Abstract

The Denisyuk volume reflection hologram is produced with spatially incoherent light to form an image-plane hologram. The image formed in readout combines the properties of volume holography and confocal image formation.

© 2000 Optical Society of America

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References

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  1. D. Gabor, “A new microscopy principle,” Nature (London) 161, 777–778 (1948).
    [CrossRef]
  2. E. Leith, J. Upatnieks, “Holography with achromatic fringe systems,” J. Opt. Soc. Am. 57, 975–980 (1967).
    [CrossRef]
  3. G. J. Swanson, “Broad source fringes in grating and conventional interferometers,” J. Opt. Soc. Am. A 1, 1147–1153 (1984).
    [CrossRef]
  4. Y. N. Denisyuk, “Photographic reconstruction of the optical properties of an object in its own scattered radiation field,” Sov. Phys. Dokl. 7, 543–545 (1962).
  5. P.-C. Sun, E. Leith, “Broad-source image plane holography as a confocal imaging process,” Appl. Opt. 33, 597–602 (1994).
    [CrossRef] [PubMed]
  6. P.-C. Sun, E. Arons, “Nonscanning confocal ranging system,” Appl. Opt. 34, 1254–1261 (1995).
    [CrossRef] [PubMed]
  7. E. Arons, E. Leith, “Coherence-confocal-imaging system for enhanced depth discrimination in transmitted light,” Appl. Opt. 35, 2499–2506 (1996).
    [CrossRef]
  8. M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
    [CrossRef]
  9. E. N. Leith, G. J. Swanson, “Recording of phase amplitude images,” Appl. Opt. 20, 3081–3084 (1981).
    [CrossRef] [PubMed]
  10. E. Leith, G. Yang, “Interferometric spatial carrier formation with an extended source,” Appl. Opt. 20, 3819–3821 (1981).
    [CrossRef] [PubMed]

1996 (1)

1995 (1)

1994 (1)

1984 (1)

1981 (2)

1967 (1)

1962 (1)

Y. N. Denisyuk, “Photographic reconstruction of the optical properties of an object in its own scattered radiation field,” Sov. Phys. Dokl. 7, 543–545 (1962).

1948 (1)

D. Gabor, “A new microscopy principle,” Nature (London) 161, 777–778 (1948).
[CrossRef]

Arons, E.

Cohen, F.

M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
[CrossRef]

Davidson, M.

M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
[CrossRef]

Denisyuk, Y. N.

Y. N. Denisyuk, “Photographic reconstruction of the optical properties of an object in its own scattered radiation field,” Sov. Phys. Dokl. 7, 543–545 (1962).

Gabor, D.

D. Gabor, “A new microscopy principle,” Nature (London) 161, 777–778 (1948).
[CrossRef]

Kaufman, K.

M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
[CrossRef]

Leith, E.

Leith, E. N.

Mazor, I.

M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
[CrossRef]

Sun, P.-C.

Swanson, G. J.

Upatnieks, J.

Yang, G.

Appl. Opt. (5)

J. Opt. Soc. Am. (1)

J. Opt. Soc. Am. A (1)

Nature (London) (1)

D. Gabor, “A new microscopy principle,” Nature (London) 161, 777–778 (1948).
[CrossRef]

Sov. Phys. Dokl. (1)

Y. N. Denisyuk, “Photographic reconstruction of the optical properties of an object in its own scattered radiation field,” Sov. Phys. Dokl. 7, 543–545 (1962).

Other (1)

M. Davidson, K. Kaufman, I. Mazor, F. Cohen, “An application of interference microscopy to integrated circuit inspection and metrology,” in Integrated Circuit Metrology, Inspection, and Process Control, K. M. Monahan, ed., Proc. SPIE775, 233–247 (1987).
[CrossRef]

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Figures (4)

Fig. 1
Fig. 1

Experimental setup for recording a reflection hologram with spatially incoherent light.

Fig. 2
Fig. 2

Image formed from the reflection hologram. The hologram is recorded with extended-source light (source circular and 2 mm in diameter). The object is a resolution target. There is a 20° tilt between the image plane and the hologram plane, which shows the depth discrimination due to fringe localization.

Fig. 3
Fig. 3

(a) Image of the resolution target when a 1-mm pinhole is placed in the focal plane of the lens L1. (b) Image from the reflection hologram, illuminated with white light. A 1-mm pinhole is placed in the focal plane of the lens L1, and the size of the light source was 10 mm when the hologram was recorded.

Fig. 4
Fig. 4

(a) Image of the resolution target when placed between two plates of ground glass. (b) Image from the hologram. The white-light source for viewing the hologram was 5 mm in diameter, and the fringe localization plane was parallel to the hologram.

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