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Thin-film luminescence under ultraviolet irradiation

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Abstract

The features of visible dielectric thin-film luminescence under UV irradiation are discussed for single layers with a particular high-index/low-index couple, HfO2/SiO2. We exploit those results in an attempt to understand the proper luminescence of three different mirror stacks in terms of both luminescence efficiency and angular emission.

© 1999 Optical Society of America

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