Fourier-transform profilometry (FTP) and data-dependent system profilometry (DDSP) are the two major phase-extraction methods that use a single interferogram. The difficulty in verifying surface profiles obtained by these methods is that the exact spot on an actual surface cannot be measured with two different instruments. An interferogram regeneration procedure is developed to solve this problem. The surface profile is then extracted from the regenerated interferogram by both FTP and DDSP. Comparisons of the actual surface profile with the extracted surface profiles show that both methods perform equally well in measuring the root mean square and the center line average, but only DDSP is able to reproduce the detailed surface profile of the reference surface.
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