Abstract

A method for deformation analysis and shape measurement based on digital holography is presented. Two wavelengths, 694 and 347 nm, are used. The object is illuminated with the two wavelengths at the same time, and digital holograms are recorded on a CCD chip. The information corresponding to the two wavelengths is separated in the Fourier domain, and the phase corresponding to the wave fronts is calculated. By recording holograms with two different wavelengths at the same time, we can get measurements of deformations or shape with different sensitivities. Experimental results are presented.

© 2000 Optical Society of America

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