholz, eds. (VDE Verlag Gmbh, Berlin, 2002), pp. 155–160.

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