Abstract

We demonstrate a method of performing the absolute three-flat test by using reflection symmetries of the surfaces and an algorithm for generating the rotation of arrays of pixel data. Most of the operations involve left/right and top/bottom flips of data arrays, operations that are very fast on most frame grabbers and are available on most commercial phase-measuring interferometers. We demonstrate the method with simulated data as well as with actual data from 150-mm-diameter surfaces that are flat to less than 25 nm peak to valley.

© 1998 Optical Society of America

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