Abstract

A class of problem dealing with narrow-band reflectors under oblique light incidence has been selected, and a group of design procedures leading to satisfactory results is analyzed. Initially performance criteria and design restrictions are set. Various designs are then created and analyzed. Conclusions can then be drawn on the relative merits of the designs. Two different types of target function have been chosen. A global search for 50 or more layers with varied optical thicknesses between 0 and λ/2 and a needle design method have been applied to the synthesis. Gradient and variable metrics have been used for further refinement. Results are compared, and it is shown that all the design methods used yield similar results for this problem. The issue of how to determine the best method is addressed.

© 1998 Optical Society of America

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References

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    [Crossref] [PubMed]
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    [Crossref]
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    [Crossref]
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1996 (2)

1995 (1)

1990 (1)

1981 (1)

1965 (1)

Baumeister, P.

DeBell, G. W.

Dobrowolski, J. A.

Furman, S. H.

S. H. Furman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette Cedex, France, 1992), p. 130.

Kemp, R. A.

Macleod, H. A.

H. A. Macleod, Thin Film Optical Filters (Adam Hilger, London, 1969), pp. 172–184.

Southwell, W. H.

W. H. Southwell, “Scaling rules for quintic refractive index matching semi-infinite antireflection coating,” in Optical Thin Films V: New Developments, R. L. Hall, ed., Proc. SPIE3133, 65–70 (1997).
[Crossref]

Sullivan, B. T.

Tikhonravov, A. V.

A. V. Tikhonravov, M. K. Trubetskov, G. W. DeBell, “Application of the needle optimization technique to the design of optical coatings,” Appl. Opt. 35, 5493–5506 (1996).
[Crossref] [PubMed]

A. V. Tikhonravov, “Needle optimization technique: the history and the future,” in Optical Thin Films V: New Developments, R. L. Hall, ed., Proc. SPIE3133, 2–7 (1997).
[Crossref]

S. H. Furman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette Cedex, France, 1992), p. 130.

Trubetskov, M. K.

Appl. Opt. (6)

Other (5)

W. H. Southwell, “Scaling rules for quintic refractive index matching semi-infinite antireflection coating,” in Optical Thin Films V: New Developments, R. L. Hall, ed., Proc. SPIE3133, 65–70 (1997).
[Crossref]

TFCalc, 1985–1997Software Spectra, Inc., 14025 N.W. Harvest Lane, Portland, Oreg. 97229.

A. V. Tikhonravov, “Needle optimization technique: the history and the future,” in Optical Thin Films V: New Developments, R. L. Hall, ed., Proc. SPIE3133, 2–7 (1997).
[Crossref]

H. A. Macleod, Thin Film Optical Filters (Adam Hilger, London, 1969), pp. 172–184.

S. H. Furman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette Cedex, France, 1992), p. 130.

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Figures (7)

Fig. 1
Fig. 1

Reflectance versus wavelength (nanometers) for the filter obtained from the global search.

Fig. 2
Fig. 2

Reflectance versus wavelength (nanometers) for the filter obtained from the modified global search.

Fig. 3
Fig. 3

Reflectance versus wavelength (nanometers) for the filter obtained from the needle method and the simultaneous insertion of layers.

Fig. 4
Fig. 4

Reflectance versus wavelength (nanometers) for the filter obtained from the needle method and the step-by-step insertion of layers.

Fig. 5
Fig. 5

Reflectance versus wavelength (nm) for the filter obtained by use of the composition of two notch filters created by the needle method.

Fig. 6
Fig. 6

Reflectance versus wavelength (nanometers) for the filter obtained from a composition of two (L3H) n -type filters.

Fig. 7
Fig. 7

Refractive-index profile of the five designs (n versus micrometers).

Tables (1)

Tables Icon

Table 1 Comparison of Final Results from Different Design Procedures

Metrics