Abstract

Measurements of ∂n/∂T of thin films by the m-lines technique are presented. The importance of the substrate material is shown. An example of the wavelength shift of an optical thin-film filter with temperature is studied both theoretically and experimentally. The theoretical wavelength shift of a dense wavelength-division multiplexing filter is discussed.

© 2002 Optical Society of America

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References

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  1. W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
    [CrossRef]
  2. R. Ulrich, R. Torge, “Measurement of thin film parameters with a prism coupler,” Appl. Opt. 12, 2901–2908 (1973).
    [CrossRef] [PubMed]
  3. F. Flory, “Guided wave techniques for the characterization of optical coatings,” in Thin Films for Optical Systems, F. Flory, ed., Vol. 49 of Optical Engineering Series (Marcel Dekker, New York; 1995), pp. 393–454.
  4. S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
    [CrossRef]
  5. F. Flory, N. Maythaveekulchai, H. Rigneault, F. Zamkotsian, “Characterization by guided wave of instabilities of optical coatings submitted to high power flux: thermal and third order nonlinear properties of dielectric thin films,” Appl. Opt. 32, 5628–5639 (1993).
    [CrossRef] [PubMed]
  6. M. Bass, ed., Handbook of Optics, 2nd ed. (McGraw-Hill, New York, 1995).
  7. H. Takashashi, “Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition,” Appl. Opt. 34, 667–675 (1995).
    [CrossRef] [PubMed]

2000

S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
[CrossRef]

1999

W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
[CrossRef]

1995

1993

1973

Cheng, W. H.

W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
[CrossRef]

Chi, S. F.

W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
[CrossRef]

Chu, A. K.

W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
[CrossRef]

Flory, F.

S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
[CrossRef]

F. Flory, N. Maythaveekulchai, H. Rigneault, F. Zamkotsian, “Characterization by guided wave of instabilities of optical coatings submitted to high power flux: thermal and third order nonlinear properties of dielectric thin films,” Appl. Opt. 32, 5628–5639 (1993).
[CrossRef] [PubMed]

F. Flory, “Guided wave techniques for the characterization of optical coatings,” in Thin Films for Optical Systems, F. Flory, ed., Vol. 49 of Optical Engineering Series (Marcel Dekker, New York; 1995), pp. 393–454.

Huguet-Chantôme, P.

S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
[CrossRef]

Maythaveekulchai, N.

Monneret, S.

S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
[CrossRef]

Rigneault, H.

Takashashi, H.

Torge, R.

Ulrich, R.

Zamkotsian, F.

Appl. Opt.

J. Opt. A

S. Monneret, P. Huguet-Chantôme, F. Flory, “m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides,” J. Opt. A 2, 188–195 (2000).
[CrossRef]

Thin Solid Films

W. H. Cheng, S. F. Chi, A. K. Chu, “Effect of thermal stresses on temperature of refractive index for Ta2O5 dielectric films,” Thin Solid Films 347, 233–237 (1999).
[CrossRef]

Other

F. Flory, “Guided wave techniques for the characterization of optical coatings,” in Thin Films for Optical Systems, F. Flory, ed., Vol. 49 of Optical Engineering Series (Marcel Dekker, New York; 1995), pp. 393–454.

M. Bass, ed., Handbook of Optics, 2nd ed. (McGraw-Hill, New York, 1995).

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Figures (5)

Fig. 1
Fig. 1

Schematic of m-lines measurement setup at the wavelength 1.55 µm.

Fig. 2
Fig. 2

Example of the variation of refractive index with temperature; λ = 632.8 nm; TiO2 thin film deposited by ion-assisted deposition upon a BK7 substrate; thickness, 533 nm.

Fig. 3
Fig. 3

Transmittance spectrum of a Fabry-Perot filter calculated for 23 °C and 90 °C. The values used for the calculation are those of Table 3. The shift is 1.6 nm.

Fig. 4
Fig. 4

Transmittance spectrum of a Fabry-Perot filter measured for 23 °C and 90 °C. The shift is 1.2 nm.

Fig. 5
Fig. 5

Transmittance spectrum calculated for 20 °C and 80 °C of a dense wavelength-division multiplexing filter. This shift is greater than 3 nm.

Tables (5)

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Table 1 Examples of Realistic Characteristics of a Thin Film and of the Setup

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Table 2 Properties of Samples Used in these Experiments

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Table 3 Experimental Results

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Table 4 Influence of Substrate Material on ∂n/∂T Values

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Table 5 Influence of Wavelength on ∂n/∂T Values

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