Abstract

Narrow bandpass filters are extremely sensitive to errors in the optical thickness of the layers, but they have an extraordinary inherent capability to compensate for these errors. Graphical examples of errors of differing magnitudes and types with and without compensation are shown with computer simulation of the optical monitoring techniques. This allows the estimation of what magnitude of errors may be tolerable in given applications.

© 2002 Optical Society of America

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References

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  1. R. R. Willey, “Estimating the properties of DWDM filters before designing and their error sensitivity and compensation effects in production,” Proc. Soc. Vac. Coaters 44, 262–266 (2001).
  2. R. R. Willey, “Achieving narrow bandpass filters which meet the performance required for DWDM,” Thin Solid Films 398–399, 1–9 (2001).
    [CrossRef]
  3. F. Q. Zhou, M. Zhou, J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.
  4. P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
    [CrossRef]
  5. H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt Acta 19, 1–28 (1972).
    [CrossRef]
  6. H. A. Macleod, D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
    [CrossRef]
  7. L. E. Regalado, R. Garcia-Llamas, “Method for calculating optical coating error stabilities,” Appl. Opt. 32, 5677–5682 (1993).
    [CrossRef] [PubMed]

2001 (2)

R. R. Willey, “Estimating the properties of DWDM filters before designing and their error sensitivity and compensation effects in production,” Proc. Soc. Vac. Coaters 44, 262–266 (2001).

R. R. Willey, “Achieving narrow bandpass filters which meet the performance required for DWDM,” Thin Solid Films 398–399, 1–9 (2001).
[CrossRef]

1993 (1)

1974 (1)

H. A. Macleod, D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
[CrossRef]

1972 (2)

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt Acta 19, 1–28 (1972).
[CrossRef]

Bousquet, P.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Fornier, A.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Garcia-Llamas, R.

Kowalczyk, R.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Macleod, H. A.

H. A. Macleod, D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
[CrossRef]

H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt Acta 19, 1–28 (1972).
[CrossRef]

Pan, J. J.

F. Q. Zhou, M. Zhou, J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.

Pelletier, E.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Regalado, L. E.

Richmond, D.

H. A. Macleod, D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
[CrossRef]

Roche, P.

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Willey, R. R.

R. R. Willey, “Estimating the properties of DWDM filters before designing and their error sensitivity and compensation effects in production,” Proc. Soc. Vac. Coaters 44, 262–266 (2001).

R. R. Willey, “Achieving narrow bandpass filters which meet the performance required for DWDM,” Thin Solid Films 398–399, 1–9 (2001).
[CrossRef]

Zhou, F. Q.

F. Q. Zhou, M. Zhou, J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.

Zhou, M.

F. Q. Zhou, M. Zhou, J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.

Appl. Opt. (1)

Opt Acta (2)

H. A. Macleod, “Turning value monitoring of narrow-band all-dielectric thin-film optical filters,” Opt Acta 19, 1–28 (1972).
[CrossRef]

H. A. Macleod, D. Richmond, The effects of errors on the optical monitoring of narrow-band all-dielectric thin film optical filters,” Opt Acta 21, 429–443 (1974).
[CrossRef]

Proc. Soc. Vac. Coaters (1)

R. R. Willey, “Estimating the properties of DWDM filters before designing and their error sensitivity and compensation effects in production,” Proc. Soc. Vac. Coaters 44, 262–266 (2001).

Thin Solid Films (2)

R. R. Willey, “Achieving narrow bandpass filters which meet the performance required for DWDM,” Thin Solid Films 398–399, 1–9 (2001).
[CrossRef]

P. Bousquet, A. Fornier, R. Kowalczyk, E. Pelletier, P. Roche, “Optical filters: monitoring process allowing the auto-correction of thickness errors,” Thin Solid Films 13, 285–290 (1972).
[CrossRef]

Other (1)

F. Q. Zhou, M. Zhou, J. J. Pan, “Optical coating computer simulation of narrow bandpass filters for dense wavelength division multiplexing,” Optical Interference Coatings, Vol. 9 of OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1998), pp. 223–225.

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Figures (7)

Fig. 1
Fig. 1

Uncompensated random errors of 0.01% in the optical thickness of layers in the 114-layer, three-cavity filter given in the text. Note that transmittance scale is 10× that of Figs. 2 7.

Fig. 2
Fig. 2

Uncompensated random errors of 0.002% in a filter as shown in Fig. 1.

Fig. 3
Fig. 3

Effects of 1% simulated random errors centered about the turning points when terminating the layers (monitoring) in a mode that provides compensation.

Fig. 4
Fig. 4

Effects of errors of 4% with compensation as in Fig. 3.

Fig. 5
Fig. 5

Errors of 5% as shown in Figs. 3 and 4.

Fig. 6
Fig. 6

Effects of 3% random compensated errors that extend only from the turning point to the greater thickness, for comparison with the results in Figs. 4 and 5.

Fig. 7
Fig. 7

Effects of 3% random compensated errors that occur entirely before the turning point, for comparison with the results in Figs. 6.

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