Abstract
Mid-spatial-frequency surface errors can be introduced by various
manufacturing processes. These errors bridge the gap between
traditional figure and finish errors. Although the effects of
mid-spatial-frequency errors on the imagery of an optical system can be
modeled with a ray-based approach, simply tracing rays provides little
insight. We present an alternative method that treats surface
errors as perturbations to the nominal surface profile. This
approach, combined with standard statistical methods, allows one to
make simple back-of-the-envelope predictions of the effects of
mid-spatial-frequency errors for various measures of optical
performance. Two examples illustrating the effectiveness of this
approach are presented.
© 2000 Optical Society of America
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