Abstract
We have constructed a two-dimensional refracted-ray scanner that
can resolve index-of-refraction increments of approximately 4 ×
10-5. This resolution is an order of magnitude finer
than the uncertainty of the measurement. The scanner can be adapted
to evaluate either fibers or planar waveguides. The two-dimensional
scan and the high precision allow visualization of features, such as
deposition layers, that are difficult if not impossible to see in
conventional one-dimensional scans.
© 1999 Optical Society of America
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