Abstract

A spatially localized photochemical reaction induced by near-field femtosecond laser pulses is demonstrated on a nanometer scale and used for high-density optical data storage. Recorded domains down to 120 and 70 nm are obtained with one-photon and two-photon excitation, respectively. It is shown that the local-field confinement that is due to the quadratic dependence of two-photon excitation on light intensity has the potential to increase the near-field optical storage density.

© 2001 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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1999 (1)

1998 (2)

1996 (3)

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

1993 (1)

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

1992 (2)

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

1991 (1)

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

1984 (1)

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

1972 (1)

Ben-Ami, N.

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Betzig, E.

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Bimbaum, D.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Booth, B. L.

Chang, C. H.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Chichkov, B. N.

Denk, W.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Finn, P. L.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

Fujita, K.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Gafni, A.

Gyorgy, E. M.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Harris, T. D.

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Hirotsune, A.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Hosaka, S.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Joshi, M. P.

Jutamulia, S.

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

Kammer, S.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Kannan, R.

Kook, S. K.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Kopelman, R.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Kostelak, R. L.

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Kryder, M. H.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Lanz, M.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Lewis, A.

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Lewis, M. K.

Lieberman, K.

S. Nolte, B. N. Chichkov, H. Welling, Y. Shani, K. Lieberman, H. Terkal, “Nanostructuring with spatially localized femtosecond laser pulses,” Opt. Lett. 24, 914–916 (1999).
[CrossRef]

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Mamin, H. J.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Miyamoto, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Nolte, S.

Pohl, D. W.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Prasad, P. N.

Reinhardt, B. A.

Rugar, D.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Shani, Y.

Shintani, T.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Steel, D. G.

Swiatkiewicz, J.

Terao, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Terkal, H.

Terris, B. D.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Trautman, J. K.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Weiner, J. S.

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Welling, H.

Wolanin, P.

Wolfe, R.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Xu, F.

Yoshida, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Yu, F. T. S.

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

Appl. Opt. (1)

Appl. Phys. Lett. (4)

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

J. Phys. Chem. (1)

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Jpn. J. Appl. Phys. (1)

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Opt. Lett. (3)

Rev. Sci. Instrum. (1)

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Science (1)

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Other (1)

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

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Figures (5)

Fig. 1
Fig. 1

Schematic diagram of a one-photon and two-photon near-field fluorescence microscope for optical storage.

Fig. 2
Fig. 2

Near-field fluorescence spectra of AF-380 a, before photobleaching and b, after photobleaching.

Fig. 3
Fig. 3

(a) One-photon bleached data bits, (b) line-scan profile of the data bits, (c) letters AF consisting of one-photon bleached data bits.

Fig. 4
Fig. 4

Size dependence of one-photon bleached data bits on exposure times of a, 12; b, 15; c, 20; and d, 25 s.

Fig. 5
Fig. 5

(a) Two-photon bleached data bits and (b) line-scan profile of the data bits.

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