Abstract

A new methodology for the study of low-dimensional thin-film structures and a new technique to determine nanolayer thickness are considered. These are based on recording and processing the changes in an angular Fourier spectrum of a light beam reflected from a prism coupler to excite the guided mode in a thin-film structure when the incident light beam intensity is increased.

© 2002 Optical Society of America

Full Article  |  PDF Article
OSA Recommended Articles
Guided-mode resonant grating filter with an antireflection structured surface

Akio Mizutani, Hisao Kikuta, Koichi Iwata, and Hiroshi Toyota
J. Opt. Soc. Am. A 19(7) 1346-1351 (2002)

Polarization-Conversion Guided Mode (PCGM) technique for exploring thin anisotropic surface layers

Fuzi Yang, Lizhen Ruan, and J. R. Sambles
Opt. Express 15(18) 11234-11240 (2007)

Optical Waveguide Structures for CO2 Lasers

P. K. Cheo, J. M. Berak, W. Oshinsky, and J. L. Swindal
Appl. Opt. 12(3) 500-509 (1973)

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Tables (1)

You do not have subscription access to this journal. Article tables are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription

Metrics

You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access OSA Member Subscription