We present a novel method for determining both the thickness and the optical constants of a weakly absorbing thin film upon a nearly transparent substrate through analysis of transmittance measured at various incident angles with coherent light. We demonstrate this method for a polymer thin film. The refractive indices and extinction coefficients of poly(DRI-anthranilic acid) at wavelengths of 1064, 632.8, and 532 nm were determined for the first time to our knowledge. We also confirmed the validity of our method with a polystyrene thin film whose optical constant was known. It was found that a thickness of a few hundred nanometers can easily be measured and that this method offers simplicity as well as the capability of in situ measurement.
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