Abstract

We used a LED in a Ronchi tester to obtain two main improvements: (i) We can choose one of two wavelength bands to illuminate and record the ronchigram, and (ii) we can change the irradiance of the illumination source according to the optical system under test and the detector array. This can be done by use of an adequate electronic circuit.

© 2001 Optical Society of America

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References

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  1. A. Cornejo-Rodríguez, “Ronchi test,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 9.
  2. K. Omura, T. Yatagui, “Phase measuring Ronchi test,” Appl. Opt. 27, 523–528 (1988).
    [CrossRef] [PubMed]
  3. H. J. Lee, S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 38, 1041–1047 (1999).
    [CrossRef]
  4. E. R. Schumacher, “A precision all-purpose optical tester,” Appl. Opt. 5, 475–476 (1966).
    [CrossRef] [PubMed]
  5. K. Patorsky, A. Cornejo-Rodríguez, “Ronchi test with daylight illumination,” Appl. Opt. 25, 2031–2032 (1986).
    [CrossRef]
  6. A. P. Malvino, “Diodes,” in Electronic Principles, 2nd ed. (McGraw-Hill, New York, 1979), Chap. 4.
  7. V. H. Cabrera-Peláez, “Rejilla radial circular de Ronchi,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 2000).
  8. J. Díaz-Anzures, “Simulación de ronchigramas para sistemas ópticos reflectores y/o refractores,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 1998).

1999 (1)

H. J. Lee, S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 38, 1041–1047 (1999).
[CrossRef]

1988 (1)

1986 (1)

1966 (1)

Cabrera-Peláez, V. H.

V. H. Cabrera-Peláez, “Rejilla radial circular de Ronchi,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 2000).

Cornejo-Rodríguez, A.

K. Patorsky, A. Cornejo-Rodríguez, “Ronchi test with daylight illumination,” Appl. Opt. 25, 2031–2032 (1986).
[CrossRef]

A. Cornejo-Rodríguez, “Ronchi test,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 9.

Díaz-Anzures, J.

J. Díaz-Anzures, “Simulación de ronchigramas para sistemas ópticos reflectores y/o refractores,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 1998).

Kim, S. W.

H. J. Lee, S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 38, 1041–1047 (1999).
[CrossRef]

Lee, H. J.

H. J. Lee, S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 38, 1041–1047 (1999).
[CrossRef]

Malvino, A. P.

A. P. Malvino, “Diodes,” in Electronic Principles, 2nd ed. (McGraw-Hill, New York, 1979), Chap. 4.

Omura, K.

Patorsky, K.

Schumacher, E. R.

Yatagui, T.

Appl. Opt. (3)

Opt. Eng. (1)

H. J. Lee, S. W. Kim, “Precision profile measurement of aspheric surfaces by improved Ronchi test,” Opt. Eng. 38, 1041–1047 (1999).
[CrossRef]

Other (4)

A. P. Malvino, “Diodes,” in Electronic Principles, 2nd ed. (McGraw-Hill, New York, 1979), Chap. 4.

V. H. Cabrera-Peláez, “Rejilla radial circular de Ronchi,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 2000).

J. Díaz-Anzures, “Simulación de ronchigramas para sistemas ópticos reflectores y/o refractores,” tesis de maestría (Facultad de Ciencias Físico Matemáticas, Benemérita Universidad Atónonia de Puebla, Puebla, México, 1998).

A. Cornejo-Rodríguez, “Ronchi test,” in Optical Shop Testing, 2nd ed., D. Malacara, ed. (Wiley, New York, 1992), Chap. 9.

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Figures (10)

Fig. 1
Fig. 1

(a) Ronchi test using a point source, (b) current Ronchi tester.

Fig. 2
Fig. 2

Ronchi test using sunlight as illumination source.

Fig. 3
Fig. 3

Experimental setup used to test a lens using two Ronchi rulings and ronchigram obtained.

Fig. 4
Fig. 4

Location of the LED with respect to Ronchi ruling.

Fig. 5
Fig. 5

Profile view of the new Ronchi tester.

Fig. 6
Fig. 6

Container of (a) ruling, (b) LED.

Fig. 7
Fig. 7

Front view of the new Ronchi tester.

Fig. 8
Fig. 8

Power-supply circuit used in the new Ronchi tester.

Fig. 9
Fig. 9

Ronchigram of a hyperbolic mirror obtained with a wavelength corresponding to (a) red, (b) green.

Fig. 10
Fig. 10

Ronchigram of a lens obtained with (a) a tungsten lamp, (b) our tester.

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