Abstract

The detectivity D* limits of YBa2Cu3O7-x bolometers on 0.05-cm-thick crystalline substrates are investigated, and a method to increase D* to greater than 109 (cm Hz1/2)/W at a 20-µm wavelength is proposed. Because the response increases proportionally with the bias current I b, whereas the noise near T c (the transition or critical temperature) of our MgO and SrTiO3 substrate samples does not, an increase in D* of these samples is obtained by an increase in I b. Another limiting factor is the dc thermal conductance G(0) of the device, which, although controlled by the substrate-holder thermal boundary resistance for our samples, can be changed by means of thinning the substrate to increase D*. The optimal amount of thinning depends on the substrate’s thermal parameters and the radiation modulation frequency. D* in our samples is also found to follow the spectral-radiation absorption of the substrate material.

© 1999 Optical Society of America

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