T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997).

[Crossref]

A. Sohmer, C. Joenathan, “Two-fold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

P. K. Rastogi, “A two-aperture dual source speckle interferometry for the measurement of the angular variations of a three-dimensional surface,” Opt. Laser Technol. 26, 195–197 (1994).

[Crossref]

P. K. Rastogi, “Slope change contouring of a three-dimensional object using speckle interferometry,” Opt. Commun. 108, 37–41 (1994).

[Crossref]

A. R. Ganesan, R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry,” in Optical Testing and Metrology II, C. Grover, ed., Proc. SPIE954, 327–332 (1988).

[Crossref]

A. Sohmer, C. Joenathan, “Two-fold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

R. S. Sirohi, N. Krishna Mohan, “In-plane displacement measurement configuration with two-fold sensitivity,” Appl. Opt. 32, 6387–6390 (1993).

[Crossref]
[PubMed]

P. K. Rastogi, “A two-aperture dual source speckle interferometry for the measurement of the angular variations of a three-dimensional surface,” Opt. Laser Technol. 26, 195–197 (1994).

[Crossref]

P. K. Rastogi, “Slope change contouring of a three-dimensional object using speckle interferometry,” Opt. Commun. 108, 37–41 (1994).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

R. S. Sirohi, N. Krishna Mohan, “In-plane displacement measurement configuration with two-fold sensitivity,” Appl. Opt. 32, 6387–6390 (1993).

[Crossref]
[PubMed]

A. R. Ganesan, R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry,” in Optical Testing and Metrology II, C. Grover, ed., Proc. SPIE954, 327–332 (1988).

[Crossref]

A. Sohmer, C. Joenathan, “Two-fold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996).

[Crossref]

Y. Y. Hung, J. L. Turner, M. Tafralian, J. D. Hovanesian, C. E. Taylor, “Optical methods for measuring contour slopes of an object,” Appl. Opt. 17, 128–131 (1978).

[Crossref]
[PubMed]

R. S. Sirohi, N. Krishna Mohan, “In-plane displacement measurement configuration with two-fold sensitivity,” Appl. Opt. 32, 6387–6390 (1993).

[Crossref]
[PubMed]

T. Santhanakrishnan, N. Krishna Mohan, R. S. Sirohi, “Oblique observation speckle shear interferometers for slope change contouring,” J. Mod. Opt. 44, 831–839 (1997).

[Crossref]

P. K. Rastogi, “Slope change contouring of a three-dimensional object using speckle interferometry,” Opt. Commun. 108, 37–41 (1994).

[Crossref]

A. Sohmer, C. Joenathan, “Two-fold increase in sensitivity with a dual-beam illumination arrangement for electronic speckle pattern interferometry,” Opt. Eng. 35, 1943–1948 (1996).

[Crossref]

P. K. Rastogi, “A two-aperture dual source speckle interferometry for the measurement of the angular variations of a three-dimensional surface,” Opt. Laser Technol. 26, 195–197 (1994).

[Crossref]

T. Santhanakrishnan, N. Krishna Mohan, P. Senthilkumaran, R. S. Sirohi, “Slope change contouring for 3D deeply curved objects by multi-aperture speckle shear interferometry,” Optik 104, 27–31 (1996).

R. S. Sirohi, ed., Speckle Metrology (Marcel Dekker, New York, 1993).

A. R. Ganesan, R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry,” in Optical Testing and Metrology II, C. Grover, ed., Proc. SPIE954, 327–332 (1988).

[Crossref]