Abstract

The effects of an arbitrary small inclination between the two crossed gratings on moiré fringes in Talbot interferometry are discussed. The small inclination is formed by the rotation by a small angle γ of the beam splitter’s grating about the axis that is on the plane of the grating and has an arbitrary angle δ with respect to the lines of the grating. The results indicate that the small inclination has a great influence on measurements for which Talbot interferometry is applied, such as beam collimation and measurement of the focal length of a lens. The theoretical analyses are proved by experimental results. Some methods for judging the size of a small inclination are also proposed.

© 2001 Optical Society of America

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References

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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef]
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    [CrossRef] [PubMed]
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    [CrossRef] [PubMed]

2000

1999

1986

1985

K. Patorski, “Talbot interferometry with increased shear,” Appl. Opt. 24, 4448–4453 (1985).
[CrossRef] [PubMed]

P. Szwaykowski, “Producing binary diffraction gratings in the double-diffraction system,” Opt. Laser Technol. 17, 255–261 (1985).
[CrossRef]

1983

H. O. Bartelt, Y. Li, “Lau interferometry with cross gratings,” Opt. Commun. 48, 1–6 (1983).
[CrossRef]

1971

Bartelt, H. O.

H. O. Bartelt, Y. Li, “Lau interferometry with cross gratings,” Opt. Commun. 48, 1–6 (1983).
[CrossRef]

Chang, Y. S.

Kakuma, S.

Li, Y.

H. O. Bartelt, Y. Li, “Lau interferometry with cross gratings,” Opt. Commun. 48, 1–6 (1983).
[CrossRef]

Liu, Q.

Ohba, R.

Patorski, K.

Suzuki, T.

Szwaykowski, P.

P. Szwaykowski, “Producing binary diffraction gratings in the double-diffraction system,” Opt. Laser Technol. 17, 255–261 (1985).
[CrossRef]

Yokozeki, S.

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