Abstract

The optical constants of two cyanine dye films that we prepared were measured with a RAP-1-type (RAP is rotating analyzer and polarizer) spectroscopic ellipsometer. Toward making a simplified model for the wafers of a recordable compact disk (CD-R), we give their optimization designs developed with the cyanine dye films. In addition, the dynamic storage performances of two sample disks were tested by our dynamic storage testing system. Measurement results of the sample disks were obtained to test and verify our film designs.

© 2000 Optical Society of America

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References

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  1. E. Hamada, Y. Shin, T. Ishiguro, “CD-compatible write-once disc with high reflectivity,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 80–87 (1989).
    [CrossRef]
  2. E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
    [CrossRef]
  3. A. H. M. Holtslag, E. F. McCord, G. H. Werumeus Buning, “Recording mechanism of overcoated metallized dye lasers on polycarbonate substrates,” presented at the International Symposium on Optical Memory, Sapporo, Japan, 1–4 October 1991.
  4. F. Gan, L. Hou, “Optical storage using organic compounds as recording materials,” in Fourth International Symposium on Optical Storage (ISOS ’96), F. Gan, ed., Proc. SPIE2931, 34–42 (1996).
    [CrossRef]
  5. H. Oba, M. Abe, M. Umehara, T. Sato, Y. Ueda, M. Kunikane, “Organic dye materials for optical recording media,” Appl. Opt. 25, 4023–4026 (1986).
    [CrossRef] [PubMed]
  6. L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
    [CrossRef]
  7. L.-Y. Chen, X.-W. Feng, Y. Su, H. Z. Ma, Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299–1305 (1994).
    [CrossRef] [PubMed]
  8. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  9. J. Tang, P. Gu, Film Optics and Technology (Mechanical Industry, Beijing, 1989) (in Chinese).
  10. Philips and Sony Corporations, Orange Book, Part II, CD Write-Once Specification (Philips, Eindhoven, The Netherlands, 1993; Sony, Atsugi, Japan, 1993).
  11. X. Tang, “Study on the optical and performance of optical storage of cyanine compound films,” Master of Science thesis (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 1998) (in Chinese).

1994 (1)

1993 (1)

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

1986 (1)

Abe, M.

Azzam, R. M. A.

R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).

Bashara, N. M.

R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).

Chen, L.-Y.

L.-Y. Chen, X.-W. Feng, Y. Su, H. Z. Ma, Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299–1305 (1994).
[CrossRef] [PubMed]

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

Feng, X.-W.

L.-Y. Chen, X.-W. Feng, Y. Su, H. Z. Ma, Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299–1305 (1994).
[CrossRef] [PubMed]

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

Fujii, T.

E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
[CrossRef]

Gan, F.

F. Gan, L. Hou, “Optical storage using organic compounds as recording materials,” in Fourth International Symposium on Optical Storage (ISOS ’96), F. Gan, ed., Proc. SPIE2931, 34–42 (1996).
[CrossRef]

Gu, P.

J. Tang, P. Gu, Film Optics and Technology (Mechanical Industry, Beijing, 1989) (in Chinese).

Hamada, E.

E. Hamada, Y. Shin, T. Ishiguro, “CD-compatible write-once disc with high reflectivity,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 80–87 (1989).
[CrossRef]

E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
[CrossRef]

Holtslag, A. H. M.

A. H. M. Holtslag, E. F. McCord, G. H. Werumeus Buning, “Recording mechanism of overcoated metallized dye lasers on polycarbonate substrates,” presented at the International Symposium on Optical Memory, Sapporo, Japan, 1–4 October 1991.

Hou, L.

F. Gan, L. Hou, “Optical storage using organic compounds as recording materials,” in Fourth International Symposium on Optical Storage (ISOS ’96), F. Gan, ed., Proc. SPIE2931, 34–42 (1996).
[CrossRef]

Ishiguro, T.

E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
[CrossRef]

E. Hamada, Y. Shin, T. Ishiguro, “CD-compatible write-once disc with high reflectivity,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 80–87 (1989).
[CrossRef]

Kunikane, M.

Ma, H. Z.

Ma, H.-Z.

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

McCord, E. F.

A. H. M. Holtslag, E. F. McCord, G. H. Werumeus Buning, “Recording mechanism of overcoated metallized dye lasers on polycarbonate substrates,” presented at the International Symposium on Optical Memory, Sapporo, Japan, 1–4 October 1991.

Oba, H.

Qian, Y. H.

L.-Y. Chen, X.-W. Feng, Y. Su, H. Z. Ma, Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299–1305 (1994).
[CrossRef] [PubMed]

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

Sato, T.

Shin, Y.

E. Hamada, Y. Shin, T. Ishiguro, “CD-compatible write-once disc with high reflectivity,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 80–87 (1989).
[CrossRef]

Su, Y.

L.-Y. Chen, X.-W. Feng, Y. Su, H. Z. Ma, Y. H. Qian, “Design of a scanning ellipsometer by synchronous rotation of the polarizer and analyzer,” Appl. Opt. 33, 1299–1305 (1994).
[CrossRef] [PubMed]

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

Takagishi, Y.

E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
[CrossRef]

Tang, J.

J. Tang, P. Gu, Film Optics and Technology (Mechanical Industry, Beijing, 1989) (in Chinese).

Tang, X.

X. Tang, “Study on the optical and performance of optical storage of cyanine compound films,” Master of Science thesis (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 1998) (in Chinese).

Ueda, Y.

Umehara, M.

Werumeus Buning, G. H.

A. H. M. Holtslag, E. F. McCord, G. H. Werumeus Buning, “Recording mechanism of overcoated metallized dye lasers on polycarbonate substrates,” presented at the International Symposium on Optical Memory, Sapporo, Japan, 1–4 October 1991.

Appl. Opt. (2)

Thin Solid Films (1)

L.-Y. Chen, X.-W. Feng, Y. Su, H.-Z. Ma, Y. H. Qian, “Improved rotating analysis-polarizer type of scanning ellipsometer,” Thin Solid Films 234, 385–389 (1993).
[CrossRef]

Other (8)

R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).

J. Tang, P. Gu, Film Optics and Technology (Mechanical Industry, Beijing, 1989) (in Chinese).

Philips and Sony Corporations, Orange Book, Part II, CD Write-Once Specification (Philips, Eindhoven, The Netherlands, 1993; Sony, Atsugi, Japan, 1993).

X. Tang, “Study on the optical and performance of optical storage of cyanine compound films,” Master of Science thesis (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai, 1998) (in Chinese).

E. Hamada, Y. Shin, T. Ishiguro, “CD-compatible write-once disc with high reflectivity,” in Optical Data Storage Topical Meeting, G. R. Knight, C. N. Kurtz, eds., Proc. SPIE1078, 80–87 (1989).
[CrossRef]

E. Hamada, T. Fujii, Y. Takagishi, T. Ishiguro, “Recording process of recordable compact disc,” in Optical Data Storage, D. B. Carlin, D. B. Kay, eds., Proc. SPIE1663, 443–446 (1992).
[CrossRef]

A. H. M. Holtslag, E. F. McCord, G. H. Werumeus Buning, “Recording mechanism of overcoated metallized dye lasers on polycarbonate substrates,” presented at the International Symposium on Optical Memory, Sapporo, Japan, 1–4 October 1991.

F. Gan, L. Hou, “Optical storage using organic compounds as recording materials,” in Fourth International Symposium on Optical Storage (ISOS ’96), F. Gan, ed., Proc. SPIE2931, 34–42 (1996).
[CrossRef]

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Figures (11)

Fig. 1
Fig. 1

General molecular structure of penta-methin-bis-carbocyanine.

Fig. 2
Fig. 2

Changing curves between the optical constants n and k of sample C1 according to the incident wavelength from 500–800 nm.

Fig. 3
Fig. 3

Changing curves between the optical constants n and k of sample C2 according to the incident wavelength from 500–800 nm.

Fig. 4
Fig. 4

Diagram of a CD-R structure and the simplified model.

Fig. 5
Fig. 5

Theoretical relation curves between the dye recording layer thickness and the general reflectivity of sample SC1 at different pregroove depths.

Fig. 6
Fig. 6

Theoretical relation curves between the dye recording layer thickness and the general reflectivity of sample SC1 at different thicknesses of Au reflection layer.

Fig. 7
Fig. 7

Theoretical relation curves between the dye recording layer thickness and the general reflectivity of sample SC2 at different pregroove depths.

Fig. 8
Fig. 8

Relation between CNR and recording power of sample SC1.

Fig. 9
Fig. 9

Relation between CNR and recording frequency of sample SC1.

Fig. 10
Fig. 10

Relation between CNR and recording power of sample SC2.

Fig. 11
Fig. 11

Relation between CNR and recording frequency of sample SC2.

Tables (2)

Tables Icon

Table 1 Complex Refractive Indices of the Two Samples

Tables Icon

Table 2 Basic Computation Parameters

Equations (3)

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BC=j=1kcos δji/ηjsin δjiηj sin δjcos δj1ηk+1,
δj=2π/λNjdj cos θj.
R=η0B-Cη0B+Cη0B-Cη0B+C=η0B-Cη0B-C*η0B+Cη0B+C*=M1M2=Rη0, npc, dpc, dg, nm, km, dm, nAu, kAu, dAu.

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