Abstract

We report on determination of the surface effects of mercuric iodide (HgI2) uniaxial HgI2 optical parameters with a fixed-polarizer, rotating-polarizer, and fixed-analyzer spectroscopic ellipsometer (PRPSE) after chemical polishing. The characteristics of the chemical complex [KHgI3,H2O] that forms on the HgI2 surface during KI etching have been investigated over the spectral range from 400 to 800 nm. Surface roughness and effects of the ellipsometric parameters of HgI2 were treated, and the thickness of the layer formed on the surface was determined and analyzed by PRPSE. The surface roughness was modeled with the Bruggeman effective medium approximation.

© 2001 Optical Society of America

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