Abstract

The centroid method is a common procedure for subpixel location that is applied to a large number of optical sensors. In practice, it is always accompanied by thresholding algorithms used to eliminate undesirable background that may decrease precision. We present a full analytical description of the interaction between centroiding and thresholding applied over an intensity distribution corrupted by additive Gaussian noise. An in depth analysis of the most outstanding statistical properties of this relation (mean and variance) is also presented by means of simulated and experimental data. This work provides fundamental concepts to the designers of sensors that are based on centroid measurements to allow them to use thresholding correctly before centroid computation.

© 2004 Optical Society of America

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