Abstract

We present what we believe to be a novel complex phase tracing method for fringe pattern analysis related to the phase-locked loop idea. The image with deformed complex fringes is analyzed with lexicographic scansion that leads directly to the investigated phase without unwrapping. Robustness of the procedure is ensured by the delay mechanism in the process of calculating the reference value. A numerical model and examples of application of the presented method are given.

© 1999 Optical Society of America

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