Abstract
A modern fringe-pattern-analyzing interferometer with a resolution of 1 × 10-9 and without exclusion of systematic uncertainties owing to optic effects of less than 1 nm was used to test a new method of interferometric length measurement based on a combination of the reproducible wringing and slave-block techniques. Measurements without excessive wringing film error are demonstrated for blocks with nominal lengths of 2–6 mm and with high surface flatness. The uncertainty achieved for these blocks is less than 1 nm. Deformations of steel gauge blocks and reference platens, caused by wringing forces, are investigated, and the necessary conditions for reproducible wringing are outlined. A subnanometer uncertainty level in phase-change-correction measurements has been achieved for gauge blocks as long as 100 mm. Limitations on the accuracy standard method of interferometric length measurements and shortcomings of the present definition of the length of the material artifact are emphasized.
© 2000 Optical Society of America
Full Article | PDF ArticleMore Like This
Igor Malinovsky, Alexander Titov, Jorge Augusto Dutra, Hakima Belaïdi, Ricardo dos Santos França, and Carlos Alberto Massone
Appl. Opt. 38(1) 101-112 (1999)
Wang-Tsung Wu, Yen-Liang Chen, Hung-Chih Hsieh, Wei-Yao Chang, and Der-Chin Su
Appl. Opt. 49(16) 3182-3186 (2010)
Vladislav M. Khavinson
Appl. Opt. 38(1) 126-135 (1999)