Abstract

The intrinsic error propagation in a technique that uses total reflection geometry for the measurement of χ(3) is calculated. The results show how accurately the parameters should be measured to obtain the χ(3) value with the required precision. The film thickness should be slightly less than the fundamental wavelength to reduce the χ(3) error that propagates from other parameters.

© 1999 Optical Society of America

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Figures (5)

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Equations (3)

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