Abstract
A two-mirror normal-incidence microscope with multilayer coatings was used to image the soft-x-ray emissions from planar foils irradiated by OMEGA laser beams. The bandpass of the multilayer coatings was centered at a wavelength of 48.3 Å (257-eV energy) and was 0.5 Å wide. Five overlapping OMEGA beams, without beam smoothing, were typically incident on the gold foils. The total energy was 1500 J, and the focused intensity was 6 × 1013 W cm-2. The 5.8× magnified images were recorded by a gated framing camera at various times during the 3-ns laser pulse. A pinhole camera imaged the x-ray emission in the energy range of >2 keV. On a spatial scale of 10 μm, it was found that the soft-x-ray images at 257 eV were quite uniform and featureless. In contrast, the hard-x-ray images in the energy range of >2 keV were highly nonuniform with numerous features of size 150 μm.
© 1998 Optical Society of America
Full Article | PDF ArticleMore Like This
Koujun Yamashita, Peter J. Serlemitsos, Jack Tueller, Scott D. Barthelmy, Lyle M. Bartlett, Kai-Wing Chan, Akihiro Furuzawa, Neil Gehrels, Kazutoshi Haga, Hideyo Kunieda, Peter Kurczynski, Gyanendra Lodha, Norio Nakajo, Norihiko Nakamura, Yoshiharu Namba, Yasushi Ogasaka, Takashi Okajima, David Palmer, Ann Parsons, Yang Soong, Carl M. Stahl, Harumi Takata, Keisuke Tamura, Yuzuru Tawara, and Bonnard J. Teegarden
Appl. Opt. 37(34) 8067-8073 (1998)
Yefim Aglitskiy, Thomas Lehecka, Stephen Obenschain, Stephen Bodner, Carl Pawley, Kent Gerber, John Sethian, Charles M. Brown, John Seely, Uri Feldman, and Glenn Holland
Appl. Opt. 37(22) 5253-5261 (1998)
Franz Schäfers, Hans-Christoph Mertins, Frank Schmolla, Ingo Packe, Nikolay N. Salashchenko, and Eugeny A. Shamov
Appl. Opt. 37(4) 719-728 (1998)