Abstract

We propose a new method for measuring large-object deformations by using temporal evolution of the speckles in speckle interferometry. The principle of the method is that by deforming the object continuously, one obtains fluctuations in the intensity of the speckle. A large number of frames of the object motion are collected to be analyzed later. The phase data for whole-object deformation are then retrieved by inverse Fourier transformation of a filtered spectrum obtained by Fourier transformation of the signal. With this method one is capable of measuring deformations of more than 100 μm, which is not possible using conventional electronic speckle pattern interferometry. We discuss the underlying principle of the method and the results of the experiments. Some nondestructive testing results are also presented.

© 1998 Optical Society of America

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  1. R. K. Erf, Speckle Metrology (Academic, New York, 1978).
  2. R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, London, 1983).
  3. R. S. Sirohi, Speckle Metrology (Marcel Dekker, New York, 1993).
  4. C. Joenathan, “Speckle photography, shearography, and ESPI,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).
  5. Y. Y. Hung, “Displacement and strain measurement,” in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), p. 55.
  6. C. Joenathan, B. Franze, H. J. Tiziani, “Oblique incidence and observation electronic speckle pattern interferometry,” Appl. Opt. 33, 7307–7311 (1994).
    [CrossRef] [PubMed]
  7. O. J. Lokberg, O. Kwon, “Electronic speckle pattern interferometry using a CO2 laser,” Opt. Laser Technol. 16, 187–192 (1984).
    [CrossRef]
  8. M. Takeda, H. Ina, S. Kobayashi, “Fourier-transform method of fringe pattern analysis for computer-based topography and interferometry,” J. Opt. Soc. Am. 72, 156–160 (1982).
    [CrossRef]
  9. H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
    [CrossRef]
  10. M. Takeda, H. Yamamoto, “Fourier-transform speckle profilometry: three-dimensional shape measurements of diffuse object with large height steps and/or spatially isolated surfaces,” Appl. Opt. 33, 7829–7837 (1994).
    [CrossRef] [PubMed]
  11. S. Timoshenko, S. Woinowsky-Krieger, Theory of Plates and Shells, 2nd ed. (McGraw-Hill, New York, 1959), p. 293.
  12. H. J. Tiziani, “Optical metrology of engineering surfaces—scope and trends,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).

1997 (1)

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
[CrossRef]

1994 (2)

1984 (1)

O. J. Lokberg, O. Kwon, “Electronic speckle pattern interferometry using a CO2 laser,” Opt. Laser Technol. 16, 187–192 (1984).
[CrossRef]

1982 (1)

Erf, R. K.

R. K. Erf, Speckle Metrology (Academic, New York, 1978).

Franze, B.

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
[CrossRef]

C. Joenathan, B. Franze, H. J. Tiziani, “Oblique incidence and observation electronic speckle pattern interferometry,” Appl. Opt. 33, 7307–7311 (1994).
[CrossRef] [PubMed]

Haible, P.

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
[CrossRef]

Hung, Y. Y.

Y. Y. Hung, “Displacement and strain measurement,” in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), p. 55.

Ina, H.

Joenathan, C.

C. Joenathan, B. Franze, H. J. Tiziani, “Oblique incidence and observation electronic speckle pattern interferometry,” Appl. Opt. 33, 7307–7311 (1994).
[CrossRef] [PubMed]

C. Joenathan, “Speckle photography, shearography, and ESPI,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).

Jones, R.

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, London, 1983).

Kobayashi, S.

Kwon, O.

O. J. Lokberg, O. Kwon, “Electronic speckle pattern interferometry using a CO2 laser,” Opt. Laser Technol. 16, 187–192 (1984).
[CrossRef]

Lokberg, O. J.

O. J. Lokberg, O. Kwon, “Electronic speckle pattern interferometry using a CO2 laser,” Opt. Laser Technol. 16, 187–192 (1984).
[CrossRef]

Sirohi, R. S.

R. S. Sirohi, Speckle Metrology (Marcel Dekker, New York, 1993).

Takeda, M.

Timoshenko, S.

S. Timoshenko, S. Woinowsky-Krieger, Theory of Plates and Shells, 2nd ed. (McGraw-Hill, New York, 1959), p. 293.

Tiziani, H.

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
[CrossRef]

Tiziani, H. J.

C. Joenathan, B. Franze, H. J. Tiziani, “Oblique incidence and observation electronic speckle pattern interferometry,” Appl. Opt. 33, 7307–7311 (1994).
[CrossRef] [PubMed]

H. J. Tiziani, “Optical metrology of engineering surfaces—scope and trends,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).

Woinowsky-Krieger, S.

S. Timoshenko, S. Woinowsky-Krieger, Theory of Plates and Shells, 2nd ed. (McGraw-Hill, New York, 1959), p. 293.

Wykes, C.

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, London, 1983).

Yamamoto, H.

Appl. Opt. (2)

J. Mod. Opt. (1)

H. Tiziani, B. Franze, P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser,” J. Mod. Opt. 44, 1485–1496 (1997).
[CrossRef]

J. Opt. Soc. Am. (1)

Opt. Laser Technol. (1)

O. J. Lokberg, O. Kwon, “Electronic speckle pattern interferometry using a CO2 laser,” Opt. Laser Technol. 16, 187–192 (1984).
[CrossRef]

Other (7)

R. K. Erf, Speckle Metrology (Academic, New York, 1978).

R. Jones, C. Wykes, Holographic and Speckle Interferometry (Cambridge U. Press, London, 1983).

R. S. Sirohi, Speckle Metrology (Marcel Dekker, New York, 1993).

C. Joenathan, “Speckle photography, shearography, and ESPI,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).

Y. Y. Hung, “Displacement and strain measurement,” in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), p. 55.

S. Timoshenko, S. Woinowsky-Krieger, Theory of Plates and Shells, 2nd ed. (McGraw-Hill, New York, 1959), p. 293.

H. J. Tiziani, “Optical metrology of engineering surfaces—scope and trends,” in Optical Measurement Techniques and Applications, P. K. Rastogi, ed. (Artech House, Boston, 1997).

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