Abstract

We report a hybrid microscope composed of an apertureless scanning near-field optical microscope and a commercial atomic force microscope. We discuss the optical origin of the near-field images of a test sample. We show that the optical images have a sharp contrast that depends on the illumination parameters: the state of polarization and the angle of incidence of the incident light.

© 1998 Optical Society of America

Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip

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