C. Quan, Y. Fu, C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

K. Qian, H. S. Seah, A. Asundi, “Instantaneous frequency and its application to strain extraction in moiré interferometry,” Appl. Opt. 42, 6504–6513 (2003).

[CrossRef]

A. Federico, G. H. Kaufmann, “Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes,” Opt. Eng. 41, 3209–3216 (2002).

[CrossRef]

J. Fang, C. Y. Xiong, Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).

[CrossRef]

L. H. Jin, Y. Otani, T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).

[CrossRef]

J. Degrieck, W. Van Paepegem, P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).

[CrossRef]

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

R. Henan, A. Tagliaferri, R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).

L. R. Watkins, S. M. Tan, T. H. Barnes, “Determination of interferometer phase distributions by use of wavelets,” Opt. Lett. 24, 905–907 (1999).

[CrossRef]

C. Joenathan, B. Franze, P. Haible, H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

B. Dessus, M. Leblanc, “The ‘fringe method’ and its application to the measurement of deformations, vibrations, contour lines and differences of objects,” Opto-electronics 5, 369–391 (1973).

[CrossRef]

J. Wasowski, “Moiré topographic maps,” Opt. Commun. 2, 321–323 (1970).

[CrossRef]

D. M. Meadows, W. O. Johnson, J. B. Allen, “Generation of surface contours by moiré patterns,” Appl. Opt. 9, 942–947 (1970).

[CrossRef]
[PubMed]

H. Takasaki, “Moiré topography,” Appl. Opt. 9, 1467–1472 (1970).

[CrossRef]
[PubMed]

T. Tsuruta, Y. Itoh, “Interferometric generation of counter lines on opaque objects,” Opt. Commun. 1, 34–36 (1969).

[CrossRef]

J. Degrieck, W. Van Paepegem, P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

M. Cherbuliez, P. Jacquot, X. Colonna de Lega, “Wavelet processing of interferometric signals and fringe patterns,” in Wavelet Applications in Signal and Image Processing, M. A. Unser, A. Aldroubi, A. F. Laine, eds., Proc. SPIE3813, 692–702 (1999).

M. Cherbuliez, P. Jacquot, X. Colonna de Lega, “Wavelet processing of interferometric signals and fringe patterns,” in Wavelet Applications in Signal and Image Processing, M. A. Unser, A. Aldroubi, A. F. Laine, eds., Proc. SPIE3813, 692–702 (1999).

X. Colonna de Lega, “Continuous deformation measurement using dynamic phase-shifting and wavelet transform,” in Applied Optics and Optoelectronics 1996, K. T. V. Grattan, ed. (Institute of Physics, Bristol, UK, 1996), pp. 261–267.

I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, Philadelphia, Pa., 1992).

[CrossRef]

J. Degrieck, W. Van Paepegem, P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).

[CrossRef]

B. Dessus, M. Leblanc, “The ‘fringe method’ and its application to the measurement of deformations, vibrations, contour lines and differences of objects,” Opto-electronics 5, 369–391 (1973).

[CrossRef]

J. Fang, C. Y. Xiong, Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).

[CrossRef]

A. Federico, G. H. Kaufmann, “Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes,” Opt. Eng. 41, 3209–3216 (2002).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

C. Joenathan, B. Franze, P. Haible, H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).

[CrossRef]

C. Quan, Y. Fu, C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).

[CrossRef]

Y. Morimoto, M. Fujigaki, S. Yoneyama, “Shape, stress, and strain measurement using phase analysis of grating or fringe patterns,” in Third International Conference on Experimental Mechanics, X. Wu, Y. Qin, J. Fang, J. Ke, eds., Proc. SPIE4537, 47–52 (2002).

[CrossRef]

C. Joenathan, B. Franze, P. Haible, H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).

[CrossRef]

R. Henan, A. Tagliaferri, R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).

Y. Y. Hung, C. Y. Liang, J. D. Hovanesian, A. J. Durelli, “Time-averaged shadow-moiré method for studying vibrations,” Appl. Opt. 16, 1717–1719 (1977).

[CrossRef]
[PubMed]

J. D. Hovanesian, Y. Y. Hung, “Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects,” Appl. Opt. 10, 2734–2738 (1971).

[CrossRef]
[PubMed]

Y. Y. Hung, C. Y. Liang, J. D. Hovanesian, A. J. Durelli, “Time-averaged shadow-moiré method for studying vibrations,” Appl. Opt. 16, 1717–1719 (1977).

[CrossRef]
[PubMed]

J. D. Hovanesian, Y. Y. Hung, “Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects,” Appl. Opt. 10, 2734–2738 (1971).

[CrossRef]
[PubMed]

J. M. Huntley, H. Saldner, “Temporal phase-unwrapping algorithm for automated interferogram analysis,” Appl. Opt. 32, 3047–3052 (1993).

[CrossRef]
[PubMed]

J. M. Huntley, “Challenges in phase unwrapping,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi, D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 37–44.

T. Tsuruta, Y. Itoh, “Interferometric generation of counter lines on opaque objects,” Opt. Commun. 1, 34–36 (1969).

[CrossRef]

M. Cherbuliez, P. Jacquot, X. Colonna de Lega, “Wavelet processing of interferometric signals and fringe patterns,” in Wavelet Applications in Signal and Image Processing, M. A. Unser, A. Aldroubi, A. F. Laine, eds., Proc. SPIE3813, 692–702 (1999).

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

L. H. Jin, Y. Otani, T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

A. Federico, G. H. Kaufmann, “Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes,” Opt. Eng. 41, 3209–3216 (2002).

[CrossRef]

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

B. Dessus, M. Leblanc, “The ‘fringe method’ and its application to the measurement of deformations, vibrations, contour lines and differences of objects,” Opto-electronics 5, 369–391 (1973).

[CrossRef]

S. Mallat, A Wavelet Tour of Signal Processing (Academic, San Diego, Calif., 1998).

Y. Morimoto, M. Fujigaki, S. Yoneyama, “Shape, stress, and strain measurement using phase analysis of grating or fringe patterns,” in Third International Conference on Experimental Mechanics, X. Wu, Y. Qin, J. Fang, J. Ke, eds., Proc. SPIE4537, 47–52 (2002).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

L. H. Jin, Y. Otani, T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).

[CrossRef]

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

C. Quan, Y. Fu, C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

R. Henan, A. Tagliaferri, R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).

C. Quan, Y. Fu, C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).

[CrossRef]

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

C. Joenathan, B. Franze, P. Haible, H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).

[CrossRef]

H. J. Tiziani, “Spectral and temporal phase evaluation for interferometry and speckle applications,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi, D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 323–343.

T. Yoshizawa, T. Tomisawa, “Shadow moiré topography by means of the phase-shift method,” Opt. Eng. 32, 1668–1674 (1993).

[CrossRef]

R. Henan, A. Tagliaferri, R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).

T. Tsuruta, Y. Itoh, “Interferometric generation of counter lines on opaque objects,” Opt. Commun. 1, 34–36 (1969).

[CrossRef]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

J. Degrieck, W. Van Paepegem, P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).

[CrossRef]

J. Wasowski, “Moiré topographic maps,” Opt. Commun. 2, 321–323 (1970).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

J. Fang, C. Y. Xiong, Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).

[CrossRef]

J. Fang, C. Y. Xiong, Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).

[CrossRef]

Y. Morimoto, M. Fujigaki, S. Yoneyama, “Shape, stress, and strain measurement using phase analysis of grating or fringe patterns,” in Third International Conference on Experimental Mechanics, X. Wu, Y. Qin, J. Fang, J. Ke, eds., Proc. SPIE4537, 47–52 (2002).

[CrossRef]

L. H. Jin, Y. Otani, T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).

[CrossRef]

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

T. Yoshizawa, T. Tomisawa, “Shadow moiré topography by means of the phase-shift method,” Opt. Eng. 32, 1668–1674 (1993).

[CrossRef]

D. M. Meadows, W. O. Johnson, J. B. Allen, “Generation of surface contours by moiré patterns,” Appl. Opt. 9, 942–947 (1970).

[CrossRef]
[PubMed]

H. Takasaki, “Moiré topography,” Appl. Opt. 9, 1467–1472 (1970).

[CrossRef]
[PubMed]

Y. Y. Hung, C. Y. Liang, J. D. Hovanesian, A. J. Durelli, “Time-averaged shadow-moiré method for studying vibrations,” Appl. Opt. 16, 1717–1719 (1977).

[CrossRef]
[PubMed]

J. Fujimoto, “Determination of the vibration phase by a time-averaged shadow moiré method,” Appl. Opt. 21, 4373–4376 (1982).

[CrossRef]
[PubMed]

J. M. Huntley, H. Saldner, “Temporal phase-unwrapping algorithm for automated interferogram analysis,” Appl. Opt. 32, 3047–3052 (1993).

[CrossRef]
[PubMed]

G. Mauvoisin, F. Bremand, A. Lagarde, “Three-dimensional shape reconstruction by phase-shifting shadow moiré,” Appl. Opt. 33, 2163–2169 (1994).

[CrossRef]
[PubMed]

M. Takeda, H. Yamamoto, “Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse objects with large height steps and/or spatially isolated surfaces,” Appl. Opt. 33, 7829–7837 (1994).

[CrossRef]
[PubMed]

C. Joenathan, B. Franze, P. Haible, H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation,” Appl. Opt. 37, 2608–2614 (1998).

[CrossRef]

Y. Arai, S. Yokozeki, T. Yamada, “Fringe-scanning method using a general function for shadow moiré,” Appl. Opt. 34, 4877–4882 (1995).

[CrossRef]
[PubMed]

J. D. Hovanesian, Y. Y. Hung, “Moiré contour-sum contour-difference, and vibration analysis of arbitrary objects,” Appl. Opt. 10, 2734–2738 (1971).

[CrossRef]
[PubMed]

K. Qian, H. S. Seah, A. Asundi, “Instantaneous frequency and its application to strain extraction in moiré interferometry,” Appl. Opt. 42, 6504–6513 (2003).

[CrossRef]

J. B. Allen, D. M. Meadows, “Removal of unwanted patterns from moiré contour maps by grid translation techniques,” Appl. Opt. 10, 210–212 (1971).

[CrossRef]
[PubMed]

K. Kadooka, K. Kunoo, N. Uda, K. Ono, T. Nagayasu, “Strain analysis for moiré interferometry using the two-dimensional continuous wavelet transform,” Exp. Mech. 43, 45–51 (2003).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Large in-plane displacement measurement in dual-beam speckle interferometry using temporal phase measurement,” J. Mod. Opt. 45, 1975–1984 (1998).

[CrossRef]

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).

[CrossRef]

J. Fang, C. Y. Xiong, Z. L. Yang, “Digital transform processing of carrier fringe patterns from speckle-shearing interferometry,” J. Mod. Opt. 48, 507–520 (2001).

[CrossRef]

C. Quan, Y. Fu, C. J. Tay, “Determination of surface contour by temporal analysis of shadow moiré fringes,” Opt. Commun. 230, 23–33 (2004).

[CrossRef]

T. Tsuruta, Y. Itoh, “Interferometric generation of counter lines on opaque objects,” Opt. Commun. 1, 34–36 (1969).

[CrossRef]

J. Wasowski, “Moiré topographic maps,” Opt. Commun. 2, 321–323 (1970).

[CrossRef]

X. Xie, M. J. Lalor, D. R. Burton, M. M. Shaw, “Four-map absolute distance contouring,” Opt. Eng. 36, 2517–1520 (1997).

[CrossRef]

T. Yoshizawa, T. Tomisawa, “Shadow moiré topography by means of the phase-shift method,” Opt. Eng. 32, 1668–1674 (1993).

[CrossRef]

L. Jin, Y. Kodera, T. Yoshizawa, Y. Otani, “Shadow moiré profilometry using the phase-shifting method,” Opt. Eng. 39, 2119–2123 (2000).

[CrossRef]

L. H. Jin, Y. Otani, T. Yoshizawa, “Shadow moiré profilometry by frequency sweeping,” Opt. Eng. 40, 1383–1386 (2001).

[CrossRef]

C. Jonathan, B. Franze, P. Haible, H. J. Tiziani, “Novel temporal Fourier transform speckle pattern shearing interferometer,” Opt. Eng. 37, 1790–1795 (1998).

[CrossRef]

A. Federico, G. H. Kaufmann, “Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes,” Opt. Eng. 41, 3209–3216 (2002).

[CrossRef]

J. Degrieck, W. Van Paepegem, P. Boone, “Application of digital phase-shift shadow moiré to micro deformation measurements of curved surface,” Opt. Lasers Eng. 36, 29–40 (2001).

[CrossRef]

R. Henan, A. Tagliaferri, R. Torroba, “A contouring approach using single grating digital shadow moiré with a phase stepping technique,” Optik 110, 199–201 (1999).

B. Dessus, M. Leblanc, “The ‘fringe method’ and its application to the measurement of deformations, vibrations, contour lines and differences of objects,” Opto-electronics 5, 369–391 (1973).

[CrossRef]

H. J. Tiziani, “Spectral and temporal phase evaluation for interferometry and speckle applications,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi, D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 323–343.

J. M. Huntley, “Challenges in phase unwrapping,” in Trends in Optical Nondestructive Testing and Inspection, P. K. Rastogi, D. Inaudi, eds. (Elsevier Science, Oxford, UK, 2000), pp. 37–44.

I. Daubechies, Ten Lectures on Wavelets (Society for Industrial and Applied Mathematics, Philadelphia, Pa., 1992).

[CrossRef]

Y. Morimoto, M. Fujigaki, S. Yoneyama, “Shape, stress, and strain measurement using phase analysis of grating or fringe patterns,” in Third International Conference on Experimental Mechanics, X. Wu, Y. Qin, J. Fang, J. Ke, eds., Proc. SPIE4537, 47–52 (2002).

[CrossRef]

X. Colonna de Lega, “Continuous deformation measurement using dynamic phase-shifting and wavelet transform,” in Applied Optics and Optoelectronics 1996, K. T. V. Grattan, ed. (Institute of Physics, Bristol, UK, 1996), pp. 261–267.

M. Cherbuliez, P. Jacquot, X. Colonna de Lega, “Wavelet processing of interferometric signals and fringe patterns,” in Wavelet Applications in Signal and Image Processing, M. A. Unser, A. Aldroubi, A. F. Laine, eds., Proc. SPIE3813, 692–702 (1999).

S. Mallat, A Wavelet Tour of Signal Processing (Academic, San Diego, Calif., 1998).