Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Application of Fourier transform infrared ellipsometry to assess the concentration of biological molecules

Not Accessible

Your library or personal account may give you access

Abstract

Spectroscopic ellipsometry is a noninvasive optical characterization technique mainly used in the semiconductor field to characterize bare substrates and thin films. In particular, it allows the gathering of information concerning the physical structure of the sample, such as roughness and film thickness, as well as its optical response. In the mid-infrared (IR) range each molecule exhibits a characteristic absorption fingerprint, which makes this technique chemically selective. Phase-modulated IR ellipsometry does not require a baseline correction procedure or suppression of atmospheric CO2 and water-vapor absorption bands, thus greatly reducing the subjectivity in data analysis. We have found that ellipsometric measurements of thin films, such as the solid residuals left on a plane surface after evaporation of a liquid drop containing a given compound in solution, are particularly favorable for dosing purposes because the intensity of IR absorptions shows a linear behavior along a wide range of solution concentrations of the given compound. Our aim is to illustrate with a concrete example and to justify theoretically the linearity experimentally found between radiation absorption and molecule concentration. For the example, we prepared aqueous solutions of glycogen, a molecule of huge biological importance currently tested in biochemical analyses, at concentrations ranging from 1 mg/l to 1 g/l, which correspond to those found in physiological conditions. The results of this example are promising for the application of ellipsometry for dosing purposes in biochemistry and biomedicine.

© 2002 Optical Society of America

Full Article  |  PDF Article
More Like This
Use of optical spacers to enhance infrared Mueller ellipsometry sensitivity: application to the characterization of organic thin films

Gerald Ndong, Angel Lizana, Enric Garcia-Caurel, Valerie Paret, Géraldine Melizzi, Denis Cattelan, Bernard Pelissier, and Jean-Hervé Tortai
Appl. Opt. 55(12) 3323-3332 (2016)

Calibration improvement of Fourier transform infrared phase-modulated ellipsometry

A. Canillas, E. Pascual, and E. Bertran
J. Opt. Soc. Am. A 13(12) 2461-2467 (1996)

Analysis of nanostructured porous films by measurement of adsorption isotherms with optical fiber and ellipsometry

Alberto Álvarez-Herrero, Hector Guerrero, Eusebio Bernabeu, and David Levy
Appl. Opt. 41(31) 6692-6701 (2002)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (5)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (8)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All rights reserved, including rights for text and data mining and training of artificial technologies or similar technologies.