Abstract

A spatially localized photochemical reaction induced by near-field femtosecond laser pulses is demonstrated on a nanometer scale and used for high-density optical data storage. Recorded domains down to 120 and 70 nm are obtained with one-photon and two-photon excitation, respectively. It is shown that the local-field confinement that is due to the quadratic dependence of two-photon excitation on light intensity has the potential to increase the near-field optical storage density.

© 2001 Optical Society of America

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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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1999 (1)

1998 (2)

1996 (3)

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

1993 (1)

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

1992 (2)

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

1991 (1)

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

1984 (1)

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

1972 (1)

Ben-Ami, N.

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Betzig, E.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Bimbaum, D.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Booth, B. L.

Chang, C. H.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Chichkov, B. N.

Denk, W.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Finn, P. L.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

Fujita, K.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Gafni, A.

Gyorgy, E. M.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Harris, T. D.

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Hirotsune, A.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Hosaka, S.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Joshi, M. P.

Jutamulia, S.

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

Kammer, S.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Kannan, R.

Kook, S. K.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Kopelman, R.

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Kostelak, R. L.

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Kryder, M. H.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Lanz, M.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Lewis, A.

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Lewis, M. K.

Lieberman, K.

S. Nolte, B. N. Chichkov, H. Welling, Y. Shani, K. Lieberman, H. Terkal, “Nanostructuring with spatially localized femtosecond laser pulses,” Opt. Lett. 24, 914–916 (1999).
[CrossRef]

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Mamin, H. J.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Miyamoto, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Nolte, S.

Pohl, D. W.

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

Prasad, P. N.

Reinhardt, B. A.

Rugar, D.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Shani, Y.

Shintani, T.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Steel, D. G.

Swiatkiewicz, J.

Terao, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Terkal, H.

Terris, B. D.

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

Trautman, J. K.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Weiner, J. S.

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Welling, H.

Wolanin, P.

Wolfe, R.

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

Xu, F.

Yoshida, M.

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Yu, F. T. S.

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

Appl. Opt. (1)

Appl. Phys. Lett. (4)

D. W. Pohl, W. Denk, M. Lanz, “Optical stethoscopy: image recording with resolution λ/20,” Appl. Phys. Lett. 44, 651–653 (1984).
[CrossRef]

E. Betzig, J. K. Trautman, R. Wolfe, E. M. Gyorgy, P. L. Finn, M. H. Kryder, C. H. Chang, “Near-field magneto-optics and high density data storage,” Appl. Phys. Lett. 61, 142–144 (1992).
[CrossRef]

B. D. Terris, H. J. Mamin, D. Rugar, “Near-field optical data storage,” Appl. Phys. Lett. 68, 141–143 (1996).
[CrossRef]

E. Betzig, P. L. Finn, J. S. Weiner, “Combined shear force and near-field scanning optical microscopy,” Appl. Phys. Lett. 60, 2484–2486 (1992).
[CrossRef]

J. Phys. Chem. (1)

D. Bimbaum, S. K. Kook, R. Kopelman, “Near-field scanning optical spectroscopy: spatially resolved spectrum of microcrystals and nanoaggregates in doped polymers,” J. Phys. Chem. 97, 3091–3094 (1993).
[CrossRef]

Jpn. J. Appl. Phys. (1)

S. Hosaka, T. Shintani, M. Miyamoto, A. Hirotsune, M. Terao, M. Yoshida, K. Fujita, S. Kammer, “Nanometer-sized phase-change recording using a scanning near-field optical microscope with a laser diode,” Jpn. J. Appl. Phys. 35, 443–447 (1996).
[CrossRef]

Opt. Lett. (3)

Rev. Sci. Instrum. (1)

K. Lieberman, N. Ben-Ami, A. Lewis, “A fully integrated near-field optical, far-field optical, and normal-force scanned probe microscope,” Rev. Sci. Instrum. 67, 3567–3572 (1996).
[CrossRef]

Science (1)

E. Betzig, J. K. Trautman, T. D. Harris, J. S. Weiner, R. L. Kostelak, “Breaking the diffraction barrier: optical microscopy on a nanometric scale,” Science 251, 1468–1470 (1991).
[CrossRef] [PubMed]

Other (1)

F. T. S. Yu, S. Jutamulia, Optical Storage and Retrieval (Marcel Dekker, New York, 1996).

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Figures (5)

Fig. 1
Fig. 1

Schematic diagram of a one-photon and two-photon near-field fluorescence microscope for optical storage.

Fig. 2
Fig. 2

Near-field fluorescence spectra of AF-380 a, before photobleaching and b, after photobleaching.

Fig. 3
Fig. 3

(a) One-photon bleached data bits, (b) line-scan profile of the data bits, (c) letters AF consisting of one-photon bleached data bits.

Fig. 4
Fig. 4

Size dependence of one-photon bleached data bits on exposure times of a, 12; b, 15; c, 20; and d, 25 s.

Fig. 5
Fig. 5

(a) Two-photon bleached data bits and (b) line-scan profile of the data bits.

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