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[Crossref]

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[Crossref]

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[Crossref]

S. Yu Berezhna, I. V. Berezhnyy, M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics ’99 (Japan Society of Mechanical Engineering, Tokyo, 1999), Vol. 2, pp. 635–640.

C. Buckberry, D. Towers, “New approaches to the full-field analysis of photoelastic stress patterns,” Opt. Lasers Eng. 24, 415–428 (1996).

[Crossref]

J. L. Pezanniti, R. A. Chipman, “Mueller matrix imaging polarimetry,” Opt. Eng. 34, 1558–1568 (1995).

[Crossref]

Y. Morimoto, M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 3709–3714 (1994).

[Crossref]

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[Crossref]

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[Crossref]

Y. Morimoto, M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 3709–3714 (1994).

[Crossref]

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[Crossref]

M. N. Pacey, X. Z. Wang, S. J. Haake, E. A. Patterson, “The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis,” Exp. Mech. 39, 265–274 (1999).

[Crossref]

M. N. Pacey, X. Z. Wang, S. J. Haake, E. A. Patterson, “The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis,” Exp. Mech. 39, 265–274 (1999).

[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

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[Crossref]

A. V. S. S. R. Sarma, S. A. Pillai, G. Subramanian, T. K. Varadan, “Computerized image processing for whole-field determination of isoclinics and isochromatics,” Exp. Mech. 31, 24–29 (1992).

[Crossref]

A. V. S. S. R. Sarma, S. A. Pillai, G. Subramanian, T. K. Varadan, “Computerized image processing for whole-field determination of isoclinics and isochromatics,” Exp. Mech. 31, 24–29 (1992).

[Crossref]

S. Yu Berezhna, I. V. Berezhnyy, M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics ’99 (Japan Society of Mechanical Engineering, Tokyo, 1999), Vol. 2, pp. 635–640.

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[Crossref]

A. V. S. S. R. Sarma, S. A. Pillai, G. Subramanian, T. K. Varadan, “Computerized image processing for whole-field determination of isoclinics and isochromatics,” Exp. Mech. 31, 24–29 (1992).

[Crossref]

A. S. Voloshin, A. S. Redner, “Automated measurement of birefringence: development and experimental evaluation of the technique,” Exp. Mech. 28, 252–257 (1989).

[Crossref]

M. N. Pacey, X. Z. Wang, S. J. Haake, E. A. Patterson, “The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis,” Exp. Mech. 39, 265–274 (1999).

[Crossref]

E. A. Patterson, Z. F. Wang, “Towards full-field automatic photoelastic analysis of complex components,” Strain 27, 49–56 (1991).

[Crossref]

S. Yu Berezhna, I. V. Berezhnyy, M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics ’99 (Japan Society of Mechanical Engineering, Tokyo, 1999), Vol. 2, pp. 635–640.

J. A. Quiroga, A. Gonzalez-Cano, “Phase measuring algorithm for extraction of isochromatic of photoelastic fringe patterns,” Appl. Opt. 36, 8397–8402 (1997).

[Crossref]

T. W. Ng, “Derivation of retardation phase in computer-aided photoelasticity by using carrier fringe phase shifting,” Appl. Opt. 36, 8259–8263 (1997).

[Crossref]

A. D. Nurse, “Full-field automated photoelasticity by use of a three-wavelength approach to phase stepping,” Appl. Opt. 36, 5781–5786 (1997).

[Crossref]
[PubMed]

A. Asundi, L. Tong, Ch. G. Boay, “Phase shifting method with a normal polariscope,” Appl. Opt. 38, 5931–5935 (1999).

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A. Ajovalasit, S. Barone, G. Petrucci, “Towards RGB photoelasticity: full-field automated photoelasticity in white light,” Exp. Mech. 35, 193–200 (1995).

[Crossref]

M. N. Pacey, X. Z. Wang, S. J. Haake, E. A. Patterson, “The application of evolutionary and maximum entropy algorithms to photoelastic spectral analysis,” Exp. Mech. 39, 265–274 (1999).

[Crossref]

N. Plouzennec, A. Lagarde, “Two-wavelength method for full-field automated photoelasticity,” Exp. Mech. 39, 274–278 (1999).

[Crossref]

R. K. Muller, L. R. Saackel, “Complete automatic analysis of photoelastic fringes,” Exp. Mech. 18, 245–251 (1979).

[Crossref]

A. S. Voloshin, A. S. Redner, “Automated measurement of birefringence: development and experimental evaluation of the technique,” Exp. Mech. 28, 252–257 (1989).

[Crossref]

A. V. S. S. R. Sarma, S. A. Pillai, G. Subramanian, T. K. Varadan, “Computerized image processing for whole-field determination of isoclinics and isochromatics,” Exp. Mech. 31, 24–29 (1992).

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[Crossref]

J. L. Pezanniti, R. A. Chipman, “Mueller matrix imaging polarimetry,” Opt. Eng. 34, 1558–1568 (1995).

[Crossref]

Y. Morimoto, M. Fujisawa, “Fringe pattern analysis by a phase-shifting method using Fourier transform,” Opt. Eng. 33, 3709–3714 (1994).

[Crossref]

C. Buckberry, D. Towers, “New approaches to the full-field analysis of photoelastic stress patterns,” Opt. Lasers Eng. 24, 415–428 (1996).

[Crossref]

E. A. Patterson, Z. F. Wang, “Towards full-field automatic photoelastic analysis of complex components,” Strain 27, 49–56 (1991).

[Crossref]

S. Yu Berezhna, I. V. Berezhnyy, M. Takashi, “Photoelastic analysis through Jones matrix imaging Fourier polarimetry,” in Proceedings of the International Conference on Advanced Technology in Experimental Mechanics ’99 (Japan Society of Mechanical Engineering, Tokyo, 1999), Vol. 2, pp. 635–640.

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