Abstract

On the basis of analyzing sinusoidal phase-modulating Fabry–Perot interferometry, a method, believed to be novel, is proposed for achieving nanometer measurement accuracy by measuring the time interval between equal amplitudes of the two elementary frequency signals of the transmitted intensities of a dual Fabry–Perot interferometer. A nanometer measurement system based on the method was designed and tested. The experimental results show that the displacement resolution of the system is 0.32 nm at a 1-kHz modulating signal.

© 2001 Optical Society of America

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