Abstract

We present a technique for single-beam measurement of the optical nonlinearity in GaAs for photon energies above the bandgap. We measured the real and the imaginary parts of the nonlinear refractive index of a bulk crystal by using the change in reflection of dye laser pulses (10 ns, 538 nm). The values obtained, n 2 = (7.8 ± 0.6) × 10-8 cm2/W and κ2 = (-2.8 ± 0.7) × 10-8 cm2/W, are discussed.

© 2000 Optical Society of America

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  1. U. Keller, “Semiconductor nonlinearities for solid-state laser modelocking and Q-switching,” in Nonlinear Optics in Semiconductors II, E. Garmire, A. Kost, eds., Vol. 59 of Semiconductors and Semimetals (Academic, San Diego, Calif., 1999).
  2. F. Henneberger, S. Schmitt-Rink, E. O. Gobel, eds., Optics of Semiconductor Nanostructures (Akademie-Verlag, Berlin, 1993).
  3. M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
    [CrossRef]
  4. H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
    [CrossRef]
  5. M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
    [CrossRef]
  6. N. Peyghambarian, S. W. Koch, “Semiconductor nonlinear materials,” in Nonlinear Photonics, H. M. Gibbs, G. Khitrova, N. Peyghambarian, eds. (Springer-Verlag, Berlin, 1990), Chap. 2.
    [CrossRef]
  7. Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
    [CrossRef] [PubMed]
  8. D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
    [CrossRef]
  9. D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
    [CrossRef]
  10. B. O. Seraphin, H. E. Bennett, “Optical constants,” in Optical Properties of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 3 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 12.
  11. M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
    [CrossRef]
  12. M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959).
  13. W. Zhao, P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
    [CrossRef]
  14. P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
    [CrossRef]
  15. M. Gershenzon, “Radiative recombination in the III–V compounds,” in Physics of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 2 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 13.
  16. M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
    [CrossRef]

1998 (1)

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

1996 (1)

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
[CrossRef]

1994 (1)

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
[CrossRef]

1993 (1)

W. Zhao, P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
[CrossRef]

1991 (2)

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

1990 (1)

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

1988 (1)

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

1986 (1)

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

1983 (1)

M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
[CrossRef]

Amer, N. M.

M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
[CrossRef]

Banyai, L.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Bennett, H. E.

B. O. Seraphin, H. E. Bennett, “Optical constants,” in Optical Properties of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 3 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 12.

Bian, S.

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

Born, M.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959).

Chavez-Pirson, A.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Dapkus, P. D.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

de Araújo, C. B.

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
[CrossRef]

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
[CrossRef]

DeSalvo, J. R.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Garmire, E. M.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

Gershenzon, M.

M. Gershenzon, “Radiative recombination in the III–V compounds,” in Physics of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 2 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 13.

Gibbs, H. M.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Gomes, A. S. L.

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
[CrossRef]

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
[CrossRef]

Gossard, A. C.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Hagan, D. J.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Hariz, A.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

Horowicz, R. J.

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

Hutchings, D. C.

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

Jeffery, A.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Kawase, M.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

Keller, U.

U. Keller, “Semiconductor nonlinearities for solid-state laser modelocking and Q-switching,” in Nonlinear Optics in Semiconductors II, E. Garmire, A. Kost, eds., Vol. 59 of Semiconductors and Semimetals (Academic, San Diego, Calif., 1999).

Koch, S. W.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

N. Peyghambarian, S. W. Koch, “Semiconductor nonlinear materials,” in Nonlinear Photonics, H. M. Gibbs, G. Khitrova, N. Peyghambarian, eds. (Springer-Verlag, Berlin, 1990), Chap. 2.
[CrossRef]

Kohn, S.

M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
[CrossRef]

Kost, A.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

Lee, H.-C.

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

Lee, M. A.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Lee, Y. H.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Leite, J. R.

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

Li, L.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Martinelli, M.

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

Morhange, J.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Olmstead, M. A.

M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
[CrossRef]

Palffy-Muhoray, P.

W. Zhao, P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
[CrossRef]

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Park, S. H.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Petrov, D. V.

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
[CrossRef]

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
[CrossRef]

Peyghambarian, N.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

N. Peyghambarian, S. W. Koch, “Semiconductor nonlinear materials,” in Nonlinear Photonics, H. M. Gibbs, G. Khitrova, N. Peyghambarian, eds. (Springer-Verlag, Berlin, 1990), Chap. 2.
[CrossRef]

Said, A. A.

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Seraphin, B. O.

B. O. Seraphin, H. E. Bennett, “Optical constants,” in Optical Properties of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 3 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 12.

Sheik-Bahae, M.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Van Stryland, E. W.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Wei, T. H.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Wiegmann, W.

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Wolf, E.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959).

Yuan, H. J.

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Zhao, W.

W. Zhao, P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
[CrossRef]

Appl. Phys. A (1)

M. A. Olmstead, N. M. Amer, S. Kohn, “Photothermal displacement spectroscopy: an optical probe for solids and surfaces,” Appl. Phys. A 32, 141–154 (1983).
[CrossRef]

Appl. Phys. Lett. (3)

M. Martinelli, S. Bian, J. R. Leite, R. J. Horowicz, “Sensitivity-enhanced reflection Z-scan by oblique incidence of a polarized beam,” Appl. Phys. Lett. 72, 1427–1429 (1998).
[CrossRef]

W. Zhao, P. Palffy-Muhoray, “Z-scan technique using top-hat beams,” Appl. Phys. Lett. 63, 1613–1615 (1993).
[CrossRef]

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection Z-scan technique for measurements of optical properties of surfaces,” Appl. Phys. Lett. 65, 1067–1069 (1994).
[CrossRef]

IEEE J. Quantum Electron. (3)

M. Sheik-Bahae, D. C. Hutchings, D. J. Hagan, E. W. Van Stryland, “Dispersion of bound electronic nonlinear refraction in solids,” IEEE J. Quantum Electron. 27, 1296–1309 (1991).
[CrossRef]

H.-C. Lee, A. Kost, M. Kawase, A. Hariz, P. D. Dapkus, E. M. Garmire, “Nonlinear absorption properties of AlGaAs/GaAs multiple quantum wells grown by metalorganic chemical vapor-deposition,” IEEE J. Quantum Electron. 24, 1581–1592 (1988).
[CrossRef]

M. Sheik-Bahae, A. A. Said, T. H. Wei, D. J. Hagan, E. W. Van Stryland, “Sensitive measurement of optical nonlinearities using a single beam,” IEEE J. Quantum Electron. 26, 760–769 (1990).
[CrossRef]

Mol. Cryst. Liq. Cryst. (1)

P. Palffy-Muhoray, H. J. Yuan, L. Li, M. A. Lee, J. R. DeSalvo, T. H. Wei, M. Sheik-Bahae, D. J. Hagan, E. W. Van Stryland, “Measurements of third-order optical nonlinearities of nematic liquid crystals,” Mol. Cryst. Liq. Cryst. 207, 291–305 (1991).
[CrossRef]

Opt. Commun. (1)

D. V. Petrov, A. S. L. Gomes, C. B. de Araújo, “Reflection of a Gaussian beam from a saturable absorber,” Opt. Commun. 123, 637–641 (1996).
[CrossRef]

Phys. Rev. Lett. (1)

Y. H. Lee, A. Chavez-Pirson, S. W. Koch, H. M. Gibbs, S. H. Park, J. Morhange, A. Jeffery, N. Peyghambarian, L. Banyai, A. C. Gossard, W. Wiegmann, “Room-temperature optical nonlinearities in GaAs,” Phys. Rev. Lett. 57, 2446–2449 (1986).
[CrossRef] [PubMed]

Other (6)

M. Gershenzon, “Radiative recombination in the III–V compounds,” in Physics of III–V Compounds, R. K. Willardson, A. C. Beer, eds., Vol. 2 of Semiconductors and Semimetals (Academic, New York, 1962), Chap. 13.

M. Born, E. Wolf, Principles of Optics (Pergamon, New York, 1959).

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Figures (3)

Fig. 1
Fig. 1

Experimental setup for the RZ-scan measurement.

Fig. 2
Fig. 2

Normalized reflected power for an RZ-scan, showing the amplitude distortion of the beam.

Fig. 3
Fig. 3

Normalized on-axis intensity in the far-field region for an RZ-scan, showing the phase distortion of the beam.

Equations (5)

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r˜=r˜0+dr˜0dñ Δñ=r˜01+rˆθΔñρ, z;
rˆpθ=2ñ3 cosθ-4ñ cosθsin2θñ4 cos2θ-ñ2+sin2θñ2-sin2θ-1/2.
ITz=1+2 Rerˆn2+iκ20 |Eρ, z|4ρdρ0 |Eρ, z|2ρdρ
I0z=1+2 Rerˆn2+iκ20 Eρ, z|Eρ, z|2ρdρ0 Eρ, zρdρ.
Eρ, z=E0 expikz01 J0πw0 ρη×exp-i πλ4w0 zη2ηdη,

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