Abstract

We propose a simple procedure for designing an integrated single-chip grating-based thin-film filter. A simulation from a rigorous coupled-wave analysis shows that structural adjustment based on the effective medium theory can achieve the desired integration without notable performance degradation. Our spectropolarimetric filter design maintains spectral filter characteristics, while its extinction ratio is significantly enhanced over the passband. The integrated spectropolarimetric filter can be a basis for building multispectral multipolarimetric filters for spectropolarimetry in remote-sensing applications.

© 2003 Optical Society of America

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    [CrossRef]
  2. P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
    [CrossRef]
  3. T. Doumuki, H. Tamada, “An aluminum-wire grid polarizer fabricated on a gallium-arsenide photodiode,” Appl. Phys. Lett. 71, 686–688 (1997).
    [CrossRef]
  4. E. Chen, S. Y. Chou, “Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors,” Appl. Phys. Lett. 70, 2673–2675 (1997).
    [CrossRef]
  5. W. G. Egan, “Proposed design of an imaging spectropolarimeter/photopolarimeter for remote sensing of earth resources,” Opt. Eng. 25, 1155–1159 (1986).
    [CrossRef]
  6. L. D. Travis, “Remote sensing of aerosols with the Earth Observing Scanning Polarimeter,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 154–164 (1992).
    [CrossRef]
  7. B. H. Miles, E. R. Cespedes, R. A. Goodson, “Polarization-based active/passive scanning system for minefield detection,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 239–252 (1992).
    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
  11. K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
    [CrossRef]
  12. D. B. Chenault, R. A. Chipman, “Infrared spectropolarimetry,” in Polarization Considerations for Optical Systems II, R. A. Chipman, ed., Proc. SPIE1166, 254–266 (1989).
    [CrossRef]
  13. J. L. Pezzaniti, R. A. Chipman, “Mueller matrix imaging polarimeter,” Opt. Eng. 34, 1558–1568 (1995).
    [CrossRef]
  14. C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).
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    [CrossRef]
  16. R. M. A. Azzam, K. A. Giardina, “Photopolarimeter based on planar grating diffraction,” J. Opt. Soc. Am. A 10, 1190–1196 (1993).
    [CrossRef]
  17. J. R. Maxwell, T. J. Rogne, “Advances in polarized infrared imaging, Part 1,” in Spectral Reflections IRIA Newsletter97-01 (1997).
  18. W. A. Shurcliff, Polarized Light: Production and Use (Harvard University, Cambridge, Mass., 1962).
  19. E. Oliva, “Wedged double Wollaston, a device for single-shot polarimetric measurements,” Astron. Astrophys. Suppl. Ser. 123, 589–592 (1997).
    [CrossRef]
  20. R. Magnusson, S. S. Wang, “Transmission bandpass guided-mode resonance filters,” Appl. Opt. 34, 8106–8109 (1995).
    [CrossRef] [PubMed]
  21. D. Kim, C. Warde, K. Vaccaro, C. Woods, “Imaging multispectral polarimetric sensor: single pixel design, fabrication, and characterization,” Appl. Opt. 42, 3756–3764 (2003).
    [CrossRef] [PubMed]
  22. S. M. Rytov, “Electromagnetic properties of a finely stratified medium,” Sov. Phys. JETP 2, 466–475 (1956).
  23. M. G. Moharam, T. K. Gaylord, “Diffraction analysis of dielectric surface-relief gratings,” J. Opt. Soc. Am. 72, 1385–1392 (1982).
    [CrossRef]
  24. M. G. Moharam, T. K. Gaylord, “Rigorous coupled-wave analysis of metallic surface-relief gratings,” J. Opt. Soc. Am. A 3, 1780–1787 (1986).
    [CrossRef]
  25. W. A. Pliskin, H. S. Lehman, “Structural evaluation of silicon oxide films,” J. Electrochem. Soc. 112, 1013–1019 (1965).
    [CrossRef]
  26. M. Herzberger, “Color correction in optical systems and a new dispersion formula,” Opt. Acta 6, 197–215 (1959).
    [CrossRef]
  27. S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
    [CrossRef]
  28. Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
    [CrossRef]

2003 (1)

2000 (2)

S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
[CrossRef]

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

1999 (2)

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

G. P. Nordin, J. T. Meier, P. C. Deguzman, M. W. Jones, “Micropolarizer array for infrared imaging polarimetry,” J. Opt. Soc. Am. A 16, 1168–1174 (1999).
[CrossRef]

1997 (4)

R. C. Tyan, A. A. Salvekar, H. P. Chou, C. C. Cheng, A. Scherer, P. C. Sun, F. Xu, Y. Fainman, “Design, fabrication, and characterization of a form-birefringent multilayer polarizing beam splitter,” J. Opt. Soc. Am. A 14, 1627–1636 (1997).
[CrossRef]

T. Doumuki, H. Tamada, “An aluminum-wire grid polarizer fabricated on a gallium-arsenide photodiode,” Appl. Phys. Lett. 71, 686–688 (1997).
[CrossRef]

E. Chen, S. Y. Chou, “Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors,” Appl. Phys. Lett. 70, 2673–2675 (1997).
[CrossRef]

E. Oliva, “Wedged double Wollaston, a device for single-shot polarimetric measurements,” Astron. Astrophys. Suppl. Ser. 123, 589–592 (1997).
[CrossRef]

1995 (2)

R. Magnusson, S. S. Wang, “Transmission bandpass guided-mode resonance filters,” Appl. Opt. 34, 8106–8109 (1995).
[CrossRef] [PubMed]

J. L. Pezzaniti, R. A. Chipman, “Mueller matrix imaging polarimeter,” Opt. Eng. 34, 1558–1568 (1995).
[CrossRef]

1993 (1)

1992 (1)

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

1986 (2)

W. G. Egan, “Proposed design of an imaging spectropolarimeter/photopolarimeter for remote sensing of earth resources,” Opt. Eng. 25, 1155–1159 (1986).
[CrossRef]

M. G. Moharam, T. K. Gaylord, “Rigorous coupled-wave analysis of metallic surface-relief gratings,” J. Opt. Soc. Am. A 3, 1780–1787 (1986).
[CrossRef]

1982 (1)

1965 (1)

W. A. Pliskin, H. S. Lehman, “Structural evaluation of silicon oxide films,” J. Electrochem. Soc. 112, 1013–1019 (1965).
[CrossRef]

1959 (1)

M. Herzberger, “Color correction in optical systems and a new dispersion formula,” Opt. Acta 6, 197–215 (1959).
[CrossRef]

1956 (1)

S. M. Rytov, “Electromagnetic properties of a finely stratified medium,” Sov. Phys. JETP 2, 466–475 (1956).

Astilean, S.

S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
[CrossRef]

Azzam, R. M. A.

Bergstrahl, J.

D. A. Glenar, J. J. Hillman, B. Saif, J. Bergstrahl, “Polaris II: an acousto-optic imaging spectropolarimeter for ground-based astronomy,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 92–103 (1992).
[CrossRef]

Bishop, K. P.

K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
[CrossRef]

Cambril, E.

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

Cespedes, E. R.

B. H. Miles, E. R. Cespedes, R. A. Goodson, “Polarization-based active/passive scanning system for minefield detection,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 239–252 (1992).
[CrossRef]

Chavel, P.

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

Chen, E.

E. Chen, S. Y. Chou, “Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors,” Appl. Phys. Lett. 70, 2673–2675 (1997).
[CrossRef]

Chenault, D. B.

D. B. Chenault, R. A. Chipman, “Infrared spectropolarimetry,” in Polarization Considerations for Optical Systems II, R. A. Chipman, ed., Proc. SPIE1166, 254–266 (1989).
[CrossRef]

Cheng, C. C.

Chipman, R. A.

J. L. Pezzaniti, R. A. Chipman, “Mueller matrix imaging polarimeter,” Opt. Eng. 34, 1558–1568 (1995).
[CrossRef]

D. B. Chenault, R. A. Chipman, “Infrared spectropolarimetry,” in Polarization Considerations for Optical Systems II, R. A. Chipman, ed., Proc. SPIE1166, 254–266 (1989).
[CrossRef]

Chou, H. P.

Chou, S. Y.

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

E. Chen, S. Y. Chou, “Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors,” Appl. Phys. Lett. 70, 2673–2675 (1997).
[CrossRef]

Chun, C. S. L.

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

Deguzman, P. C.

Deschamps, P. Y.

P. Y. Deschamps, M. Herman, A. Podaire, A. Ratier, “The POLDER instrument: mission objectives,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 72–91 (1992).
[CrossRef]

Deshpande, P.

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

Doumuki, T.

T. Doumuki, H. Tamada, “An aluminum-wire grid polarizer fabricated on a gallium-arsenide photodiode,” Appl. Phys. Lett. 71, 686–688 (1997).
[CrossRef]

Egan, W. G.

W. G. Egan, “Proposed design of an imaging spectropolarimeter/photopolarimeter for remote sensing of earth resources,” Opt. Eng. 25, 1155–1159 (1986).
[CrossRef]

Fainman, Y.

Fetrow, M. P.

K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
[CrossRef]

Fleming, D. L.

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

Gaylord, T. K.

Giardina, K. A.

Glenar, D. A.

D. A. Glenar, J. J. Hillman, B. Saif, J. Bergstrahl, “Polaris II: an acousto-optic imaging spectropolarimeter for ground-based astronomy,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 92–103 (1992).
[CrossRef]

Goodson, R. A.

B. H. Miles, E. R. Cespedes, R. A. Goodson, “Polarization-based active/passive scanning system for minefield detection,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 239–252 (1992).
[CrossRef]

Harvey, W. A.

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

Hazart, J.

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

Herman, M.

P. Y. Deschamps, M. Herman, A. Podaire, A. Ratier, “The POLDER instrument: mission objectives,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 72–91 (1992).
[CrossRef]

Herzberger, M.

M. Herzberger, “Color correction in optical systems and a new dispersion formula,” Opt. Acta 6, 197–215 (1959).
[CrossRef]

Hillman, J. J.

D. A. Glenar, J. J. Hillman, B. Saif, J. Bergstrahl, “Polaris II: an acousto-optic imaging spectropolarimeter for ground-based astronomy,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 92–103 (1992).
[CrossRef]

Jones, M. W.

Kim, D.

Kobayashi, Y.

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Lalanne, P.

S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
[CrossRef]

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

Launois, H.

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

Lehman, H. S.

W. A. Pliskin, H. S. Lehman, “Structural evaluation of silicon oxide films,” J. Electrochem. Soc. 112, 1013–1019 (1965).
[CrossRef]

Magnusson, R.

Maxwell, J. R.

J. R. Maxwell, T. J. Rogne, “Advances in polarized infrared imaging, Part 1,” in Spectral Reflections IRIA Newsletter97-01 (1997).

McIntire, H. D.

K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
[CrossRef]

McMackin, L.

K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
[CrossRef]

Meier, J. T.

Miles, B. H.

B. H. Miles, E. R. Cespedes, R. A. Goodson, “Polarization-based active/passive scanning system for minefield detection,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 239–252 (1992).
[CrossRef]

Moharam, M. G.

Nordin, G. P.

Oliva, E.

E. Oliva, “Wedged double Wollaston, a device for single-shot polarimetric measurements,” Astron. Astrophys. Suppl. Ser. 123, 589–592 (1997).
[CrossRef]

Palamaru, M.

S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
[CrossRef]

Pezzaniti, J. L.

J. L. Pezzaniti, R. A. Chipman, “Mueller matrix imaging polarimeter,” Opt. Eng. 34, 1558–1568 (1995).
[CrossRef]

Pliskin, W. A.

W. A. Pliskin, H. S. Lehman, “Structural evaluation of silicon oxide films,” J. Electrochem. Soc. 112, 1013–1019 (1965).
[CrossRef]

Podaire, A.

P. Y. Deschamps, M. Herman, A. Podaire, A. Ratier, “The POLDER instrument: mission objectives,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 72–91 (1992).
[CrossRef]

Ratier, A.

P. Y. Deschamps, M. Herman, A. Podaire, A. Ratier, “The POLDER instrument: mission objectives,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 72–91 (1992).
[CrossRef]

Rogne, T. J.

J. R. Maxwell, T. J. Rogne, “Advances in polarized infrared imaging, Part 1,” in Spectral Reflections IRIA Newsletter97-01 (1997).

Rytov, S. M.

S. M. Rytov, “Electromagnetic properties of a finely stratified medium,” Sov. Phys. JETP 2, 466–475 (1956).

Sadjadi, F. A.

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

Saif, B.

D. A. Glenar, J. J. Hillman, B. Saif, J. Bergstrahl, “Polaris II: an acousto-optic imaging spectropolarimeter for ground-based astronomy,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 92–103 (1992).
[CrossRef]

Salvekar, A. A.

Sato, S.

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Scherer, A.

Shiba, H.

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Shurcliff, W. A.

W. A. Shurcliff, Polarized Light: Production and Use (Harvard University, Cambridge, Mass., 1962).

Sun, P. C.

Takami, H.

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Tamada, H.

T. Doumuki, H. Tamada, “An aluminum-wire grid polarizer fabricated on a gallium-arsenide photodiode,” Appl. Phys. Lett. 71, 686–688 (1997).
[CrossRef]

Torok, E. J.

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

Travis, L. D.

L. D. Travis, “Remote sensing of aerosols with the Earth Observing Scanning Polarimeter,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 154–164 (1992).
[CrossRef]

Tyan, R. C.

Vaccaro, K.

Wang, J.

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

Wang, S. S.

Warde, C.

Woods, C.

Wu, W.

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

Xu, F.

Yamashita, T.

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Yu, Z.

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

Appl. Opt. (2)

Appl. Phys. Lett. (3)

Z. Yu, P. Deshpande, W. Wu, J. Wang, S. Y. Chou, “Reflective polarizer based on a stacked double-layer subwavelength metal grating structure fabricated using nanoimprint lithography,” Appl. Phys. Lett. 77, 927–929 (2000).
[CrossRef]

T. Doumuki, H. Tamada, “An aluminum-wire grid polarizer fabricated on a gallium-arsenide photodiode,” Appl. Phys. Lett. 71, 686–688 (1997).
[CrossRef]

E. Chen, S. Y. Chou, “Polarimetry of thin metal transmission gratings in the resonance region and its impact on the response of metal-semiconductor-metal photodetectors,” Appl. Phys. Lett. 70, 2673–2675 (1997).
[CrossRef]

Astron. Astrophys. Suppl. Ser. (1)

E. Oliva, “Wedged double Wollaston, a device for single-shot polarimetric measurements,” Astron. Astrophys. Suppl. Ser. 123, 589–592 (1997).
[CrossRef]

J. Electrochem. Soc. (1)

W. A. Pliskin, H. S. Lehman, “Structural evaluation of silicon oxide films,” J. Electrochem. Soc. 112, 1013–1019 (1965).
[CrossRef]

J. Opt. A: Pure Appl. Opt. (1)

P. Lalanne, J. Hazart, P. Chavel, E. Cambril, H. Launois, “A transmission polarizing beam splitter grating,” J. Opt. A: Pure Appl. Opt. 1, 215–219 (1999).
[CrossRef]

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (4)

Opt. Acta (1)

M. Herzberger, “Color correction in optical systems and a new dispersion formula,” Opt. Acta 6, 197–215 (1959).
[CrossRef]

Opt. Commun. (1)

S. Astilean, P. Lalanne, M. Palamaru, “Light transmission through metallic channels much smaller than the wavelength,” Opt. Commun. 175, 265–273 (2000).
[CrossRef]

Opt. Eng. (2)

J. L. Pezzaniti, R. A. Chipman, “Mueller matrix imaging polarimeter,” Opt. Eng. 34, 1558–1568 (1995).
[CrossRef]

W. G. Egan, “Proposed design of an imaging spectropolarimeter/photopolarimeter for remote sensing of earth resources,” Opt. Eng. 25, 1155–1159 (1986).
[CrossRef]

Publ. Astron. Soc. Pac. (1)

H. Takami, H. Shiba, S. Sato, T. Yamashita, Y. Kobayashi, “A near-infrared prism spectrophotopolarimeter,” Publ. Astron. Soc. Pac. 104, 949–954 (1992).
[CrossRef]

Sov. Phys. JETP (1)

S. M. Rytov, “Electromagnetic properties of a finely stratified medium,” Sov. Phys. JETP 2, 466–475 (1956).

Other (9)

C. S. L. Chun, D. L. Fleming, W. A. Harvey, E. J. Torok, F. A. Sadjadi, “Synthetic vision using polarization-sensitive, thermal imaging,” in Enhanced and Synthetic Vision, J. G. Verly, ed., Proc. SPIE2736, 9–20 (1996).

J. R. Maxwell, T. J. Rogne, “Advances in polarized infrared imaging, Part 1,” in Spectral Reflections IRIA Newsletter97-01 (1997).

W. A. Shurcliff, Polarized Light: Production and Use (Harvard University, Cambridge, Mass., 1962).

P. Y. Deschamps, M. Herman, A. Podaire, A. Ratier, “The POLDER instrument: mission objectives,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 72–91 (1992).
[CrossRef]

K. P. Bishop, H. D. McIntire, M. P. Fetrow, L. McMackin, “Multispectral polarimeter imaging in the visible to near IR,” in Targets and Backgrounds: Characterization and Representation V, W. R. Watkins, D. Clement, W. R. Reynolds, eds., Proc. SPIE3699, 49–57 (1999).
[CrossRef]

D. B. Chenault, R. A. Chipman, “Infrared spectropolarimetry,” in Polarization Considerations for Optical Systems II, R. A. Chipman, ed., Proc. SPIE1166, 254–266 (1989).
[CrossRef]

L. D. Travis, “Remote sensing of aerosols with the Earth Observing Scanning Polarimeter,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 154–164 (1992).
[CrossRef]

B. H. Miles, E. R. Cespedes, R. A. Goodson, “Polarization-based active/passive scanning system for minefield detection,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 239–252 (1992).
[CrossRef]

D. A. Glenar, J. J. Hillman, B. Saif, J. Bergstrahl, “Polaris II: an acousto-optic imaging spectropolarimeter for ground-based astronomy,” in Polarization and Remote Sensing, W. G. Egan, ed., Proc. SPIE1747, 92–103 (1992).
[CrossRef]

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Figures (7)

Fig. 1
Fig. 1

Effective index n eff of the wire-grid grating polarization filter for incident light with a wavelength of λ = 4.0 μm. The filter is made of aluminum, 2000 Å thick: solid curve, effective index obtained by fitting the RCWA results with transmittance calculations, assuming negligible absorption; dashed line, zeroth-order effective index from the effective medium theory of Eq. (2).

Fig. 2
Fig. 2

Designed SPF structure with the effective index calculated in Fig. 1.

Fig. 3
Fig. 3

Transmittance of the designed SPF compared with that of the original spectral filter design without a grating. The transmittance was calculated by the RCWA.

Fig. 4
Fig. 4

Extinction ratio of the designed SPF compared with that of the wire-grid polarization filter with 2000-Å-thick Al and Λ = 0.4 μm.

Fig. 5
Fig. 5

Transmittance of (a) TE- and (b) TM-polarization components of the designed SPF compared with that of the wire-grid grating polarization filter with 2000-Å-thick aluminum and Λ = 0.4 μm.

Fig. 6
Fig. 6

Single-chip multispectral polarimetric filter designed by varying the thickness of middle SiO layer based on the SPF design in Fig. 2. (a) Structural schematic showing the peak wavelength of extinction ratio designed to be at 3.5, 4.0, and 4.5 μm when a SiO layer thickness of 9000, 11000, and 13100 Å, respectively, is chosen. (b) Corresponding spectrum of the extinction ratio.

Fig. 7
Fig. 7

Effect of grating thickness on the (a) extinction ratio and (b) transmittance of the TM-polarization component of the SPF. Bold and regular solid curves, filter performance when grating thicknesses of 2000 and 3000 Å, respectively, with other structural parameters unchanged.

Equations (2)

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εeff,TE2=ε0,TE+π23 f21-f2εA-εB2Λλ2, εeff,TM2=ε0,TM+π23 f21-f21εA-1εB2×ε0,TM3ε0,TEΛλ2,
ε0,TE=fεA+1-fεB, ε0,TM=εAεBfεB+1-fεA

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